Alan E. Rosenbluth
- Surfaces, Coatings and Films top 5%
- Optical Coatings and Gratings 12
- Electron and X-Ray Spectroscopy Techniques 11
- Media Technology top 5%
- Advanced Optical Imaging Technologies 7
- Image Processing Techniques and Applications 6
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- Advancements in Photolithography Techniques 34
- Radiation top 10%
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- Advanced optical system design 13
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- Surface Roughness and Optical Measurements 7
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- Advanced Measurement and Metrology Techniques 6
- Co-authors
- Norman BobroffDonis G. FlagelloTom D. MilsterKafai LaiM. HibbsJaione Tirapu-AzpirozEberhard SpillerPing Lee
- Journals
- IBM Journal of Research and Development (5 papers)Journal of Micro/Nanolithography MEMS and MOEMS (2 papers)Japanese Journal of Applied Physics (1 paper)
- Partner nations
- United StatesJapanNetherlands
In The Last Decade
Alan E. Rosenbluth
53 papers receiving 690 citations
Peers
Comparison fields: 5 of 57
- Surfaces, Coatings and Films 189
- Media Technology 125
- Electrical and Electronic Engineering 474
- Radiation 63
- Statistics, Probability and Uncertainty 50
Countries citing papers authored by Alan E. Rosenbluth
This map shows the geographic impact of Alan E. Rosenbluth's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Alan E. Rosenbluth with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Alan E. Rosenbluth more than expected).
Fields of papers citing papers by Alan E. Rosenbluth
This network shows the impact of papers produced by Alan E. Rosenbluth. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Alan E. Rosenbluth. The network helps show where Alan E. Rosenbluth may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Alan E. Rosenbluth, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2014 | 2 | |
| 2 | 2013 | 4 | |
| 3 | 2011 | 7 | |
| 4 | 2011 | 12 | |
| 5 | 2009 | 1 | |
| 6 | 2009 | 25 | |
| 7 | 2008 | 15 | |
| 8 | 2005 | 3 | |
| 9 | 2002 | 5 | |
| 10 | 2002 | 4 | |
| 11 | 2002 | 2 | |
| 12 | 2001 | 89 | |
| 13 | 1999 | 5 | |
| 14 | 1992 | 1 | |
| 15 | 1992 | 2 | |
| 16 | 1992 | 7 | |
| 17 | 1985 | 27 | |
| 18 | Reflecting Properties of X-Ray Multilayer Devices. | 1983 | 7 |
| 19 | 1983 | 22 | |
| 20 | 1981 | 13 |
About Alan E. Rosenbluth
Alan E. Rosenbluth is a scholar working on Surfaces, Coatings and Films, Media Technology, Electrical and Electronic Engineering, Radiation and Biomedical Engineering, having authored 55 papers that have together received 765 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (34 papers), Advanced optical system design (13 papers), Optical Coatings and Gratings (12 papers), Electron and X-Ray Spectroscopy Techniques (11 papers), Surface Roughness and Optical Measurements (7 papers), Advanced Optical Imaging Technologies (7 papers), Advanced Measurement and Metrology Techniques (6 papers) and Image Processing Techniques and Applications (6 papers). The work is most often cited by research in Surfaces, Coatings and Films (189 citations), Media Technology (125 citations), Electrical and Electronic Engineering (474 citations), Radiation (63 citations) and Statistics, Probability and Uncertainty (50 citations). Alan E. Rosenbluth has collaborated with scholars based in United States, Japan and Netherlands. Frequent co-authors include Norman Bobroff, Donis G. Flagello, Tom D. Milster, Kafai Lai, M. Hibbs, Jaione Tirapu-Azpiroz, Eberhard Spiller, Ping Lee, Alfred K. K. Wong and Douglas S. Goodman. Their work appears in journals such as IBM Journal of Research and Development, Journal of Micro/Nanolithography MEMS and MOEMS, Japanese Journal of Applied Physics, Displays and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.