J. Sapjeta

1.3k total citations
29 papers, 951 citations indexed

About

J. Sapjeta is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computational Mechanics. According to data from OpenAlex, J. Sapjeta has authored 29 papers receiving a total of 951 indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Electrical and Electronic Engineering, 7 papers in Materials Chemistry and 5 papers in Computational Mechanics. Recurrent topics in J. Sapjeta's work include Semiconductor materials and devices (16 papers), Silicon and Solar Cell Technologies (5 papers) and Copper Interconnects and Reliability (5 papers). J. Sapjeta is often cited by papers focused on Semiconductor materials and devices (16 papers), Silicon and Solar Cell Technologies (5 papers) and Copper Interconnects and Reliability (5 papers). J. Sapjeta collaborates with scholars based in United States, Germany and France. J. Sapjeta's co-authors include M. K. Weldon, Yves J. Chabal, R. L. Opila, Jane P. Chang, Alejandra B. Gurevich, K. T. Queeney, D. C. Jacobson, D. J. Eaglesham, Zhenan Bao and Andrew J. Lovinger and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Chemistry of Materials.

In The Last Decade

J. Sapjeta

26 papers receiving 909 citations

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
J. Sapjeta 799 370 168 120 119 29 951
B. Agius 644 0.8× 388 1.0× 111 0.7× 89 0.7× 121 1.0× 63 817
G.M. Crean 609 0.8× 474 1.3× 192 1.1× 96 0.8× 207 1.7× 108 1.0k
S. Banerjee 433 0.5× 481 1.3× 213 1.3× 139 1.2× 159 1.3× 60 984
J.E. Bourée 616 0.8× 720 1.9× 166 1.0× 66 0.6× 140 1.2× 89 1.1k
Yusuke Mizokawa 614 0.8× 530 1.4× 217 1.3× 122 1.0× 110 0.9× 49 996
W.M. Arnoldbik 793 1.0× 545 1.5× 95 0.6× 270 2.3× 93 0.8× 60 1.0k
Pavo Dubček 419 0.5× 615 1.7× 145 0.9× 139 1.2× 99 0.8× 116 868
C. H. Ting 780 1.0× 218 0.6× 210 1.3× 80 0.7× 347 2.9× 37 981
Hiroaki Kakiuchi 758 0.9× 481 1.3× 104 0.6× 61 0.5× 85 0.7× 108 957
A. del Prado 1.0k 1.3× 611 1.7× 304 1.8× 86 0.7× 81 0.7× 86 1.2k

Countries citing papers authored by J. Sapjeta

Since Specialization
Citations

This map shows the geographic impact of J. Sapjeta's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Sapjeta with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Sapjeta more than expected).

Fields of papers citing papers by J. Sapjeta

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Sapjeta. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Sapjeta. The network helps show where J. Sapjeta may publish in the future.

Co-authorship network of co-authors of J. Sapjeta

This figure shows the co-authorship network connecting the top 25 collaborators of J. Sapjeta. A scholar is included among the top collaborators of J. Sapjeta based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Sapjeta. J. Sapjeta is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Torre, J. Dalla, George H. Gilmer, David L. Windt, et al.. (2003). Microstructure of thin tantalum films sputtered onto inclined substrates: Experiments and atomistic simulations. Journal of Applied Physics. 94(1). 263–271. 63 indexed citations
2.
Sorsch, T., Winston Timp, F.H. Baumann, et al.. (2002). Ultra-thin, 1.0-3.0 nm, gate oxides for high performance sub-100 nm technology. 222–223. 9 indexed citations
3.
Weldon, M. K., Vittorio Marsico, Yves J. Chabal, et al.. (2002). Mechanism of silicon exfoliation by hydrogen implantation and He, Li and Si co-implantation [SOI technology]. 124–125. 1 indexed citations
4.
Queeney, K. T., M. K. Weldon, Jane P. Chang, et al.. (2000). Infrared spectroscopic analysis of the Si/SiO2 interface structure of thermally oxidized silicon. Journal of Applied Physics. 87(3). 1322–1330. 219 indexed citations
5.
Gurevich, Alejandra B., M. K. Weldon, Yves J. Chabal, R. L. Opila, & J. Sapjeta. (1999). Thermal evolution of impurities in wet chemical silicon oxides. Applied Physics Letters. 74(9). 1257–1259. 15 indexed citations
6.
Sapjeta, J., Jane P. Chang, P. J. Silvėrman, et al.. (1999). Relationship between Interfacial Roughness and Dielectric Reliability for Silicon Oxynitride Gate Dielectrics Processed with Nitric Oxide. MRS Proceedings. 567. 6 indexed citations
7.
Windt, David L., J. Dalla Torre, George H. Gilmer, et al.. (1999). Growth and Structure of Metallic Barrie Laye and Interconnect Films I: Exeriments. MRS Proceedings. 564. 4 indexed citations
8.
Wong‐Leung, J., D. J. Eaglesham, J. Sapjeta, et al.. (1998). The precipitation of Fe at the Si–SiO2 interface. Journal of Applied Physics. 83(1). 580–584. 31 indexed citations
9.
Weldon, M. K., Vittorio Marsico, Yves J. Chabal, et al.. (1997). Mechanism of Silicon Exfoliation by Hydrogen Implantation and He, Li and Si CO-implantation. Repository of the University of Namur. 1997. 124–125.
10.
Weldon, M. K., Vittorio Marsico, Yves J. Chabal, et al.. (1997). On the mechanism of the hydrogen-induced exfoliation of silicon. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 15(4). 1065–1073. 261 indexed citations
11.
12.
Sapjeta, J., T. Boone, J. M. Rosamilia, et al.. (1997). Minimization of Interfacial Microroughness for 13–60 Å Ultrathin Gate Oxides. MRS Proceedings. 477. 8 indexed citations
13.
Sapjeta, J., et al.. (1995). Protective treatments for gold-flashed contact finishes with a nickel substrate. IEEE Transactions on Components Packaging and Manufacturing Technology Part A. 18(2). 405–408. 6 indexed citations
14.
Ma, Yanjun, M. L. Green, L. C. Feldman, et al.. (1995). Vapor phase SiO2 etching and metallic contamination removal in an integrated cluster system. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(4). 1460–1465. 7 indexed citations
15.
Sapjeta, J., et al.. (1994). Protective Treatments for Nickel‐Based Contact Materials. Journal of The Electrochemical Society. 141(7). 1977–1982. 7 indexed citations
16.
Stevie, F. A., et al.. (1993). Effect of Hot Water Exposure on Bare Silicon Surfaces in Mos Processing. MRS Proceedings. 315(1). 485–490. 5 indexed citations
17.
Sapjeta, J., et al.. (1991). Electrical contact phenomena of nickel electrodeposits with sharp micro-asperities. IEEE Transactions on Components Hybrids and Manufacturing Technology. 14(3). 585–591. 3 indexed citations
18.
Fleming, J. W., et al.. (1990). Calorimetric studies of electrochemical incorporation of hydrogen isotopes into palladium. Journal of Fusion Energy. 9(4). 517–524. 2 indexed citations
19.
Sapjeta, J., et al.. (1989). Effect of Cobalt on Fibrous Nickel Hydroxide Electrodes. Journal of The Electrochemical Society. 136(6). 1603–1606. 19 indexed citations
20.
Sapjeta, J., et al.. (1987). Regeneration of ion-exchange resins used for gold recovery. Industrial & Engineering Chemistry Research. 26(8). 1716–1719. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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