Xuelong Shi
- Electrochemistry top 10%
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques 12
- Media Technology top 5%
- Image Processing Techniques and Applications 9
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- Advancements in Photolithography Techniques 56
- Integrated Circuits and Semiconductor Failure Analysis 26
- 3D IC and TSV technologies 8
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- Industrial Vision Systems and Defect Detection 12
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- Surface Roughness and Optical Measurements 7
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- Advanced Surface Polishing Techniques 7
- Co-authors
- Kenneth B. EisenthalH. Peter LuFrederick H. LongRobert SochaRichard W. HammondM.D. MorrisEric BorguetAlexander N. Tarnovsky
- Journals
- SHILAP Revista de lepidopterología (1 paper)Analytical Chemistry (2 papers)The Journal of Physical Chemistry (3 papers)
- Partner nations
- United StatesChinaItaly
In The Last Decade
Xuelong Shi
58 papers receiving 744 citations
Peers
Comparison fields: 5 of 55
- Physical and Theoretical Chemistry 293
- Electrochemistry 78
- Atomic and Molecular Physics, and Optics 364
- Surfaces, Coatings and Films 71
- Media Technology 62
Countries citing papers authored by Xuelong Shi
This map shows the geographic impact of Xuelong Shi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Xuelong Shi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Xuelong Shi more than expected).
Fields of papers citing papers by Xuelong Shi
This network shows the impact of papers produced by Xuelong Shi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Xuelong Shi. The network helps show where Xuelong Shi may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Xuelong Shi, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 0 | |
| 2 | 2023 | 1 | |
| 3 | 2021 | 0 | |
| 4 | 2020 | 3 | |
| 5 | 2015 | 1 | |
| 6 | 2013 | 1 | |
| 7 | 2005 | 6 | |
| 8 | 2005 | 1 | |
| 9 | 2004 | 9 | |
| 10 | 2003 | 18 | |
| 11 | 2003 | 7 | |
| 12 | 2002 | 10 | |
| 13 | 2002 | 1 | |
| 14 | 1999 | 0 | |
| 15 | 1999 | 1 | |
| 16 | 1996 | 9 | |
| 17 | 1995 | 65 | |
| 18 | 1995 | 26 | |
| 19 | 1995 | 74 | |
| 20 | 1991 | 48 |
About Xuelong Shi
Xuelong Shi is a scholar working on Surfaces, Coatings and Films, Industrial and Manufacturing Engineering and Media Technology, having authored 69 papers that have together received 790 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (56 papers), Integrated Circuits and Semiconductor Failure Analysis (26 papers), Electron and X-Ray Spectroscopy Techniques (12 papers), Industrial Vision Systems and Defect Detection (12 papers), Image Processing Techniques and Applications (9 papers), 3D IC and TSV technologies (8 papers), Surface Roughness and Optical Measurements (7 papers) and Advanced Surface Polishing Techniques (7 papers). The work is most often cited by research in Physical and Theoretical Chemistry (293 citations), Electrochemistry (78 citations) and Atomic and Molecular Physics, and Optics (364 citations). Xuelong Shi has collaborated with scholars based in United States, China and Italy. Frequent co-authors include Kenneth B. Eisenthal, H. Peter Lu, Frederick H. Long, Robert Socha, Richard W. Hammond, M.D. Morris, Eric Borguet, Alexander N. Tarnovsky, Michael D. Morris and Stephen Hsu. Their work appears in journals such as SHILAP Revista de lepidopterología, Analytical Chemistry and The Journal of Physical Chemistry.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.