Jan Pomplun

575 total citations
37 papers, 392 citations indexed

About

Jan Pomplun is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films. According to data from OpenAlex, Jan Pomplun has authored 37 papers receiving a total of 392 indexed citations (citations by other indexed papers that have themselves been cited), including 31 papers in Electrical and Electronic Engineering, 13 papers in Atomic and Molecular Physics, and Optics and 13 papers in Surfaces, Coatings and Films. Recurrent topics in Jan Pomplun's work include Optical Coatings and Gratings (13 papers), Electromagnetic Simulation and Numerical Methods (12 papers) and Advancements in Photolithography Techniques (8 papers). Jan Pomplun is often cited by papers focused on Optical Coatings and Gratings (13 papers), Electromagnetic Simulation and Numerical Methods (12 papers) and Advancements in Photolithography Techniques (8 papers). Jan Pomplun collaborates with scholars based in Germany, United States and Japan. Jan Pomplun's co-authors include Sven Burger, Frank Schmidt, Lin Zschiedrich, Eckehard Schöll, Andreas Amann, F. Schmidt, Frank Scholze, Christian Laubis, U. Dersch and A. G. Balanov and has published in prestigious journals such as Europhysics Letters (EPL), SIAM Journal on Scientific Computing and physica status solidi (b).

In The Last Decade

Jan Pomplun

37 papers receiving 377 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Jan Pomplun Germany 10 221 144 117 98 95 37 392
Der-Chin Su Taiwan 14 300 1.4× 188 1.3× 79 0.7× 39 0.4× 208 2.2× 49 632
Gaetano Bellanca Italy 16 706 3.2× 522 3.6× 53 0.5× 74 0.8× 149 1.6× 88 877
Tokuyuki Honda Japan 13 204 0.9× 312 2.2× 19 0.2× 124 1.3× 76 0.8× 41 488
J. D. Valera United Kingdom 14 250 1.1× 314 2.2× 12 0.1× 136 1.4× 67 0.7× 37 566
Lijun Yuan China 15 330 1.5× 397 2.8× 100 0.9× 99 1.0× 178 1.9× 36 534
J.H. den Besten Netherlands 13 730 3.3× 365 2.5× 23 0.2× 18 0.2× 69 0.7× 39 860
Zhaoxian Chen China 13 139 0.6× 265 1.8× 12 0.1× 40 0.4× 244 2.6× 33 515
Ghaith Makey Türkiye 9 146 0.7× 226 1.6× 15 0.1× 22 0.2× 144 1.5× 15 463

Countries citing papers authored by Jan Pomplun

Since Specialization
Citations

This map shows the geographic impact of Jan Pomplun's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jan Pomplun with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jan Pomplun more than expected).

Fields of papers citing papers by Jan Pomplun

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jan Pomplun. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jan Pomplun. The network helps show where Jan Pomplun may publish in the future.

Co-authorship network of co-authors of Jan Pomplun

This figure shows the co-authorship network connecting the top 25 collaborators of Jan Pomplun. A scholar is included among the top collaborators of Jan Pomplun based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jan Pomplun. Jan Pomplun is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Hammerschmidt, Martin, Sven Herrmann, Sven Burger, Jan Pomplun, & Frank Schmidt. (2016). Reduced basis method for the electromagnetic scattering problem: a case study for FinFETs. Optical and Quantum Electronics. 48(4). 2 indexed citations
2.
Wohlfeil, Benjamin, Sven Burger, C. Stamatiadis, et al.. (2014). Numerical simulation of grating couplers for mode multiplexed systems. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8988. 89880K–89880K. 3 indexed citations
3.
Tyminski, Jacek K., et al.. (2014). Impact of topographic mask models on scanner matching solutions. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9052. 905218–905218. 1 indexed citations
4.
Soltwisch, Victor, Anton Haase, Jürgen Probst, et al.. (2014). Determination of line profiles on nano-structured surfaces using EUV and x-ray scattering. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9235. 92351D–92351D. 2 indexed citations
5.
Tyminski, Jacek K., et al.. (2013). Topographic mask modeling with reduced basis finite element method. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8683. 86831C–86831C. 1 indexed citations
6.
Arellano, C., Sergei F. Mingaleev, Igor Koltchanov, et al.. (2013). Efficient design of photonic integrated circuits (PICs) by combining device- and circuit- level simulation tools. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8627. 862711–862711. 3 indexed citations
7.
Pomplun, Jan, H. Wenzel, Sven Burger, et al.. (2012). Thermo-optical simulation of high-power diode lasers. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8255. 825510–825510. 7 indexed citations
8.
Schmidt, Frank, Jan Pomplun, Lin Zschiedrich, & Sven Burger. (2011). Fast online simulation of 3D nanophotonic structures by the reduced basis method. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7941. 79410G–79410G. 2 indexed citations
9.
Pomplun, Jan, Sven Burger, Lin Zschiedrich, & Frank Schmidt. (2011). Reduced basis method for real-time inverse scatterometry. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8083. 808308–808308. 4 indexed citations
10.
Pomplun, Jan, et al.. (2011). Finite element simulation of optical modes in VCSELs. 7606. 119–120. 1 indexed citations
11.
Kleemann, Bernd H., et al.. (2011). Fast online inverse scattering with Reduced Basis Method (RBM) for a 3D phase grating with specific line roughness. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8083. 808309–808309. 3 indexed citations
12.
Pomplun, Jan, Lin Zschiedrich, Sven Burger, et al.. (2010). Reduced basis method for source mask optimization. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7823. 78230E–78230E. 3 indexed citations
13.
Pomplun, Jan, Lin Zschiedrich, Sven Burger, & Frank Schmidt. (2009). Reduced basis method for computational lithography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7488. 74882B–74882B. 3 indexed citations
14.
Schmidt, Frank, Sven Burger, Jan Pomplun, & Lin Zschiedrich. (2008). Advanced FEM analysis of optical waveguides: algorithms and applications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6896. 689602–689602. 3 indexed citations
15.
Scholze, Frank, Christian Laubis, G. Ulm, et al.. (2008). Evaluation of EUV scatterometry for CD characterization of EUV masks using rigorous FEM-simulation. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6921. 69213R–69213R. 10 indexed citations
16.
Burger, Sven, Lin Zschiedrich, Jan Pomplun, & Frank Schmidt. (2008). JCMsuite: An Adaptive FEM Solver for Precise Simulations in Nano-Optics. ITuE4–ITuE4. 30 indexed citations
17.
Pomplun, Jan, A. G. Balanov, & Eckehard Schöll. (2007). Long-term correlations in stochastic systems with extended time-delayed feedback. Physical Review E. 75(4). 40101–40101. 17 indexed citations
18.
Scholze, Frank, Christian Laubis, U. Dersch, et al.. (2007). The influence of line edge roughness and CD uniformity on EUV scatterometry for CD characterization of EUV masks. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6617. 66171A–66171A. 11 indexed citations
19.
Pomplun, Jan, Sven Burger, Frank Schmidt, et al.. (2006). Rigorous FEM-Simulation of EUV-Masks: Influence of Shape and Material Parameters. 13 indexed citations
20.
Pomplun, Jan, et al.. (2005). TIME-DELAY FEEDBACK CONTROL OF NONLINEAR STOCHASTIC OSCILLATIONS. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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