S. Mattiazzo

8.8k total citations
99 papers, 859 citations indexed

About

S. Mattiazzo is a scholar working on Electrical and Electronic Engineering, Nuclear and High Energy Physics and Radiation. According to data from OpenAlex, S. Mattiazzo has authored 99 papers receiving a total of 859 indexed citations (citations by other indexed papers that have themselves been cited), including 92 papers in Electrical and Electronic Engineering, 40 papers in Nuclear and High Energy Physics and 37 papers in Radiation. Recurrent topics in S. Mattiazzo's work include Radiation Effects in Electronics (58 papers), Particle Detector Development and Performance (40 papers) and Radiation Detection and Scintillator Technologies (36 papers). S. Mattiazzo is often cited by papers focused on Radiation Effects in Electronics (58 papers), Particle Detector Development and Performance (40 papers) and Radiation Detection and Scintillator Technologies (36 papers). S. Mattiazzo collaborates with scholars based in Italy, Switzerland and United States. S. Mattiazzo's co-authors include Simone Gerardin, A. Paccagnella, A. Basçhirotto, Christian Enz, Stefano Bonaldo, P. Giubilato, Marta Bagatin, G. Borghello, F. Faccio and Farzan Jazaeri and has published in prestigious journals such as IEEE Access, IEEE Transactions on Electron Devices and Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment.

In The Last Decade

S. Mattiazzo

91 papers receiving 831 citations

Peers

Countries citing papers authored by S. Mattiazzo

Since Specialization

Citations

This map shows the geographic impact of S. Mattiazzo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Mattiazzo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Mattiazzo more than expected).

Fields of papers citing papers by S. Mattiazzo

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Mattiazzo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Mattiazzo. The network helps show where S. Mattiazzo may publish in the future.

Co-authorship network of co-authors of S. Mattiazzo

This figure shows the co-authorship network connecting the top 25 collaborators of S. Mattiazzo. A scholar is included among the top collaborators of S. Mattiazzo based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Mattiazzo. S. Mattiazzo is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	On the Vulnerability of UMOSFETs in Terrestrial Radiation Environments 2025 ·IEEE Access ·(unknown), (unknown), J. Wyss, Vitor A. P. Aguiar, (unknown), (unknown), S. Mattiazzo, A. Paccagnella, Carlo Cazzaniga, Maria Kastriotou, Christopher Frost, N. H. Medina	0
2	Single-Event Upset Characterization of a Shift Register in 16 nm FinFET Technology 2025 ·Electronics ·(unknown), (unknown), (unknown), S. Mattiazzo, Stefano Bonaldo, Valeria Vadalà, A. Basçhirotto	1
3	TID Effects in the Lateral STI Oxide of Planar CMOS Transistors 2024 ·IEEE Transactions on Nuclear Science ·Stefano Bonaldo, G. Borghello, F. Faccio, Marta Bagatin, S. Mattiazzo, Simone Gerardin	2
4	Total-Ionizing-Dose and Displacement Damage Effects in Trench SiC Power MOSFETs 2024 ·IEEE Transactions on Nuclear Science ·Stefano Bonaldo, C. Martinella, Marta Bagatin, Simone Gerardin, (unknown), (unknown), (unknown), S. Mattiazzo, A. Paccagnella, Ulrike Großner	1
5	Characterization of the radiation tolerant ToASt ASIC for the readout of the PANDA MVD strip detector 2024 ·Journal of Instrumentation ·(unknown), D. Calvo, F. Cossio, G. Mazza, R. Wheadon, Jürgen Becker, Kai-Thomas Brinkmann, M. Caselle, A. Kopmann, (unknown), S. Mattiazzo, (unknown), (unknown), (unknown), T. Stockmanns, L. Tomášek, (unknown), K. Unger, H.-G. Zaunick	0
6	Radiation-Induced Charge Trapping in Shallow Trench Isolations of FinFETs 2023 ·IEEE Transactions on Nuclear Science ·Stefano Bonaldo, (unknown), Hugh Barnaby, G. Borghello, (unknown), F. Faccio, Daniel M. Fleetwood, S. Mattiazzo, Marta Bagatin, A. Paccagnella, Simone Gerardin	7
7	Measurements of radiation effects in an antifuse FPGA 2023 ·Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ·V. Placinta, L. Cojocariu, F. Maciuc, M. Straticiuc, S. Mattiazzo, (unknown), A. Candelori	0
8	First characterization results of ARCADIA FD-MAPS after X-ray irradiation 2023 ·Journal of Instrumentation ·C. Neubüser, (unknown), G.‐F. Dalla Betta, S. Mattiazzo, L. Pancheri	1
9	Influence of Bulk Doping and Halos on the TID Response of I/O and Core 150 nm nMOSFETs 2023 ·Electronics ·Stefano Bonaldo, S. Mattiazzo, Marta Bagatin, A. Paccagnella, (unknown), Simone Gerardin	4
10	Fully Depleted MAPS in 110-nm CMOS Process With 100–300-μm Active Substrate 2020 ·IEEE Transactions on Electron Devices ·L. Pancheri, (unknown), (unknown), S. Mattiazzo, (unknown), P. Giubilato, R. Santoro, M. Caccia, (unknown), (unknown), M. Rolo, (unknown)	20
11	Characterization and Modeling of Gigarad-TID-Induced Drain Leakage Current of 28-nm Bulk MOSFETs 2018 ·IEEE Transactions on Nuclear Science ·Chunmin Zhang, Farzan Jazaeri, G. Borghello, F. Faccio, S. Mattiazzo, A. Basçhirotto, Christian Enz	32
12	Characterization of GigaRad Total Ionizing Dose and Annealing Effects on 28-nm Bulk MOSFETs 2017 ·IEEE Transactions on Nuclear Science ·Chunmin Zhang, Farzan Jazaeri, A. Pezzotta, Claudio Bruschini, G. Borghello, F. Faccio, S. Mattiazzo, A. Basçhirotto, Christian Enz	46
13	Surface damage characterization of FBK devices for High Luminosity LHC (HL-LHC) operations 2017 ·Journal of Instrumentation ·F. Moscatelli, (unknown), A. Morozzi, G.‐F. Dalla Betta, S. Mattiazzo, M. Bomben, Gian Mario Bilei	10
14	Comparison of radiation degradation induced by x-ray and 3-MeV protons in 65-nm CMOS transistors 2016 ·Chinese Physics B ·Lili Ding, Simone Gerardin, Marta Bagatin, D. Bisello, S. Mattiazzo, A. Paccagnella	2
15	LNL irradiation facilities for radiation damage studies on electronic devices 2015 ·D. Bisello, A. Candelori, P. Giubilato, S. Mattiazzo, D. Pantano, (unknown), M. Tessaro, J. Wyss	0
16	Advanced proton imaging in computed tomography 2015 ·Radiation Protection Dosimetry ·S. Mattiazzo, D. Bisello, P. Giubilato, D. Pantano, N. Pozzobon, W. Snoeys, J. Wyss	3
17	Monolithic Pixel Sensors in Deep-Submicron SOI Technology 2012 ·M. Battaglia, D. Bisello, Devis Contarato, P. Denes, P. Giubilato, Lindsay Glesener, S. Mattiazzo, (unknown)	1
18	Neutron production targets for a new Single Event Effects facility at the 70 MeV Cyclotron of LNL-INFN 2012 ·Physics Procedia ·(unknown), A. Candelori, (unknown), Juan Esposito, Pierfrancesco Mastinu, S. Mattiazzo, G. Prete, (unknown), J. Wyss	9
19	Characterisation of a pixel sensor in 0.20μm SOI technology for charged particle tracking 2011 ·Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ·M. Battaglia, D. Bisello, Devis Contarato, P. Denes, P. Giubilato, S. Mattiazzo, D. Pantano, (unknown)	16
20	A new test methodology for an exhaustive study of single-event-effects on power MOSFETs 2011 ·Microelectronics Reliability ·G. Busatto, D. Bisello, Giuseppe Currò, P. Giubilato, Francesco Iannuzzo, S. Mattiazzo, D. Pantano, A. Sanseverino, (unknown), M. Tessaro, F. Velardi, J. Wyss	2

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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