John Notte

2.3k total citations
64 papers, 1.7k citations indexed

About

John Notte is a scholar working on Surfaces, Coatings and Films, Computational Mechanics and Electrical and Electronic Engineering. According to data from OpenAlex, John Notte has authored 64 papers receiving a total of 1.7k indexed citations (citations by other indexed papers that have themselves been cited), including 41 papers in Surfaces, Coatings and Films, 32 papers in Computational Mechanics and 27 papers in Electrical and Electronic Engineering. Recurrent topics in John Notte's work include Electron and X-Ray Spectroscopy Techniques (41 papers), Ion-surface interactions and analysis (31 papers) and Integrated Circuits and Semiconductor Failure Analysis (25 papers). John Notte is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (41 papers), Ion-surface interactions and analysis (31 papers) and Integrated Circuits and Semiconductor Failure Analysis (25 papers). John Notte collaborates with scholars based in United States, Germany and Australia. John Notte's co-authors include Bill Ward, N. P. Economou, Shawn McVey, Richard H. Livengood, Shida Tan, J. Fajans, Sybren Sijbrandij, Yuval Greenzweig, Lewis Stern and Larry Scipioni and has published in prestigious journals such as Physical Review Letters, Nano Letters and Applied Physics Letters.

In The Last Decade

John Notte

63 papers receiving 1.7k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
John Notte United States	25	766	740	483	407	374	64	1.7k
Paul F. A. Alkemade Netherlands	23	1.1k 1.4×	677 0.9×	348 0.7×	657 1.6×	970 2.6×	84	2.2k
Weilun Chao United States	26	821 1.1×	184 0.2×	364 0.8×	567 1.4×	452 1.2×	125	3.0k
Albert T. Macrander United States	28	883 1.2×	144 0.2×	264 0.5×	504 1.2×	488 1.3×	166	2.7k
Rosa Maria Montereali Italy	23	650 0.8×	456 0.6×	247 0.5×	316 0.8×	586 1.6×	154	1.8k
Н. И. Чхало Russia	19	463 0.6×	337 0.5×	248 0.5×	413 1.0×	217 0.6×	117	1.3k
Farhad Salmassi United States	19	471 0.6×	148 0.2×	425 0.9×	173 0.4×	176 0.5×	75	1.3k
Н. И. Чхало Russia	19	532 0.7×	297 0.4×	236 0.5×	391 1.0×	203 0.5×	175	1.3k
Yuzo Mori Japan	25	722 0.9×	319 0.4×	89 0.2×	927 2.3×	480 1.3×	123	2.0k
A. G. Michette United Kingdom	22	360 0.5×	134 0.2×	205 0.4×	319 0.8×	214 0.6×	110	1.6k
Frank Siewert Germany	25	591 0.8×	291 0.4×	179 0.4×	590 1.4×	175 0.5×	99	2.1k

Countries citing papers authored by John Notte

Since Specialization

Citations

This map shows the geographic impact of John Notte's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John Notte with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John Notte more than expected).

Fields of papers citing papers by John Notte

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by John Notte. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John Notte. The network helps show where John Notte may publish in the future.

Co-authorship network of co-authors of John Notte

This figure shows the co-authorship network connecting the top 25 collaborators of John Notte. A scholar is included among the top collaborators of John Notte based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with John Notte. John Notte is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Xia, Deying & John Notte. (2022). Nano‐Kirigami Structures and Branched Nanowires Fabricated by Focused Ion Beam‐Induced Milling, Bending, and Deposition. Advanced Materials Interfaces. 9(28). 4 indexed citations

Xia, Deying, et al.. (2020). GaAs milling with neon focused ion beam: Comparison with gallium focused ion beam milling and subsurface damage analysis. Applied Surface Science. 538. 147922–147922. 25 indexed citations

Sijbrandij, Sybren, et al.. (2019). NanoFab SIMS: High Spatial Resolution Imaging and Analysis Using Inert-Gas Ion Beams. Microscopy Today. 27(3). 22–27. 4 indexed citations

Xia, Deying & John Notte. (2019). Light Ion Beams Interacting with Thin Films. Microscopy and Microanalysis. 25(S2). 906–907. 1 indexed citations

Lewis, Brett B., et al.. (2018). NanoFab with SIMS - Recent Results from the BAM-L200 Analytical Standard and Semiconductor Samples. Microscopy and Microanalysis. 24(S1). 850–851. 2 indexed citations

Notte, John, et al.. (2016). The Neon Focused Ion Beam-Stabilizing the Emission Process. Microscopy and Microanalysis. 22(S3). 154–155. 1 indexed citations

Klingner, Nico, R. Heller, Gregor Hlawacek, et al.. (2015). Nanometer scale elemental analysis in the helium ion microscope using time of flight spectrometry. Ultramicroscopy. 162. 91–97. 38 indexed citations

Xia, Deying, et al.. (2015). Circuit Editing and Failure Analysis Applications using a Three-Ion-Beam (Ga, He and Ne) System and Gas Injection System (GIS). Microscopy and Microanalysis. 21(S3). 1165–1166. 1 indexed citations

Notte, John, et al.. (2014). Advances in source technology for focused ion beam instruments. MRS Bulletin. 39(4). 329–335. 32 indexed citations

10.

Notte, John, et al.. (2012). Observation of synchronized atomic motions in the field ion microscope. Ultramicroscopy. 126. 10–18. 11 indexed citations

11.

Rahman, F., et al.. (2011). The Prospects of a Subnanometer Focused Neon Ion Beam. Scanning. 34(2). 129–134. 52 indexed citations

12.

Economou, N. P., John Notte, & William B. Thompson. (2011). The history and development of the helium ion microscope. Scanning. 34(2). 83–89. 47 indexed citations

13.

Notte, John, et al.. (2010). Diffraction Imaging in a He⁺ Ion Beam Scanning Transmission Microscope. Microscopy and Microanalysis. 16(5). 599–603. 16 indexed citations

14.

Notte, John, et al.. (2010). Imaging of Bio-Compatible Polymers in the Helium Ion Microscope. Microscopy and Microanalysis. 16(S2). 200–201. 1 indexed citations

15.

Notte, John, et al.. (2010). The Neon Gas Field Ion Source - Stability and Lifetime. Microscopy and Microanalysis. 16(S2). 28–29. 11 indexed citations

16.

Sanford, Colin A., et al.. (2009). Advances in High Resolution Helium Ion Microscope (HIM) Imaging. Microscopy and Microanalysis. 15(S2). 654–655. 1 indexed citations

17.

Scipioni, Larry, Lewis Stern, John Notte, Sybren Sijbrandij, & Brendan Griffin. (2008). HELIUM ION MICROSCOPE. AM&P Technical Articles. 166(6). 27–30. 27 indexed citations

18.

Postek, Michael T., et al.. (2007). Helium Ion Microscopy: A New Technique for Semiconductor Metrology and Nanotechnology | NIST. 1 indexed citations

19.

Arora, William J., Sybren Sijbrandij, Lewis Stern, et al.. (2007). Membrane folding by helium ion implantation for three-dimensional device fabrication. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 25(6). 2184–2187. 42 indexed citations

20.

Peurrung, A.J., John Notte, & J. Fajans. (1993). Collapse and winding of an asymmetric annulus of vorticity. Journal of Fluid Mechanics. 252. 713–720. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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