P. Petrík
About
In The Last Decade
P. Petrík
195 papers receiving 1.7k citations
Peers
Comparison fields: 5 of 101
- Electrical and Electronic Engineering 943
- Materials Chemistry 807
- Biomedical Engineering 578
- Computational Mechanics 377
- Atomic and Molecular Physics, and Optics 301
Countries citing papers authored by P. Petrík
This map shows the geographic impact of P. Petrík's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Petrík with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Petrík more than expected).
Fields of papers citing papers by P. Petrík
This network shows the impact of papers produced by P. Petrík. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Petrík. The network helps show where P. Petrík may publish in the future.
Co-authorship network of co-authors of P. Petrík
This figure shows the co-authorship network connecting the top 25 collaborators of P. Petrík. A scholar is included among the top collaborators of P. Petrík based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. Petrík. P. Petrík is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 1 | |
| 3 | 1 | |
| 4 | 0 | |
| 5 | 3 | |
| 6 | 2 | |
| 7 | 32 | |
| 8 | 15 | |
| 9 | 8 | |
| 10 | 5 | |
| 11 | 19 | |
| 12 | 13 | |
| 13 | 13 | |
| 14 | SPIN COATED CARBOXYMETHY L DEXTRAN LAYERS ON TiO 2 -SiO 2 OPTICAL WAVEGUIDE SURFACES | 1 |
| 15 | 1 | |
| 16 | Spectroellipsometric Characterization of Sputtered Silicon Nitride Films Using Two Different Dispersion Relations | 1 |
| 17 | 22 | |
| 18 | 5 | |
| 19 | Optical models for ellipsometric characterization of high temperature annealed nanostructured SiO2 films | 3 |
| 20 | Composition and Thickness of RF Sputtered Amorphous Silicon Alloy Films | 2 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.