T. Sorsch

2.9k total citations · 1 hit paper
45 papers, 1.9k citations indexed

About

T. Sorsch is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, T. Sorsch has authored 45 papers receiving a total of 1.9k indexed citations (citations by other indexed papers that have themselves been cited), including 41 papers in Electrical and Electronic Engineering, 12 papers in Biomedical Engineering and 8 papers in Materials Chemistry. Recurrent topics in T. Sorsch's work include Semiconductor materials and devices (28 papers), Advancements in Semiconductor Devices and Circuit Design (22 papers) and Photonic and Optical Devices (8 papers). T. Sorsch is often cited by papers focused on Semiconductor materials and devices (28 papers), Advancements in Semiconductor Devices and Circuit Design (22 papers) and Photonic and Optical Devices (8 papers). T. Sorsch collaborates with scholars based in United States, Germany and Belgium. T. Sorsch's co-authors include G. Timp, David A. Muller, F.H. Baumann, S. Moccio, K. Evans‐Lutterodt, F. Klemens, P. J. Silvėrman, B. Busch, G. D. Wilk and B. E. Weir and has published in prestigious journals such as Nature, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

T. Sorsch

45 papers receiving 1.8k citations

Hit Papers

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What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

The electronic structure at the atomic scale of ultrathin gate oxides

1999 780 citations David A. Muller, T. Sorsch et al. profile →

Peers

Countries citing papers authored by T. Sorsch

Since Specialization

Citations

This map shows the geographic impact of T. Sorsch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Sorsch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Sorsch more than expected).

Fields of papers citing papers by T. Sorsch

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T. Sorsch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Sorsch. The network helps show where T. Sorsch may publish in the future.

Co-authorship network of co-authors of T. Sorsch

This figure shows the co-authorship network connecting the top 25 collaborators of T. Sorsch. A scholar is included among the top collaborators of T. Sorsch based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with T. Sorsch. T. Sorsch is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Nanopores in solid-state membranes engineered for single molecule detection. Nanotechnology, 21(6), 065502 2010 ·V. Dimitrov, Utkur Mirsaidov, (unknown), T. Sorsch, W Mansfield, J.F. Miner, F. Klemens, Raymond A. Cirelli, Sukru Yemenicioglu, G. Timp	4
2	Nanopores in solid-state membranes engineered for single molecule detection 2010 ·Nanotechnology ·V. Dimitrov, Utkur Mirsaidov, (unknown), T. Sorsch, W Mansfield, J.F. Miner, F. Klemens, Raymond A. Cirelli, Sukru Yemenicioglu, G. Timp	74
3	Small-signal performance and modeling of sub-50nm nMOSFETs with fT above 460-GHz 2008 ·Solid-State Electronics ·V. Dimitrov, J.B. Heng, (unknown), (unknown), R. Chan, (unknown), J. Feng, T. Sorsch, W Mansfield, J.F. Miner, A. Kornblit, F. Klemens, J. E. Bower, Raymond A. Cirelli, E. Ferry, A. H. Taylor, M. Feng, G. Timp	17
4	Exploring the Prospects for a Nanometer-scale Gene Chip 2006 ·V. Dimitrov, Aleksei Aksimentiev, Klaus Schulten, J.B. Heng, T. Sorsch, W Mansfield, J.F. Miner, G. P. Watson, Raymond A. Cirelli, F. Klemens, J. E. Bower, E. Ferry, (unknown), A. Kornblit, Brian Dorvel, Qian Zhao, G. Timp	3
5	Rapid thermal processing of silicon wafers with emissivity patterns 2006 ·Journal of Electronic Materials ·M. Rabus, A. T. Fiory, Nuggehalli M. Ravindra, (unknown), Aditya Agarwal, T. Sorsch, J.F. Miner, E. Ferry, F. Klemens, R. Cirelli, W Mansfield	12
6	Beyond the gene chip 2005 ·Bell Labs Technical Journal ·J.B. Heng, Aleksei Aksimentiev, Chuen Ho, V. Dimitrov, T. Sorsch, J.F. Miner, W Mansfield, Klaus Schulten, G. Timp	32
7	Compact spectral pulse shaping using hybrid planar lightwave circuit and free-space optics with MEMS piston micromirrors and spectrogram feedback control 2004 ·David Moalem Maron, C. Dorrer, Ilnam Kang, C.R. Doerr, M. Cappuzzo, L. Gomez, (unknown), A. Wong-Foy, E.J. Laskowski, F. Klemens, Cristian Bolle, Raymond A. Cirelli, E. Ferry, T. Sorsch, J.F. Miner, (unknown), M.E. Simon, F. Pardo, Daniel López	5
8	Improved film growth and flatband voltage control of ALD HfO/sub 2/ and Hf-Al-O with n/sup +/ poly-Si gates using chemical oxides and optimized post-annealing 2003 ·G. D. Wilk, (unknown), M.-Y. Ho, B. Busch, T. Sorsch, F. Klemens, Bert Brijs, R. B. van Dover, A. Kornblit, T. Gustafsson, Eric Garfunkel, S.J. Hillenius, D. Monroe, (unknown), J. M. Hergenrother	19
9	Monolithic fringe-field-activated crystalline silicon tilting-mirror devices 2003 ·Journal of Microelectromechanical Systems ·Dennis S. Greywall, (unknown), Sang‐Hyun Oh, (unknown), Dan M. Marom, Paul Busch, R. Cirelli, J. Ashley Taylor, F. Klemens, T. Sorsch, J. E. Bower, Warren Y. Lai, H. Tom Soh	16
10	Gate oxides in 50 nm devices: thickness uniformity improves projected reliability 2003 ·B. E. Weir, P. J. Silvėrman, Muhammad A. Alam, F.H. Baumann, D. Monroe, A. Ghetti, J. Bude, G. Timp, Abdullah Hamad, (unknown), Ni Zhao, Y. Ma, (unknown), D. Hwang, T. Sorsch, (unknown)	14
11	Ultra-thin, 1.0-3.0 nm, gate oxides for high performance sub-100 nm technology 2002 ·T. Sorsch, Winston Timp, F.H. Baumann, K. H. A. Bogart, T. Boone, Vincent M. Donnelly, (unknown), K. Evans‐Lutterodt, (unknown), S. Moccio, J. M. Rosamilia, J. Sapjeta, (unknown), B. E. Weir, G. Timp	9
12	Ultra-thin gate oxide reliability projections 2002 ·Solid-State Electronics ·B. E. Weir, Md Ashraful Alam, P. J. Silvėrman, F.H. Baumann, D. Monroe, J. Bude, G. Timp, Abdullah Hamad, Y. Ma, (unknown), D. Hwang, T. Sorsch, A. Ghetti, G. D. Wilk	10
13	A novel, aerosol-nanocrystal floating-gate device for non-volatile memory applications 2002 ·J. De Blauwe, Michele L. Ostraat, (unknown), Gary R. Weber, T. Sorsch, A. Kerber, F. Klemens, Raymond A. Cirelli, E. Ferry, J. L. Grazul, (unknown), (unknown), W Mansfield, J. Bude, (unknown), S.J. Hillenius, Richard C. Flagan, Harry A. Atwater	15
14	Gate oxide reliability projection to the sub-2 nm regime 2000 ·Semiconductor Science and Technology ·B. E. Weir, Md Ashraful Alam, J. Bude, P. J. Silvėrman, A. Ghetti, F.H. Baumann, (unknown), D. Monroe, T. Sorsch, G. Timp, Y. Ma, (unknown), Abdullah Hamad, D. Hwang, Philip E. Mason	66
15	Isotopic labeling studies of interactions of nitric oxide and nitrous oxide with ultrathin oxynitride layers on silicon 2000 ·Journal of Applied Physics ·Hongcheng Lu, E. P. Gusev, Eric Garfunkel, B. Busch, T. Gustafsson, T. Sorsch, (unknown)	19
16	Understanding the limits of ultrathin SiO2 and SiON gate dielectrics for sub-50 nm CMOS 1999 ·Microelectronic Engineering ·(unknown), T. Sorsch, G. Timp, David A. Muller, B. E. Weir, P. J. Silvėrman, S. Moccio, (unknown)	55
17	Gate Technology Issues for Silicon Mos Nanotransistors 1999 ·MRS Proceedings ·D. M. Tennant, G. Timp, Leonidas E. Ocola, (unknown), T. Sorsch, (unknown), F. Klemens, R. N. Kleiman, David A. Muller, (unknown), Winston Timp	1
18	Oxidation of Si beneath thin SiO2 layers during exposure to HBr/O2 plasmas, investigated by vacuum transfer x-ray photoelectron spectroscopy 1999 ·Applied Physics Letters ·Vincent M. Donnelly, F. Klemens, T. Sorsch, G. Timp, F. Baumann	39
19	Ultrathin SiOxNy by rapid thermal heating of silicon in N2 at T=760–1050 °C 1997 ·Applied Physics Letters ·M. L. Green, T. Sorsch, L. C. Feldman, W. N. Lennard, E. P. Gusev, E. Garfunkel, Hongcheng Lu, T. Gustafsson	19
20	Ultrashallow p⁺-n junctions formed by diffusion from an RTCVD-deposited B:Ge layer 1994 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), C. A. King, D. J. Eaglesham, T. Sorsch, B. E. Weir, H. S. Luftman, Jeffrey Bokor, (unknown)	3

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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