B Bunday

528 total citations
9 papers, 379 citations indexed

About

B Bunday is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Surfaces, Coatings and Films. According to data from OpenAlex, B Bunday has authored 9 papers receiving a total of 379 indexed citations (citations by other indexed papers that have themselves been cited), including 7 papers in Electrical and Electronic Engineering, 3 papers in Computational Mechanics and 2 papers in Surfaces, Coatings and Films. Recurrent topics in B Bunday's work include Integrated Circuits and Semiconductor Failure Analysis (5 papers), Advancements in Photolithography Techniques (4 papers) and Surface Roughness and Optical Measurements (3 papers). B Bunday is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (5 papers), Advancements in Photolithography Techniques (4 papers) and Surface Roughness and Optical Measurements (3 papers). B Bunday collaborates with scholars based in United States, Belgium and France. B Bunday's co-authors include Brian M. Barnes, R. Joseph Kline, Ndubuisi G. Orji, András Vládar, Umberto Celano, C. Beitia, Mark Neisser, Yaw S. Obeng, Mustafa Badaroglu and Ronald G. Dixson and has published in prestigious journals such as Nature Electronics, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.

In The Last Decade

B Bunday

8 papers receiving 347 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
B Bunday United States 6 240 134 110 77 59 9 379
Nigel R. Farrar United States 12 246 1.0× 95 0.7× 65 0.6× 61 0.8× 65 1.1× 46 366
Peter Kuerz Germany 16 449 1.9× 151 1.1× 219 2.0× 73 0.9× 32 0.5× 27 516
Judon Stoeldraijer Germany 13 378 1.6× 131 1.0× 183 1.7× 63 0.8× 28 0.5× 24 452
Winfried Kaiser Germany 16 517 2.2× 225 1.7× 268 2.4× 79 1.0× 37 0.6× 35 656
Diederik Maas Netherlands 13 350 1.5× 118 0.9× 175 1.6× 89 1.2× 243 4.1× 39 554
Jens Timo Neumann Germany 16 468 1.9× 139 1.0× 259 2.4× 97 1.3× 39 0.7× 46 565
Michael Totzeck Germany 13 277 1.2× 427 3.2× 174 1.6× 229 3.0× 57 1.0× 37 630
Pawitter J. S. Mangat United States 14 426 1.8× 112 0.8× 235 2.1× 46 0.6× 23 0.4× 61 461
Ralf Steinkopf Germany 9 103 0.4× 174 1.3× 64 0.6× 115 1.5× 75 1.3× 26 314
A. V. Rakov Russia 18 421 1.8× 80 0.6× 513 4.7× 200 2.6× 72 1.2× 76 681

Countries citing papers authored by B Bunday

Since Specialization
Citations

This map shows the geographic impact of B Bunday's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B Bunday with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B Bunday more than expected).

Fields of papers citing papers by B Bunday

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B Bunday. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B Bunday. The network helps show where B Bunday may publish in the future.

Co-authorship network of co-authors of B Bunday

This figure shows the co-authorship network connecting the top 25 collaborators of B Bunday. A scholar is included among the top collaborators of B Bunday based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B Bunday. B Bunday is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

9 of 9 papers shown
1.
Orji, Ndubuisi G., Mustafa Badaroglu, Brian M. Barnes, et al.. (2018). Metrology for the next generation of semiconductor devices. Nature Electronics. 1(10). 532–547. 323 indexed citations
2.
Orji, Ndubuisi G., Mustafa Badaroglu, Brian M. Barnes, et al.. (2018). Publisher Correction: Metrology for the next generation of semiconductor devices. Nature Electronics. 1(12). 662–662. 5 indexed citations
3.
Cummings, K. D., B Bunday, John G. Hartley, et al.. (2015). Patterning of defect arrays with e-beam lithography used to develop a high throughput e-beam defect inspection tool. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 33(6). 8 indexed citations
4.
Bunday, B, et al.. (2013). Towards development of a sidewall roughness standard. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8681. 86812J–86812J. 2 indexed citations
5.
Silver, Richard M., Brian M. Barnes, Hui Zhou, et al.. (2009). Improving optical measurement accuracy using multi-technique nested uncertainties. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7272. 727202–727202. 20 indexed citations
6.
Villarrubia, John S., et al.. (2006). Bias reduction in roughness measurement through SEM noise removal. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6152. 61524L–61524L. 9 indexed citations
7.
Allgair, John A., et al.. (2006). Calibrating optical overlay measurements. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6152. 615211–615211.
8.
Bunday, B, et al.. (2006). The ROI of Metrology. 5752. 387–390. 3 indexed citations
9.
Hung, P. Y., et al.. (2005). X-ray reflectometry and x-ray fluorescence monitoring of the atomic layer deposition process for high-k gate dielectrics. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 23(5). 2244–2248. 9 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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2026