Jon Geist

2.9k total citations
111 papers, 1.8k citations indexed

About

Jon Geist is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering and Biomedical Engineering. According to data from OpenAlex, Jon Geist has authored 111 papers receiving a total of 1.8k indexed citations (citations by other indexed papers that have themselves been cited), including 54 papers in Electrical and Electronic Engineering, 35 papers in Aerospace Engineering and 31 papers in Biomedical Engineering. Recurrent topics in Jon Geist's work include Calibration and Measurement Techniques (25 papers), Advanced MEMS and NEMS Technologies (12 papers) and Scientific Measurement and Uncertainty Evaluation (11 papers). Jon Geist is often cited by papers focused on Calibration and Measurement Techniques (25 papers), Advanced MEMS and NEMS Technologies (12 papers) and Scientific Measurement and Uncertainty Evaluation (11 papers). Jon Geist collaborates with scholars based in United States, Canada and Australia. Jon Geist's co-authors include Edward F. Zalewski, Michael Gaitan, R. Korde, A. R. Schaefer, W. R. Blevin, Mulpuri V. Rao, Samuel M. Stavis, Laurie E. Locascio, Henry Baltes and A.M. Robinson and has published in prestigious journals such as Science, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

Jon Geist

104 papers receiving 1.7k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Jon Geist United States 23 796 684 631 249 225 111 1.8k
P.E. Ciddor Australia 10 428 0.5× 295 0.4× 101 0.2× 442 1.8× 62 0.3× 32 1.3k
Phillip H. Paul United States 33 533 0.7× 239 0.3× 459 0.7× 351 1.4× 606 2.7× 79 3.3k
Lawrence G. Rubin United States 15 450 0.6× 292 0.4× 162 0.3× 184 0.7× 16 0.1× 39 1.1k
James E. Harvey United States 24 607 0.8× 583 0.9× 163 0.3× 648 2.6× 24 0.1× 141 2.1k
Maria Luisa Rastello Italy 18 196 0.2× 143 0.2× 203 0.3× 342 1.4× 51 0.2× 69 866
Claude Amra France 27 737 0.9× 1.0k 1.5× 245 0.4× 684 2.7× 8 0.0× 182 3.0k
Esther Baumann United States 34 1.6k 2.1× 356 0.5× 44 0.1× 2.5k 10.0× 266 1.2× 111 3.3k
Fabrizio R. Giorgetta United States 35 1.8k 2.3× 378 0.6× 43 0.1× 2.7k 10.7× 356 1.6× 128 3.6k
J. Elazar Serbia 11 1.5k 1.9× 2.1k 3.0× 248 0.4× 1.2k 4.8× 40 0.2× 33 3.6k
M J Downs United Kingdom 16 325 0.4× 344 0.5× 72 0.1× 318 1.3× 36 0.2× 30 1.3k

Countries citing papers authored by Jon Geist

Since Specialization
Citations

This map shows the geographic impact of Jon Geist's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jon Geist with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jon Geist more than expected).

Fields of papers citing papers by Jon Geist

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jon Geist. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jon Geist. The network helps show where Jon Geist may publish in the future.

Co-authorship network of co-authors of Jon Geist

This figure shows the co-authorship network connecting the top 25 collaborators of Jon Geist. A scholar is included among the top collaborators of Jon Geist based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jon Geist. Jon Geist is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
McGray, Craig D., et al.. (2018). Particle Tracking of Microelectromechanical System Performance and Reliability. Journal of Microelectromechanical Systems. 27(6). 948–950. 7 indexed citations
2.
Geist, Jon, et al.. (2017). Gravity-Based Characterization of Three-Axis Accelerometers in Terms of Intrinsic Accelerometer Parameters. Journal of Research of the National Institute of Standards and Technology. 122. 1–14. 16 indexed citations
3.
McGray, Craig D., et al.. (2015). Characterization of electrothermal actuation with nanometer and microradian precision. 792–795. 4 indexed citations
4.
McGray, Craig D., Richard Kasica, Ndubuisi G. Orji, et al.. (2012). Robust auto-alignment technique for orientation-dependent etching of nanostructures. Journal of Micro/Nanolithography MEMS and MOEMS. 11(2). 23005–1. 4 indexed citations
5.
Dixson, Ronald G., Ndubuisi G. Orji, Craig D. McGray, & Jon Geist. (2011). Traceable calibration of a critical dimension atomic force microscope. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8036. 80360S–80360S. 2 indexed citations
6.
Geist, Jon, Erik M. Secula, David G. Seiler, et al.. (2009). Temperature-Programmed Gas-Sensing With Microhotplates: an Opportunity to Enhance Microelectronic Gas Sensor Metrology. AIP conference proceedings. 207–211. 3 indexed citations
7.
Geist, Jon, et al.. (2006). Surface modification of poly(methyl methacrylate) for improved adsorption of wall coating polymers for microchip electrophoresis. Electrophoresis. 27(19). 3788–3796. 50 indexed citations
8.
Johnson, R. Barry, Ronald Chung, Jon Geist, et al.. (1997). <title>Real-time infrared test set: assessment and characterization</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3084. 171–178. 1 indexed citations
9.
Geist, Jon, R. A. Wilkinson, Stanley Janet, et al.. (1994). The Second Census Optical Character Recognition Systems Conference. 21 indexed citations
10.
Wilkinson, R. A., Michael D. Garris, & Jon Geist. (1993). <title>Machine-assisted human classification of segmented characters for OCR testing and training</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1906. 208–217. 4 indexed citations
11.
Geist, Jon, et al.. (1991). Numerical modeling of silicon photodiodes for high-accuracy applications, Part III: Interpolating and extrapolating internal quantum-efficiency calibrations. Journal of Research of the National Institute of Standards and Technology. 96(4). 481–481. 10 indexed citations
12.
Geist, Jon, et al.. (1991). Numerical modeling of silicon photodiodes for high-accuracy applications, Part I. simulation programs. Journal of Research of the National Institute of Standards and Technology. 96(4). 463–463. 9 indexed citations
13.
Parameswaran, M., A.M. Robinson, D.L. Blackburn, Michael Gaitan, & Jon Geist. (1991). Micromachined thermal radiation emitter from a commercial CMOS process. IEEE Electron Device Letters. 12(2). 57–59. 78 indexed citations
14.
Geist, Jon, et al.. (1984). Induced junction (inversion layer) photodiode self-calibration. Applied Optics. 23(12). 1940–1940. 17 indexed citations
15.
Schaefer, A. R., Edward F. Zalewski, & Jon Geist. (1983). Silicon detector nonlinearity and related effects. Applied Optics. 22(8). 1232–1232. 53 indexed citations
16.
Geist, Jon & Jeremiah R. Lowney. (1981). Effect of band-gap narrowing on the built-in electric field in n-type silicon. Journal of Applied Physics. 52(2). 1121–1123. 7 indexed citations
17.
Geist, Jon. (1979). <title>On The Possibility Of An Absolute Radiometric Standard Based On The Quantum Efficiency Of A Silicon Photodiode</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 196. 75–83.
18.
Blevin, W. R. & Jon Geist. (1974). Infrared Reflectometry with a Cavity-Shaped Pyroelectric Detector. Applied Optics. 13(10). 2212–2212. 17 indexed citations
19.
Geist, Jon, et al.. (1973). Comparison of the laser power and total irradiance scales maintained by the national bureau of standards. Optics Letters. 12. 1 indexed citations
20.
Geist, Jon & J. M. Kendall. (1972). Circumsolar Radiation and the International Pyrheliometric Scale. Applied Optics. 11(6). 1437–1437. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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