Werner Frammelsberger

493 total citations
28 papers, 389 citations indexed

About

Werner Frammelsberger is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, Werner Frammelsberger has authored 28 papers receiving a total of 389 indexed citations (citations by other indexed papers that have themselves been cited), including 20 papers in Electrical and Electronic Engineering, 17 papers in Atomic and Molecular Physics, and Optics and 8 papers in Materials Chemistry. Recurrent topics in Werner Frammelsberger's work include Force Microscopy Techniques and Applications (15 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Silicon and Solar Cell Technologies (6 papers). Werner Frammelsberger is often cited by papers focused on Force Microscopy Techniques and Applications (15 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Silicon and Solar Cell Technologies (6 papers). Werner Frammelsberger collaborates with scholars based in Germany, United Kingdom and Spain. Werner Frammelsberger's co-authors include Günther Benstetter, Richard Stamp, Janice Kiely, Mario Lanza, Dongping Liu, M. Nafrı́a, Fei Hui, A. G. Banshchikov, Chao Wen and N. S. Sokolov and has published in prestigious journals such as Advanced Materials, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Werner Frammelsberger

28 papers receiving 374 citations

Peers

Countries citing papers authored by Werner Frammelsberger

Since Specialization

Citations

This map shows the geographic impact of Werner Frammelsberger's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Werner Frammelsberger with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Werner Frammelsberger more than expected).

Fields of papers citing papers by Werner Frammelsberger

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Werner Frammelsberger. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Werner Frammelsberger. The network helps show where Werner Frammelsberger may publish in the future.

Co-authorship network of co-authors of Werner Frammelsberger

This figure shows the co-authorship network connecting the top 25 collaborators of Werner Frammelsberger. A scholar is included among the top collaborators of Werner Frammelsberger based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Werner Frammelsberger. Werner Frammelsberger is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Solid Platinum Nanoprobes for Highly Reliable Conductive Atomic Force Microscopy 2023 ·ACS Applied Materials & Interfaces ·(unknown), Yue Yuan, (unknown), (unknown), (unknown), Werner Frammelsberger, Günther Benstetter, Mario Lanza	8
2	Current-Limited Conductive Atomic Force Microscopy 2023 ·ACS Applied Materials & Interfaces ·(unknown), Yue Yuan, Sebastián Pazos, (unknown), (unknown), (unknown), Werner Frammelsberger, Günther Benstetter, Mario Lanza	4
3	Dielectric Properties of Ultrathin CaF₂ Ionic Crystals 2020 ·Advanced Materials ·Chao Wen, A. G. Banshchikov, Yu. Yu. Illarionov, Werner Frammelsberger, Theresia Knobloch, Fei Hui, N. S. Sokolov, Tibor Grasser, Mario Lanza	62
4	On the Limits of Scanning Thermal Microscopy of Ultrathin Films 2020 ·Materials ·(unknown), Werner Frammelsberger, (unknown), (unknown), Kaichen Zhu, Mario Lanza, Günther Benstetter	8
5	Numerical Study of Hydrodynamic Forces for AFM Operations in Liquid 2017 ·Scanning ·(unknown), Günther Benstetter, Werner Frammelsberger, R. Rodrı́guez, M. Nafrı́a	9
6	Characterization of the photocurrents generated by the laser of atomic force microscopes 2016 ·Review of Scientific Instruments ·Yanfeng Ji, Fei Hui, Yuanyuan Shi, V. Iglesias, David Lewis, Jiebin Niu, Shibing Long, Ming Liu, (unknown), Werner Frammelsberger, Günther Benstetter, Andrew G. Scheuermann, Paul C. McIntyre, Mario Lanza	5
7	Nanoscale characterization of CH 3 -terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques 2015 ·Applied Surface Science ·(unknown), Günther Benstetter, Werner Frammelsberger, R. Rodrı́guez, M. Nafrı́a	2
8	Nanoscale characterization of copper oxide films by Kelvin Probe Force Microscopy 2015 ·Thin Solid Films ·(unknown), Günther Benstetter, Werner Frammelsberger, R. Rodrı́guez, M. Nafrı́a	11
9	Pattern Saw Marks on Diamond Wire Cut Wafers – from Wafer to Module 2015 ·EU PVSEC ·(unknown), D.L. Bätzner, (unknown), R. B. G. Kramer, (unknown), D. Lachenal, Werner Frammelsberger, (unknown), (unknown), P. Papet, B. Strahm, (unknown)	2
10	Silicon Specification for High Efficiency HJT 2015 ·EU PVSEC ·D.L. Bätzner, (unknown), Werner Frammelsberger, R. B. G. Kramer, D. Lachenal, (unknown), (unknown), P. Papet, (unknown), B. Strahm, (unknown)	4
11	Characterisation of Over 21% Efficient Silicon Heterojunction Cells Developed at Roth & Rau Switzerland 2011 ·EU PVSEC ·D.L. Bätzner, (unknown), (unknown), (unknown), Werner Frammelsberger, C. Guérin, (unknown), D. Lachenal, (unknown), P. Papet, B. Rau, B. Strahm, (unknown), (unknown)	6
12	Status of the Development of Micromorph Cells and Modules at Schott Solar Thin Film GmbH 2010 ·EU PVSEC ·Werner Frammelsberger, P. Lechner, R. Lechner, (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), Hartmut Popp, (unknown), R. Walter, (unknown), (unknown)	1
13	Influence of the manufacturing process on the electrical properties of thin (<4nm) Hafnium based high-k stacks observed with CAFM 2007 ·Microelectronics Reliability ·Mario Lanza, M. Porti, M. Nafrı́a, Günther Benstetter, Werner Frammelsberger, (unknown), (unknown), (unknown)	25
14	C-AFM-based thickness determination of thin and ultra-thin SiO 2 films by use of different conductive-coated probe tips 2006 ·Applied Surface Science ·Werner Frammelsberger, Günther Benstetter, Janice Kiely, Richard Stamp	82
15	Nanoscale electron field emissions from the bare, hydrogenated, and graphitelike-layer-covered tetrahedral amorphous carbon films 2006 ·Journal of Applied Physics ·Dongping Liu, Günther Benstetter, Werner Frammelsberger	3
16	Intermittent contact scanning capacitance microscopy-An improved method for 2D doping profiling 2005 ·Microelectronics Reliability ·(unknown), Günther Benstetter, B. Knoll, Werner Frammelsberger	5
17	Thickness determination of thin and ultra-thin SiO2 films by C-AFM IV-spectroscopy 2005 ·Applied Surface Science ·Werner Frammelsberger, Günther Benstetter, Janice Kiely, Richard Stamp	43
18	Simplified tunnelling current calculation for MOS structures with ultra-thin oxides for conductive atomic force microscopy investigations 2004 ·Materials Science and Engineering B ·Werner Frammelsberger, Günther Benstetter, Richard Stamp, Janice Kiely, (unknown)	13
19	Combined AFM methods to improve reliability investigations of thin oxides 2003 ·Werner Frammelsberger, Günther Benstetter, Richard Stamp, Jason Edwin Stamp, Janice Kiely	2
20	Characterization of thin and ultra-thin SiO2 films and SiO2/Si interfaces with combined conducting and topographic atomic force microscopy 2003 ·Microelectronics Reliability ·Werner Frammelsberger, Günther Benstetter, (unknown), Richard Stamp, Janice Kiely	8

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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