Dan Herr

506 total citations
68 papers, 389 citations indexed

About

Dan Herr is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Dan Herr has authored 68 papers receiving a total of 389 indexed citations (citations by other indexed papers that have themselves been cited), including 42 papers in Electrical and Electronic Engineering, 26 papers in Surfaces, Coatings and Films and 21 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Dan Herr's work include Electron and X-Ray Spectroscopy Techniques (20 papers), Semiconductor materials and devices (16 papers) and Integrated Circuits and Semiconductor Failure Analysis (15 papers). Dan Herr is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (20 papers), Semiconductor materials and devices (16 papers) and Integrated Circuits and Semiconductor Failure Analysis (15 papers). Dan Herr collaborates with scholars based in United States, France and Germany. Dan Herr's co-authors include David G. Seiler, Alain C. Diebold, C. Michael Garner, Rajinder P. Khosla, Erik M. Secula, Robert McDonald, Sean W. King, Hiroyuki Akinaga, Robert McDonald and John Notte and has published in prestigious journals such as APL Materials, IEEE Nanotechnology Magazine and AIP conference proceedings.

In The Last Decade

Dan Herr

66 papers receiving 373 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Dan Herr United States 10 206 131 125 97 76 68 389
Jakub Zlámal Czechia 13 189 0.9× 151 1.2× 87 0.7× 107 1.1× 102 1.3× 40 455
Erik M. Secula United States 11 349 1.7× 182 1.4× 179 1.4× 142 1.5× 124 1.6× 156 591
F. Lorut France 11 298 1.4× 109 0.8× 113 0.9× 70 0.7× 73 1.0× 51 459
N. Hayasaka Japan 13 415 2.0× 108 0.8× 88 0.7× 32 0.3× 55 0.7× 32 494
L. Clément France 9 244 1.2× 143 1.1× 102 0.8× 141 1.5× 112 1.5× 34 465
Patricia G. Blauner United States 10 243 1.2× 87 0.7× 67 0.5× 37 0.4× 117 1.5× 30 374
Moritz Seyfried Germany 8 166 0.8× 113 0.9× 101 0.8× 145 1.5× 65 0.9× 19 361
Christian Dais Switzerland 13 349 1.7× 206 1.6× 252 2.0× 345 3.6× 85 1.1× 24 610
K. Ansari Singapore 12 266 1.3× 63 0.5× 275 2.2× 75 0.8× 72 0.9× 23 446
Shazia Yasin United Kingdom 11 361 1.8× 67 0.5× 255 2.0× 174 1.8× 87 1.1× 18 522

Countries citing papers authored by Dan Herr

Since Specialization
Citations

This map shows the geographic impact of Dan Herr's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Dan Herr with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Dan Herr more than expected).

Fields of papers citing papers by Dan Herr

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Dan Herr. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Dan Herr. The network helps show where Dan Herr may publish in the future.

Co-authorship network of co-authors of Dan Herr

This figure shows the co-authorship network connecting the top 25 collaborators of Dan Herr. A scholar is included among the top collaborators of Dan Herr based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Dan Herr. Dan Herr is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Secula, Erik M., David G. Seiler, Rajinder P. Khosla, et al.. (2009). Frontiers of Characterization and Metrology for Nanoelectronics: 2009. 1173. 28 indexed citations
3.
Osten, Wolfgang, Karsten Frenner, Thomas Schuster, et al.. (2009). Simulations of Scatterometry Down to 22 nm Structure Sizes and Beyond with Special Emphasis on LER. AIP conference proceedings. 371–378. 9 indexed citations
4.
Geist, Jon, Erik M. Secula, David G. Seiler, et al.. (2009). Temperature-Programmed Gas-Sensing With Microhotplates: an Opportunity to Enhance Microelectronic Gas Sensor Metrology. AIP conference proceedings. 207–211. 3 indexed citations
5.
Nelson, Florence, Alain C. Diebold, R. Hull, et al.. (2009). Simulation Study Of Transmission Electron Microscopy Imaging Of Graphene Stacking. AIP conference proceedings. 271–274. 1 indexed citations
6.
Rao, Gyandshwar Kumar, Robert Geer, Erik M. Secula, et al.. (2009). Characterization of Nano-Scale Graphene Devices for Thickness and Defect Metrology Using Micro and Nano-Raman Spectroscopy. AIP conference proceedings. 139–142. 1 indexed citations
7.
Moeck, Peter, Marius Toader, Michael Hietschold, et al.. (2009). Quantifying and enforcing two-dimensional symmetries in scanning probe microscopy images. AIP conference proceedings. 294–298. 6 indexed citations
8.
Fu, Joseph, Wei Chu, Ronald G. Dixson, et al.. (2009). Correction of Hysteresis in SPM Images by a Moving Window Correlation Method. AIP conference proceedings. 280–284. 3 indexed citations
9.
Windover, Donald, David Gil, Albert Henins, et al.. (2009). NIST High Resolution X-Ray Diffraction Standard Reference Material: SRM 2000. AIP conference proceedings. 1 indexed citations
10.
Kwak, Yoon Keun, Soo‐Hyun Kim, Hyun Mo Cho, et al.. (2007). Development of a Focused-Beam Ellipsometer Based on a New Principle. AIP conference proceedings. 931. 69–73. 4 indexed citations
11.
Wyon, C., Jean-Claude Royer, David G. Seiler, et al.. (2007). Ultra Low-κ Metrology Using X-Ray Reflectivity And Small-Angle X-Ray Scattering Techniques. AIP conference proceedings. 931. 347–351. 1 indexed citations
12.
Chatham, Hood, David G. Seiler, Alain C. Diebold, et al.. (2007). VUV Reflectometry for Thin Film Thickness & Composition Metrology and Process Development & Control. AIP conference proceedings. 931. 320–323. 1 indexed citations
13.
Rubio‐Zuazo, Juan, E. Martínez, P. Batude, et al.. (2007). Hard X-ray photoemission experiments on novel Ge-based metal gate∕high-k stacks. AIP conference proceedings. 931. 329–333. 4 indexed citations
14.
Lee, Hae‐Jeong, Christopher L. Soles, Shuhui Kang, et al.. (2007). X-ray Reflectivity Measurements of Nanoscale Structures: Limits of the Effective Medium Approximation. AIP conference proceedings. 931. 209–215. 2 indexed citations
15.
Seiler, David G., Alain C. Diebold, Robert McDonald, et al.. (2007). Nano-Raman: Monitoring Nanoscale Stress. AIP conference proceedings. 931. 84–88. 1 indexed citations
16.
Seiler, David G., Alain C. Diebold, Robert McDonald, et al.. (2007). Chemical Mechanical Planarization (CMP) Metrology for 45∕32 nm Technology Generations. AIP conference proceedings. 931. 173–177. 3 indexed citations
17.
Wang, Yunfei, Robert Geer, David G. Seiler, et al.. (2007). Investigation of Apertureless NSOM for Measurement of Stress in Strained Silicon-on-Insulator Test Structures. AIP conference proceedings. 931. 94–98. 1 indexed citations
18.
Ronsheim, Paul, J. S. McMurray, P. Flaitz, et al.. (2007). Analysis of Nickel Silicides by SIMS and LEAP. AIP conference proceedings. 931. 129–136. 2 indexed citations
19.
Imtiaz, Atif, Hans T. Nembach, Paul Rice, et al.. (2007). Metrology For High-Frequency Nanoelectronics. AIP conference proceedings. 931. 525–529. 2 indexed citations
20.
Seiler, David G., Alain C. Diebold, Robert McDonald, et al.. (2007). CMP Control of Multi-Layer Inter-Layer Dielectrics (ILD) using X-ray Reflectivity. AIP conference proceedings. 931. 216–219. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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