Dan Herr
- Structural Biology top 5%
- Advanced Electron Microscopy Techniques and Applications 9
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques 20
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- Semiconductor materials and devices 16
- Integrated Circuits and Semiconductor Failure Analysis 15
- Advancements in Photolithography Techniques 7
- Computational Mechanics top 10%
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- Force Microscopy Techniques and Applications 9
- Surface and Thin Film Phenomena 9
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- Near-Field Optical Microscopy 9
- Co-authors
- David G. SeilerAlain C. DieboldC. Michael GarnerErik M. SeculaRajinder P. KhoslaRobert McDonaldSean W. KingHiroyuki Akinaga
- Journals
- APL Materials (1 paper)IEEE Nanotechnology Magazine (1 paper)AIP conference proceedings (64 papers)
- Partner nations
- United StatesFranceGermany
In The Last Decade
Dan Herr
66 papers receiving 373 citations
Peers
Comparison fields: 5 of 50
- Structural Biology 37
- Surfaces, Coatings and Films 76
- Electrical and Electronic Engineering 206
- Computational Mechanics 65
- Metals and Alloys 8
Countries citing papers authored by Dan Herr
This map shows the geographic impact of Dan Herr's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Dan Herr with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Dan Herr more than expected).
Fields of papers citing papers by Dan Herr
This network shows the impact of papers produced by Dan Herr. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Dan Herr. The network helps show where Dan Herr may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Dan Herr, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2013 | 59 | |
| 2 | 2011 | 2 | |
| 3 | Frontiers of Characterization and Metrology for Nanoelectronics: 2009 | 2009 | 28 |
| 4 | 2009 | 3 | |
| 5 | 2009 | 9 | |
| 6 | 2009 | 1 | |
| 7 | 2009 | 3 | |
| 8 | 2009 | 1 | |
| 9 | 2009 | 1 | |
| 10 | 2009 | 2 | |
| 11 | 2007 | 1 | |
| 12 | 2007 | 2 | |
| 13 | 2007 | 1 | |
| 14 | 2007 | 1 | |
| 15 | 2007 | 4 | |
| 16 | 2007 | 5 | |
| 17 | 2007 | 1 | |
| 18 | 2007 | 3 | |
| 19 | 2007 | 1 | |
| 20 | 2007 | 4 |
About Dan Herr
Dan Herr is a scholar working on Structural Biology, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 68 papers that have together received 389 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (20 papers), Semiconductor materials and devices (16 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers), Force Microscopy Techniques and Applications (9 papers), Surface and Thin Film Phenomena (9 papers), Advanced Electron Microscopy Techniques and Applications (9 papers), Near-Field Optical Microscopy (9 papers) and Advancements in Photolithography Techniques (7 papers). The work is most often cited by research in Structural Biology (37 citations), Surfaces, Coatings and Films (76 citations) and Electrical and Electronic Engineering (206 citations). Dan Herr has collaborated with scholars based in United States, France and Germany. Frequent co-authors include David G. Seiler, Alain C. Diebold, C. Michael Garner, Erik M. Secula, Rajinder P. Khosla, Robert McDonald, Sean W. King, Hiroyuki Akinaga, Robert McDonald and John Notte. Their work appears in journals such as APL Materials, IEEE Nanotechnology Magazine and AIP conference proceedings.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.