M. Mergens
- Electrical and Electronic Engineering top 5%
- Materials Chemistry
- Mechanics of Materials
- Hardware and Architecture
- Electronic, Optical and Magnetic Materials
- Topics
- Electrostatic Discharge in Electronics (24 papers)Semiconductor materials and devices (15 papers)Integrated Circuits and Semiconductor Failure Analysis (12 papers)
- Journals
- IEEE Transactions on Electron DevicesSurface and Coatings TechnologyDiamond and Related Materials
- Partner nations
- GermanySwitzerlandAustria
In The Last Decade
M. Mergens
30 papers receiving 705 citations
Peers
Comparison fields: 5 of 21
- Electrical and Electronic Engineering 723
- Materials Chemistry 69
- Mechanics of Materials 37
- Hardware and Architecture 18
- Electronic, Optical and Magnetic Materials 14
Countries citing papers authored by M. Mergens
This map shows the geographic impact of M. Mergens's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Mergens with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Mergens more than expected).
Fields of papers citing papers by M. Mergens
This network shows the impact of papers produced by M. Mergens. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Mergens. The network helps show where M. Mergens may publish in the future.
Co-authorship network of co-authors of M. Mergens
This figure shows the co-authorship network connecting the top 25 collaborators of M. Mergens. A scholar is included among the top collaborators of M. Mergens based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Mergens. M. Mergens is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 5 | |
| 2 | ESD protection considerations in advanced high-voltage technologies for automotive | 31 |
| 3 | 14 | |
| 4 | 59 | |
| 5 | 84 | |
| 6 | Active-area-segmentation (AAS) technique for compact, ESD robust, fully silicided NMOS design | 17 |
| 7 | 10 | |
| 8 | 28 | |
| 9 | 24 | |
| 10 | 4 | |
| 11 | 11 | |
| 12 | 0 | |
| 13 | GGSCRs: GGNMOS Triggered silicon controlled rectifiers for ESD protection in deep sub-micron CMOS processes | 61 |
| 14 | Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width-scaling | 35 |
| 15 | 107 | |
| 16 | 4 | |
| 17 | 5 | |
| 18 | 4 | |
| 19 | 7 | |
| 20 | 27 |
About M. Mergens
M. Mergens is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Computational Mechanics, having authored 31 papers that have together received 775 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (24 papers), Semiconductor materials and devices (15 papers) and Integrated Circuits and Semiconductor Failure Analysis (12 papers). The work is most often cited by research in Electrical and Electronic Engineering (723 citations), Hardware and Architecture (18 citations) and Mechanics of Materials (37 citations). M. Mergens has collaborated with scholars based in Germany, Switzerland and Austria. Frequent co-authors include K. Verhaege, J. Armer, P. Jozwiak, C. Russ, B. Keppens, W. Wilkening, Heinrich Wolf, Wolf Fïchtner, Andy Stricker and Christian Russ. Their work appears in journals such as IEEE Transactions on Electron Devices, Surface and Coatings Technology and Diamond and Related Materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.