Oleg Kononchuk

640 total citations
75 papers, 490 citations indexed

About

Oleg Kononchuk is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, Oleg Kononchuk has authored 75 papers receiving a total of 490 indexed citations (citations by other indexed papers that have themselves been cited), including 65 papers in Electrical and Electronic Engineering, 29 papers in Atomic and Molecular Physics, and Optics and 21 papers in Materials Chemistry. Recurrent topics in Oleg Kononchuk's work include Silicon and Solar Cell Technologies (38 papers), Semiconductor materials and interfaces (25 papers) and Integrated Circuits and Semiconductor Failure Analysis (25 papers). Oleg Kononchuk is often cited by papers focused on Silicon and Solar Cell Technologies (38 papers), Semiconductor materials and interfaces (25 papers) and Integrated Circuits and Semiconductor Failure Analysis (25 papers). Oleg Kononchuk collaborates with scholars based in France, Russia and United States. Oleg Kononchuk's co-authors include G. A. Rozgonyi, S. Koveshnikov, Richard A. Brown, Didier Landru, P. J. Simpson, A. Claverie, Pablo Acosta-Alba, F. Rieutord, Andrew P. Knights and Nikolai Yarykin and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Oleg Kononchuk

70 papers receiving 472 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Oleg Kononchuk France 13 401 145 126 111 68 75 490
M. Italia Italy 12 430 1.1× 124 0.9× 133 1.1× 118 1.1× 135 2.0× 36 499
G. Kissinger Germany 13 591 1.5× 204 1.4× 240 1.9× 52 0.5× 108 1.6× 105 677
Karim Huet France 16 623 1.6× 151 1.0× 240 1.9× 162 1.5× 124 1.8× 77 734
Elisa García‐Tabarés Spain 11 266 0.7× 135 0.9× 93 0.7× 41 0.4× 90 1.3× 33 387
Mathieu Halbwax France 14 448 1.1× 217 1.5× 230 1.8× 144 1.3× 271 4.0× 35 653
W. Lerch Germany 15 643 1.6× 303 2.1× 178 1.4× 135 1.2× 76 1.1× 74 783
В. В. Наумов Russia 10 245 0.6× 95 0.7× 134 1.1× 31 0.3× 64 0.9× 92 339
C. Doland United States 13 414 1.0× 173 1.2× 272 2.2× 61 0.5× 53 0.8× 25 554
E. Kobeda United States 7 363 0.9× 89 0.6× 226 1.8× 45 0.4× 90 1.3× 9 461
John Borland United States 9 372 0.9× 99 0.7× 146 1.2× 123 1.1× 68 1.0× 70 490

Countries citing papers authored by Oleg Kononchuk

Since Specialization
Citations

This map shows the geographic impact of Oleg Kononchuk's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Oleg Kononchuk with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Oleg Kononchuk more than expected).

Fields of papers citing papers by Oleg Kononchuk

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Oleg Kononchuk. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Oleg Kononchuk. The network helps show where Oleg Kononchuk may publish in the future.

Co-authorship network of co-authors of Oleg Kononchuk

This figure shows the co-authorship network connecting the top 25 collaborators of Oleg Kononchuk. A scholar is included among the top collaborators of Oleg Kononchuk based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Oleg Kononchuk. Oleg Kononchuk is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Rieutord, F., et al.. (2024). High temperature evolution of a confined silicon layer. Journal of Applied Physics. 135(24). 2 indexed citations
2.
Rieutord, F., et al.. (2024). High temperature evolution of interfacial metal film bonding two 4H-SiC substrates. Applied Surface Science. 682. 161678–161678. 1 indexed citations
3.
Mazen, Frédéric, et al.. (2021). Experimental study of post-crack vibrations in dynamic fracture. Journal of Applied Physics. 129(18). 2 indexed citations
4.
Mazen, Frédéric, et al.. (2021). In Situ Observation of Pressurized Microcrack Growth in Silicon. physica status solidi (a). 218(23). 3 indexed citations
5.
Mazen, F., Didier Landru, Samuel Tardif, et al.. (2018). Crack Front Interaction with Self-Emitted Acoustic Waves. Physical Review Letters. 121(19). 195501–195501. 15 indexed citations
6.
Rieutord, F., Samuel Tardif, Didier Landru, et al.. (2016). Edge Water Penetration in Direct Bonding Interface. ECS Meeting Abstracts. MA2016-02(32). 2087–2087.
7.
Steinman, É. A., et al.. (2015). Structures and electronic properties of defects on the borders of silicon bonded wafers. Russian Microelectronics. 44(8). 585–589. 1 indexed citations
8.
Kononchuk, Oleg, et al.. (2014). Silicon-On-Insulator (SOI) Technology : Manufacture and Applications. Elsevier eBooks. 29 indexed citations
9.
Daval, Nicolas, W. Schwarzenbach, Oleg Kononchuk, et al.. (2013). Smart Cut™ technology provides excellent layer uniformity for fully depleted CMOS. 1–2.
10.
Steinman, É. A., et al.. (2012). Modification of dislocation PL centres due to misfit of bonded Si wafers. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 10(1). 16–19. 2 indexed citations
11.
Бондаренко, А. С., et al.. (2012). Impact of hydrogen on electrical levels and luminescence of dislocation network at the interface of hydrophilically bonded silicon wafers. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 10(1). 36–39. 2 indexed citations
12.
Cherkashin, N., A. Claverie, D. Sotta, et al.. (2012). Confinement of vacancies during annealing of H implanted GaN sandwiched between two {InGaN/GaN} superlattices. Applied Physics Letters. 101(2). 1 indexed citations
13.
Vdovin, V. I., О. Ф. Вывенко, Е. В. Убыйвовк, & Oleg Kononchuk. (2011). Mechanisms of Dislocation Network Formation in Si(001) Hydrophilic Bonded Wafers. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 178-179. 253–258. 6 indexed citations
14.
Mchedlidze, Teimuraz, et al.. (2011). Structures responsible for radiative and non‐radiative recombination activity of dislocations in silicon. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 8(3). 991–995. 7 indexed citations
15.
Бондаренко, А. С., et al.. (2011). Dislocation Structure, Electrical and Luminescent Properties of Hydrophilically Bonded Silicon Wafer Interface. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 178-179. 233–242. 2 indexed citations
16.
Kononchuk, Oleg, et al.. (1996). Gettering of Fe to below 1010 cm−3 in MeV self-implanted Czochralski and float zone silicon. Applied Physics Letters. 69(27). 4203–4205. 21 indexed citations
17.
Kononchuk, Oleg, В. И. Орлов, O. V. Feklisova, & E. B. Yakimov. (1996). Formation of Electrical Activity of Dislocations in Si during Plastic Deformation. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 51-52. 15–20. 1 indexed citations
18.
Kononchuk, Oleg, В. И. Орлов, O. V. Feklisova, E. B. Yakimov, & Nikolai Yarykin. (1995). Increase of Electrical Activity of Dislocations in Si during Plastic Deformation. Materials science forum. 196-201. 1183–1188. 1 indexed citations
19.
Kononchuk, Oleg, G. A. Rozgonyi, & E. B. Yakimov. (1995). Measurements of Diffusion Length in Si-SiGe Structures. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 47-48. 601–606.
20.
Kononchuk, Oleg & E. B. Yakimov. (1992). Electron Beam Induced Capacitance. Scanning microscopy. 6(2). 399–404. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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