D. Hwang

464 citations

13 papers · 296 indexed · h-index 8

Co-authors: D. Monroe F.H. Baumann P. J. Silvėrman T. Sorsch G. Timp B. E. Weir Muhammad A. Alam W.K. Fuchs
Topics: Semiconductor materials and devices (9 papers)Advancements in Semiconductor Devices and Circuit Design (6 papers)Copper Interconnects and Reliability (3 papers)
Cited by: Hardware and Architecture Electrical and Electronic Engineering Electronic, Optical and Magnetic Materials
Journals: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Solid-State Electronics Semiconductor Science and Technology
Partner nations: United States Germany South Korea

In The Last Decade

D. Hwang

12 papers receiving 274 citations

Peers

Countries citing papers authored by D. Hwang

Since Specialization

Citations

This map shows the geographic impact of D. Hwang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Hwang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Hwang more than expected).

Fields of papers citing papers by D. Hwang

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. Hwang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Hwang. The network helps show where D. Hwang may publish in the future.

Co-authorship network of co-authors of D. Hwang

This figure shows the co-authorship network connecting the top 25 collaborators of D. Hwang. A scholar is included among the top collaborators of D. Hwang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. Hwang. D. Hwang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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13 of 13 papers shown

#	Work	Indexed citations
1	FlowerFormer: Empowering Neural Architecture Encoding Using a Flow-Aware Graph Transformer 2024 ·D. Hwang,Hyunju Kim,Sunwoo Kim,Kijung Shin	2
2	Time-dependent dielectric breakdown of a recessed channel DRAM access device 2006 ·(unknown),D. Hwang,(unknown),(unknown)	2
3	A 78nm 6F/sup 2/ DRAM technology for multigigabit densities 2004 ·(unknown),B. Busch,(unknown),D. Hwang,(unknown),Daniel D. Stancil,(unknown),(unknown),(unknown),L. C. Tran	6
4	A 78nm 6F DRAM Technology for Multigigabit Densities 2004 ·(unknown),B. Busch,(unknown),D. Hwang,(unknown),Daniel D. Stancil,(unknown),(unknown),(unknown),L. C. Tran	6
5	A methodology for accurate assessment of soft-broken gate oxide leakage and the reliability of VLSI circuits 2004 ·(unknown),(unknown),(unknown),Muhammad A. Alam,D. Hwang	14
6	CSP-based object-oriented description of parallel reconfiguration architectures 2003 ·D. Hwang,W.K. Fuchs	0
7	Gate oxides in 50 nm devices: thickness uniformity improves projected reliability 2003 ·B. E. Weir,P. J. Silvėrman,Muhammad A. Alam,F.H. Baumann,D. Monroe,A. Ghetti,J. Bude,G. Timp,Abdullah Hamad,(unknown),Ni Zhao,Y. Ma,(unknown),D. Hwang,T. Sorsch,(unknown)	14
8	Quantitative yield and reliability projection from antenna test results-a case study 2002 ·(unknown),Kin P. Cheung,D. Hwang,(unknown),R. Degraeve,B. Kaczer	11
9	Ultra-thin gate oxide reliability projections 2002 ·Solid-State Electronics ·B. E. Weir,Md Ashraful Alam,P. J. Silvėrman,F.H. Baumann,D. Monroe,J. Bude,G. Timp,Abdullah Hamad,Y. Ma,(unknown),D. Hwang,T. Sorsch,A. Ghetti,G. D. Wilk	10
10	Ultra-thin gate dielectrics: they break down, but do they fail? 2002 ·B. E. Weir,P. J. Silvėrman,D. Monroe,K.S. Krisch,Muhammad A. Alam,G. B. Alers,T. Sorsch,G. Timp,F.H. Baumann,(unknown),Yubin Ma,D. Hwang	120
11	Plasma charging damage of ultra-thin gate-oxide-the measurement dilemma 2002 ·Kin P. Cheung,Philip E. Mason,D. Hwang	10
12	Gate oxide reliability projection to the sub-2 nm regime 2000 ·Semiconductor Science and Technology ·B. E. Weir,Md Ashraful Alam,J. Bude,P. J. Silvėrman,A. Ghetti,F.H. Baumann,(unknown),D. Monroe,T. Sorsch,G. Timp,Y. Ma,(unknown),Abdullah Hamad,D. Hwang,Philip E. Mason	66
13	An Efficient Approach to Gate Matrix Layout 1987 ·IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·D. Hwang,W.K. Fuchs,Sung Mo Kang	35

About D. Hwang

D. Hwang is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 13 papers that have together received 296 indexed citations. Recurring topics across this work include Semiconductor materials and devices (9 papers), Advancements in Semiconductor Devices and Circuit Design (6 papers) and Copper Interconnects and Reliability (3 papers). The work is most often cited by research in Hardware and Architecture (37 citations), Electrical and Electronic Engineering (287 citations) and Electronic, Optical and Magnetic Materials (16 citations). D. Hwang has collaborated with scholars based in United States, Germany and South Korea. Frequent co-authors include D. Monroe, F.H. Baumann, P. J. Silvėrman, T. Sorsch, G. Timp, B. E. Weir, Muhammad A. Alam, W.K. Fuchs, Sung Mo Kang and K.S. Krisch. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Solid-State Electronics and Semiconductor Science and Technology.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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