Chih Hang Tung

654 citations

14 papers · 517 indexed · h-index 7

Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices 9
- Integrated Circuits and Semiconductor Failure Analysis 6
- Advancements in Semiconductor Devices and Circuit Design 6
- Electronic Packaging and Soldering Technologies 3
- Advanced MEMS and NEMS Technologies 2
- 3D IC and TSV technologies 2
Materials Chemistry
Atomic and Molecular Physics, and Optics
- Semiconductor materials and interfaces 3
Electronic, Optical and Magnetic Materials
Hardware and Architecture
Biomedical Engineering
- Nanowire Synthesis and Applications 2

Co-authors: K. L. Pey Félix Palumbo S. Lombardo B.P. Linder J. H. Stathis Lei Tang M. Radhakrishnan Rakesh Ranjan
Cited by: Electrical and Electronic Engineering Materials Chemistry Atomic and Molecular Physics, and Optics
Partner nations: Singapore United States Italy

In The Last Decade

Chih Hang Tung

12 papers receiving 509 citations

Peers

Countries citing papers authored by Chih Hang Tung

Since Specialization

Citations

This map shows the geographic impact of Chih Hang Tung's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Chih Hang Tung with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Chih Hang Tung more than expected).

Fields of papers citing papers by Chih Hang Tung

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Chih Hang Tung. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Chih Hang Tung. The network helps show where Chih Hang Tung may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Chih Hang Tung, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Chih Hang Tung Line = papers co-authored together Chih Hang Tung links everyone, so they are left out of the graph.

All Works

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14 of 14 papers shown

#	Work
1	Impact of Gate Dielectric Breakdown Induced Microstructural Defects on Transistor Reliability Xiang Li,K. L. Pey,V.L. Lo,Rakesh Ranjan,Chih Hang Tung,Lei Tang	2009	0
2	Realization of Silicon-Germanium-Tin (SiGeSn) Source/Drain Stressors by Sn implant and Solid Phase Epitaxy for strain engineering in SiGe channel P-MOSFETs Grace Huiqi Wang,Eng-Huat Toh,T. K. Chan,T. Osipowicz,Yong-Lim Foo,Chih Hang Tung,Guo‐Qiang Lo,Ganesh S. Samudra,Yee‐Chia Yeo	2008	1
3	Yttrium- and Terbium-Based Interlayer on $ \hbox{SiO}_{2}$ and $\hbox{HfO}_{2}$ Gate Dielectrics for Work Function Modulation of Nickel Fully Silicided Gate in nMOSFET Andy Eu-Jin Lim,Rinus T. P. Lee,Xinpeng Wang,Wan Sik Hwang,Chih Hang Tung,Ganesh S. Samudra,Dim‐Lee Kwong,Yee‐Chia Yeo	2007	5
4	Silicon-Germanium-Tin (SiGeSn) Source and Drain Stressors formed by Sn Implant and Laser Annealing for Strained Silicon-Germanium Channel P-MOSFETs Grace Huiqi Wang,Eng-Huat Toh,Xincai Wang,Debbie Hwee Leng Seng,S. Tripathy,T. Osipowicz,T. K. Chan,Keat Mun Hoe,S. Balakumar,Chih Hang Tung,Guo‐Qiang Lo,Ganesh S. Samudra,Yee‐Chia Yeo	2007	4
5	Nanometal-oxide-semiconductor field-effect-transistor contact and gate silicide instability during gate dielectric breakdown Chih Hang Tung,K. L. Pey,Rakesh Ranjan,Lei Tang,D. S. Ang	2006	3
6	Structure and Conductance of the Breakdown Spot During the Early Stages of Progressive Breakdown G. Condorelli,S. Lombardo,Félix Palumbo,K. L. Pey,Chih Hang Tung,Lei-Jun Tang	2006	16
7	Dielectric-breakdown-induced epitaxy: a universal breakdown defect in ultrathin gate dielectrics T.A.L. Selvarajoo,Rakesh Ranjan,K. L. Pey,Lei-Jun Tang,Chih Hang Tung,W.H. Lin	2005	17
8	Interface microstructure evolution of lead-free solder on Ni-based under bump metallizations during reflow and high temperature storage Chih Hang Tung,Poi Siong Teo,C. Lee	2005	6
9	Growth of GaAs on (100) Ge and Vicinal Ge Surface by Migration Enhanced Epitaxy H. Tanoto,Soon Fatt Yoon,Wan Khai Loke,Eugene A. Fitzgerald,Carl L. Dohrman,Narayanan Balasubramanian,Chih Hang Tung	2005	3
10	Dielectric breakdown mechanisms in gate oxides S. Lombardo,J. H. Stathis,B.P. Linder,K. L. Pey,Félix Palumbo,Chih Hang Tung	2005	352
11	Process-Structure-Property Relationship and its Impact on Microelectronics Device Reliability and Failure Mechanism Chih Hang Tung	2003	0
12	Percolation path and dielectric-breakdown-induced-epitaxy evolution during ultrathin gate dielectric breakdown transient Chih Hang Tung,K. L. Pey,Lei Tang,M. Radhakrishnan,Wen H. Lin,Félix Palumbo,S. Lombardo	2003	82
13	Investigation of under bump metallization systems for flip-chip assemblies Poi Siong Teo,Yu‐Wen Huang,Chih Hang Tung,Michael Raj Marks,Thiam Beng Lim	2002	16
14	The Superiority of N₂O Plasma Annealing over O₂ Plasma Annealing for Amorphous Tantalum Pentoxide (Ta₂O₅) Films W. S. Lau,Merinnage Tamara Chandima Perera,P. Ramesh Babu,Aik Keong Ow,Taejoon Han,Nathan P. Sandler,Chih Hang Tung,T. T. Sheng,Paul K. Chu	1998	12

About Chih Hang Tung

Chih Hang Tung is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials, having authored 14 papers that have together received 517 indexed citations. Recurring topics across this work include Semiconductor materials and devices (9 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Advancements in Semiconductor Devices and Circuit Design (6 papers), Semiconductor materials and interfaces (3 papers), Electronic Packaging and Soldering Technologies (3 papers), Advanced MEMS and NEMS Technologies (2 papers), 3D IC and TSV technologies (2 papers) and Nanowire Synthesis and Applications (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (473 citations), Materials Chemistry (138 citations) and Atomic and Molecular Physics, and Optics (71 citations). Chih Hang Tung has collaborated with scholars based in Singapore, United States and Italy. Frequent co-authors include K. L. Pey, Félix Palumbo, S. Lombardo, B.P. Linder, J. H. Stathis, Lei Tang, M. Radhakrishnan, Rakesh Ranjan, G. Condorelli and Yu‐Wen Huang.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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