John D’Amico

408 total citations
37 papers, 302 citations indexed

About

John D’Amico is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Bioengineering. According to data from OpenAlex, John D’Amico has authored 37 papers receiving a total of 302 indexed citations (citations by other indexed papers that have themselves been cited), including 30 papers in Electrical and Electronic Engineering, 13 papers in Materials Chemistry and 6 papers in Bioengineering. Recurrent topics in John D’Amico's work include Integrated Circuits and Semiconductor Failure Analysis (15 papers), Semiconductor materials and devices (11 papers) and Silicon and Solar Cell Technologies (8 papers). John D’Amico is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (15 papers), Semiconductor materials and devices (11 papers) and Silicon and Solar Cell Technologies (8 papers). John D’Amico collaborates with scholars based in United States, Germany and Switzerland. John D’Amico's co-authors include Marshall Wilson, J. Łagowski, Richard L. Cohen, K. W. West, K. Lehovec, Dmitriy Marinskiy, L. Jastrzȩbski, Piotr Edelman, H. B. Huntington and James T. Kenney and has published in prestigious journals such as Journal of The Electrochemical Society, Journal of Physics and Chemistry of Solids and Journal of Electronic Materials.

In The Last Decade

John D’Amico

33 papers receiving 260 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
John D’Amico United States 11 243 87 45 35 35 37 302
P. Nagarkar United States 7 149 0.6× 109 1.3× 73 1.6× 18 0.5× 53 1.5× 14 260
S. Kudelka Germany 11 207 0.9× 214 2.5× 36 0.8× 25 0.7× 31 0.9× 27 353
Leila Costelle Finland 9 295 1.2× 221 2.5× 49 1.1× 32 0.9× 27 0.8× 14 375
R. Pillai United States 8 197 0.8× 186 2.1× 30 0.7× 46 1.3× 93 2.7× 21 331
Chaudry Sajed Saraj China 10 183 0.8× 126 1.4× 28 0.6× 35 1.0× 48 1.4× 16 318
Yizhou Song China 11 231 1.0× 239 2.7× 24 0.5× 59 1.7× 26 0.7× 25 354
Marie Netrvalová Czechia 11 232 1.0× 287 3.3× 17 0.4× 66 1.9× 49 1.4× 51 365
Aleksander J. Franz United States 8 154 0.6× 160 1.8× 31 0.7× 11 0.3× 104 3.0× 13 307
Won-Jae Lee South Korea 12 303 1.2× 277 3.2× 38 0.8× 89 2.5× 41 1.2× 51 408
H. Rinnert France 10 328 1.3× 272 3.1× 80 1.8× 26 0.7× 54 1.5× 30 398

Countries citing papers authored by John D’Amico

Since Specialization
Citations

This map shows the geographic impact of John D’Amico's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John D’Amico with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John D’Amico more than expected).

Fields of papers citing papers by John D’Amico

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by John D’Amico. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John D’Amico. The network helps show where John D’Amico may publish in the future.

Co-authorship network of co-authors of John D’Amico

This figure shows the co-authorship network connecting the top 25 collaborators of John D’Amico. A scholar is included among the top collaborators of John D’Amico based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with John D’Amico. John D’Amico is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Wilson, Marshall, et al.. (2017). Review—Recent Advancement in Charge- and Photo-Assisted Non-Contact Electrical Characterization of SiC, GaN, and AlGaN/GaN HEMT. ECS Journal of Solid State Science and Technology. 6(11). S3129–S3140. 9 indexed citations
2.
Oh, Jaewon, et al.. (2017). Further Studies on the Effect of SiNx Refractive Index and Emitter Sheet Resistance on Potential-Induced Degradation. IEEE Journal of Photovoltaics. 7(2). 437–443. 6 indexed citations
3.
Wilson, Marshall, et al.. (2016). Surface Voltage and μPCD Mapping of Defect in Epitaxial SiC. Materials science forum. 858. 353–356. 3 indexed citations
4.
Edelman, Piotr, Dmitriy Marinskiy, John D’Amico, et al.. (2015). Non-Visual Defect Monitoring with Surface Voltage Mapping: Application for Semiconductor IC and PV Technology. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 242. 472–477. 1 indexed citations
5.
Wilson, Marshall, et al.. (2014). Experimental study on the role of parameters affecting surface recombination and emitter passivation. 106. 713–718. 3 indexed citations
6.
Łagowski, J., et al.. (2013). Inline PL Inspection and Advanced Offline Evaluation of Passivation Defects, Charge and Interfaces. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 205-206. 128–135. 2 indexed citations
7.
D’Amico, John, Marshall Wilson, Carlos Almeida, J. Łagowski, & Sara Olibet. (2013). Advanced Interface Trap Metrology for Silicon PV. EU PVSEC. 877–882. 4 indexed citations
8.
Edelman, Piotr, et al.. (2008). Band offset diagnostics of advanced dielectrics. Journal of Materials Science Materials in Electronics. 19(S1). 73–78. 2 indexed citations
9.
Belyaev, A. E., Dmitriy Marinskiy, John D’Amico, et al.. (2007). Application of Non-contact Corona-Kelvin metrology for Characterization of Plasma Nitrided SiO[sub 2]. AIP conference proceedings. 931. 270–274.
10.
D’Amico, John, et al.. (2007). Return to Golf Following Left Total Hip Arthroplasty in a Golfer Who is Right Handed.. PubMed. 2(4). 251–61. 8 indexed citations
11.
D’Amico, John. (2004). Theory and application of non-contact methods for in-line reliability determination. 2337. 157–168. 2 indexed citations
12.
Edelman, Piotr, et al.. (2004). Non-contact C-V measurements of ultra thin dielectrics. The European Physical Journal Applied Physics. 27(1-3). 495–498. 11 indexed citations
13.
Wilson, Marshall, et al.. (1999). New COCOS(Corona Oxide Characterization of Semiconductor) method for monitoring the reliability of thin gate oxides.. Proc SPIE. 3895. 373–384.
14.
D’Amico, John, et al.. (1999). <title>Effect of Fe and Cu contamination on the reliability of ultrathin gate oxides</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3884. 124–135. 3 indexed citations
15.
Rockett, Angus, Robert W. Birkmire, D.L. Morel, et al.. (1997). Next generation CIGS for solar cells. AIP conference proceedings. 403–410. 1 indexed citations
16.
D’Amico, John, et al.. (1990). Laser drilling of microvias in epoxy-glass printed circuit boards. IEEE Transactions on Components Hybrids and Manufacturing Technology. 13(4). 1055–1062. 19 indexed citations
17.
D’Amico, John, et al.. (1985). Copper Electrodeposition onto Moving High Resistance Electroless Films. Journal of The Electrochemical Society. 132(10). 2330–2336. 6 indexed citations
18.
D’Amico, John, et al.. (1976). Design Considerations for Electrodeposition onto a High Resistance Electroless Flash in a Continuous Plater. Journal of The Electrochemical Society. 123(4). 478–489. 1 indexed citations
19.
D’Amico, John, et al.. (1972). Optical Response in the Photoselective Metal Deposition (PSMD) Imaging System. Journal of The Electrochemical Society. 119(7). 956–956. 10 indexed citations
20.
D’Amico, John, et al.. (1971). Selective Electroless Metal Deposition Using Patterned Photo-Oxidation of Sn(II) Sensitized Substrates. Journal of The Electrochemical Society. 118(10). 1695–1695. 26 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by P. Nagarkar Breakdown of academic impact, for papers by S. Kudelka Breakdown of academic impact, for papers by Leila Costelle Breakdown of academic impact, for papers by R. Pillai Breakdown of academic impact, for papers by Chaudry Sajed Saraj Breakdown of academic impact, for papers by Yizhou Song Breakdown of academic impact, for papers by Marie Netrvalová Breakdown of academic impact, for papers by Aleksander J. Franz Breakdown of academic impact, for papers by Won-Jae Lee Breakdown of academic impact, for papers by H. Rinnert
Rankless by CCL
2026