John Notte
- Structural Biology top 0.5%
- Advanced Electron Microscopy Techniques and Applications 18
- Surfaces, Coatings and Films top 1%
- Electron and X-Ray Spectroscopy Techniques 41
- Computational Mechanics top 1%
- Ion-surface interactions and analysis 31
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- Integrated Circuits and Semiconductor Failure Analysis 25
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- Surface and Thin Film Phenomena 6
- Dust and Plasma Wave Phenomena 5
- Atomic and Molecular Physics 5
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- Advanced Materials Characterization Techniques 12
- Co-authors
- Bill WardN. P. EconomouShawn McVeyRichard H. LivengoodShida TanJ. FajansSybren SijbrandijYuval Greenzweig
- Journals
- Microscopy and Microanalysis (17 papers)Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (7 papers)Physical Review Letters (3 papers)
- Partner nations
- United StatesGermanyAustralia
In The Last Decade
John Notte
63 papers receiving 1.7k citations
Peers
Comparison fields: 5 of 98
- Structural Biology 357
- Surfaces, Coatings and Films 483
- Computational Mechanics 740
- Electrical and Electronic Engineering 766
- Atomic and Molecular Physics, and Optics 356
Countries citing papers authored by John Notte
This map shows the geographic impact of John Notte's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John Notte with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John Notte more than expected).
Fields of papers citing papers by John Notte
This network shows the impact of papers produced by John Notte. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John Notte. The network helps show where John Notte may publish in the future.
Co-authorship network
The 25 scholars most cited alongside John Notte, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2022 | 4 | |
| 2 | 2020 | 25 | |
| 3 | 2019 | 4 | |
| 4 | 2019 | 1 | |
| 5 | 2018 | 2 | |
| 6 | 2016 | 1 | |
| 7 | 2015 | 38 | |
| 8 | 2015 | 1 | |
| 9 | 2014 | 32 | |
| 10 | 2012 | 11 | |
| 11 | 2011 | 52 | |
| 12 | 2011 | 47 | |
| 13 | 2010 | 16 | |
| 14 | 2010 | 1 | |
| 15 | 2010 | 11 | |
| 16 | 2009 | 1 | |
| 17 | HELIUM ION MICROSCOPE | 2008 | 27 |
| 18 | Helium Ion Microscopy: A New Technique for Semiconductor Metrology and Nanotechnology | NIST | 2007 | 1 |
| 19 | 2007 | 42 | |
| 20 | 1993 | 6 |
About John Notte
John Notte is a scholar working on Structural Biology, Surfaces, Coatings and Films, Computational Mechanics, Metals and Alloys and Radiation, having authored 64 papers that have together received 1.7k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (41 papers), Ion-surface interactions and analysis (31 papers), Integrated Circuits and Semiconductor Failure Analysis (25 papers), Advanced Electron Microscopy Techniques and Applications (18 papers), Advanced Materials Characterization Techniques (12 papers), Surface and Thin Film Phenomena (6 papers), Dust and Plasma Wave Phenomena (5 papers) and Atomic and Molecular Physics (5 papers). The work is most often cited by research in Structural Biology (357 citations), Surfaces, Coatings and Films (483 citations), Computational Mechanics (740 citations), Electrical and Electronic Engineering (766 citations) and Atomic and Molecular Physics, and Optics (356 citations). John Notte has collaborated with scholars based in United States, Germany and Australia. Frequent co-authors include Bill Ward, N. P. Economou, Shawn McVey, Richard H. Livengood, Shida Tan, J. Fajans, Sybren Sijbrandij, Yuval Greenzweig, Lewis Stern and Larry Scipioni. Their work appears in journals such as Microscopy and Microanalysis, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Physical Review Letters, Applied Surface Science and Ultramicroscopy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.