David Gil

903 total citations · 1 hit paper
10 papers, 542 citations indexed

About

David Gil is a scholar working on Radiation, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, David Gil has authored 10 papers receiving a total of 542 indexed citations (citations by other indexed papers that have themselves been cited), including 6 papers in Radiation, 6 papers in Materials Chemistry and 4 papers in Surfaces, Coatings and Films. Recurrent topics in David Gil's work include X-ray Diffraction in Crystallography (5 papers), X-ray Spectroscopy and Fluorescence Analysis (4 papers) and Electron and X-Ray Spectroscopy Techniques (4 papers). David Gil is often cited by papers focused on X-ray Diffraction in Crystallography (5 papers), X-ray Spectroscopy and Fluorescence Analysis (4 papers) and Electron and X-Ray Spectroscopy Techniques (4 papers). David Gil collaborates with scholars based in United States, Australia and Egypt. David Gil's co-authors include Donald Windover, James P. Cline, David Ardia, Katharine M. Mullen, Albert Henins, David R. Black, James J. Filliben, Alain C. Diebold, Toshiyuki Fujimoto and Yasushi Azuma and has published in prestigious journals such as Journal of Physics D Applied Physics, Journal of Statistical Software and Measurement Science and Technology.

In The Last Decade

David Gil

9 papers receiving 528 citations

Hit Papers

DEoptim: AnRPackage for Global Optimization by Differenti... 2011 2026 2016 2021 2011 100 200 300 400

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
David Gil United States 5 100 73 58 58 51 10 542
Steffen Möritz Germany 3 126 1.3× 88 1.2× 73 1.3× 48 0.8× 52 1.0× 4 628
Clive Anderson United Kingdom 14 213 2.1× 76 1.0× 75 1.3× 49 0.8× 27 0.5× 28 886
Nazmul Hossain Bangladesh 11 120 1.2× 102 1.4× 30 0.5× 49 0.8× 54 1.1× 44 686
Darryl J. Downing United States 12 195 1.9× 53 0.7× 26 0.4× 94 1.6× 35 0.7× 38 810
Hanfeng Chen United States 15 262 2.6× 54 0.7× 250 4.3× 57 1.0× 35 0.7× 59 1.2k
Brandon Greenwell United States 7 86 0.9× 67 0.9× 81 1.4× 32 0.6× 33 0.6× 15 602
Vyacheslav Lyubchich United States 16 151 1.5× 31 0.4× 53 0.9× 36 0.6× 59 1.2× 47 602
Benjamin Säfken Germany 8 97 1.0× 44 0.6× 90 1.6× 32 0.6× 10 0.2× 23 567
Qun Liu China 16 185 1.9× 26 0.4× 69 1.2× 52 0.9× 22 0.4× 52 892
José A. Vilar Spain 18 133 1.3× 46 0.6× 194 3.3× 308 5.3× 49 1.0× 56 1.0k

Countries citing papers authored by David Gil

Since Specialization
Citations

This map shows the geographic impact of David Gil's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David Gil with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David Gil more than expected).

Fields of papers citing papers by David Gil

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by David Gil. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David Gil. The network helps show where David Gil may publish in the future.

Co-authorship network of co-authors of David Gil

This figure shows the co-authorship network connecting the top 25 collaborators of David Gil. A scholar is included among the top collaborators of David Gil based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David Gil. David Gil is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

10 of 10 papers shown
1.
Windover, Donald, David Gil, Yasushi Azuma, & Toshiyuki Fujimoto. (2014). Determining sample alignment in x-ray reflectometry using thickness and density from GaAs/AlAs multilayer certified reference materials. Measurement Science and Technology. 25(10). 105007–105007. 2 indexed citations
2.
Gil, David & Donald Windover. (2012). Limitations of x-ray reflectometry in the presence of surface contamination. Journal of Physics D Applied Physics. 45(23). 235301–235301. 13 indexed citations
3.
Mullen, Katharine M., David Ardia, David Gil, Donald Windover, & James P. Cline. (2011). DEoptim: AnRPackage for Global Optimization by Differential Evolution. Journal of Statistical Software. 40(6). 480 indexed citations breakdown →
4.
Black, David R., Donald Windover, Albert Henins, et al.. (2010). Certification of NIST Standard Reference Material 640d. Powder Diffraction. 25(2). 187–190. 29 indexed citations
5.
Cline, James P., David R. Black, David Gil, Albert Henins, & Donald Windover. (2010). The Application of the Fundamental Parameters Approach as Implemented in TOPAS to Divergent Beam Powder Diffraction Data. Materials science forum. 651. 201–219. 6 indexed citations
6.
Black, David R., Donald Windover, Albert Henins, David Gil, & James J. Filliben. (2010). STANDARD REFERENCE MATERIAL 640d FOR X-RAY METROLOGY. 3 indexed citations
7.
Windover, Donald, David Gil, Albert Henins, et al.. (2009). NIST High Resolution X-Ray Diffraction Standard Reference Material: SRM 2000. AIP conference proceedings. 1 indexed citations
8.
Windover, Donald, David Gil, Albert Henins, & James P. Cline. (2009). D-57 NIST SRM 2000—A High Resolution X-ray Diffraction Standard Reference Material. Powder Diffraction. 24(2). 171–171. 2 indexed citations
9.
Windover, Donald, David Gil, James P. Cline, et al.. (2007). NIST method for determining model-independent structural information by X-ray reflectometry. AIP conference proceedings. 931. 287–291. 5 indexed citations
10.
Windover, Donald, David Gil, James P. Cline, et al.. (2007). X-Ray Reflectometry Determination of Structural Information from Atomic Layer Deposition Nanometer-scale Hafnium Oxide Thin Films. MRS Proceedings. 996. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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