E.G. Ioannidis

633 total citations
29 papers, 381 citations indexed

About

E.G. Ioannidis is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, E.G. Ioannidis has authored 29 papers receiving a total of 381 indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Electrical and Electronic Engineering, 2 papers in Biomedical Engineering and 1 paper in Atomic and Molecular Physics, and Optics. Recurrent topics in E.G. Ioannidis's work include Advancements in Semiconductor Devices and Circuit Design (28 papers), Semiconductor materials and devices (25 papers) and Integrated Circuits and Semiconductor Failure Analysis (14 papers). E.G. Ioannidis is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (28 papers), Semiconductor materials and devices (25 papers) and Integrated Circuits and Semiconductor Failure Analysis (14 papers). E.G. Ioannidis collaborates with scholars based in France, Greece and Austria. E.G. Ioannidis's co-authors include C.A. Dimitriadis, G. Ghibaudo, S. Haendler, Christoforos Theodorou, J. Jomaah, A. Tsormpatzoglou, D.H. Tassis, E. Josse, R.A. Bianchi and T.A. Karatsori and has published in prestigious journals such as Journal of Applied Physics, IEEE Transactions on Electron Devices and IEEE Electron Device Letters.

In The Last Decade

E.G. Ioannidis

29 papers receiving 372 citations

Peers

Countries citing papers authored by E.G. Ioannidis

Since Specialization

Citations

This map shows the geographic impact of E.G. Ioannidis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E.G. Ioannidis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E.G. Ioannidis more than expected).

Fields of papers citing papers by E.G. Ioannidis

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E.G. Ioannidis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E.G. Ioannidis. The network helps show where E.G. Ioannidis may publish in the future.

Co-authorship network of co-authors of E.G. Ioannidis

This figure shows the co-authorship network connecting the top 25 collaborators of E.G. Ioannidis. A scholar is included among the top collaborators of E.G. Ioannidis based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E.G. Ioannidis. E.G. Ioannidis is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO₂Transistors 2023 ·IEEE Transactions on Device and Materials Reliability ·(unknown), Theresia Knobloch, Dominic Waldhoer, Bernhard Stampfer, E.G. Ioannidis, H. Enichlmair, Rainer Minixhofer, Tibor Grasser, Michael Waltl	1
2	Evaluation of the impact of defects on threshold voltage drift employing SiO2 pMOS transistors 2022 ·Microelectronics Reliability ·(unknown), (unknown), Theresia Knobloch, H. Enichlmair, E.G. Ioannidis, Rainer Minixhofer, Tibor Grasser, Michael Waltl	2
3	Toward Automated Defect Extraction From Bias Temperature Instability Measurements 2021 ·IEEE Transactions on Electron Devices ·Dominic Waldhoer, Christian Schleich, (unknown), Bernhard Stampfer, (unknown), E.G. Ioannidis, H. Enichlmair, Michael Waltl, Tibor Grasser	27
4	On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors 2021 ·IEEE Transactions on Device and Materials Reliability ·(unknown), (unknown), Bernhard Stampfer, (unknown), E.G. Ioannidis, H. Enichlmair, Tibor Grasser, Michael Waltl	4
5	Impact of single-defects on the variability of CMOS inverter circuits 2021 ·Microelectronics Reliability ·Michael Waltl, Dominic Waldhoer, (unknown), Bernhard Stampfer, Christian Schleich, G. Rzepa, H. Enichlmair, E.G. Ioannidis, Rainer Minixhofer, Tibor Grasser	3
6	Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS 2021 ·2021 IEEE International Electron Devices Meeting (IEDM) ·(unknown), Alexander Grill, Bernhard Stampfer, Dominic Waldhoer, Christian Schleich, Theresia Knobloch, E.G. Ioannidis, H. Enichlmair, Rainer Minixhofer, B. Kaczer, Bertrand Parvais, B. Govoreanu, Iuliana Radu, Tibor Grasser, Michael Waltl	18
7	Distribution of Step Heights of Electron and Hole Traps in SiON nMOS Transistors 2020 ·(unknown), Bernhard Stampfer, (unknown), E.G. Ioannidis, H. Enichlmair, Michael Waltl	2
8	Impact of source/drain and bulk engineering on LFN performance of n- and p-MOSFET 2017 ·Solid-State Electronics ·E.G. Ioannidis, (unknown), (unknown), (unknown), F.P. Leisenberger, (unknown), (unknown), V. Vescoli	2
9	Dynamic variability in 14nm FD-SOI MOSFETs and transient simulation methodology 2015 ·Solid-State Electronics ·Christoforos Theodorou, E.G. Ioannidis, S. Haendler, C.A. Dimitriadis, (unknown)	1
10	Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction 2015 ·Solid-State Electronics ·T.A. Karatsori, Christoforos Theodorou, E.G. Ioannidis, S. Haendler, E. Josse, C.A. Dimitriadis, G. Ghibaudo	35
11	Drain-Current Flicker Noise Modeling in nMOSFETs From a 14-nm FDSOI Technology 2015 ·IEEE Transactions on Electron Devices ·E.G. Ioannidis, Christoforos Theodorou, T.A. Karatsori, S. Haendler, C.A. Dimitriadis, (unknown)	19
12	Analytical Compact Model for Lightly Doped Nanoscale Ultrathin-Body and Box SOI MOSFETs With Back-Gate Control 2015 ·IEEE Transactions on Electron Devices ·T.A. Karatsori, A. Tsormpatzoglou, Christoforos Theodorou, E.G. Ioannidis, S. Haendler, N. Planes, (unknown), C.A. Dimitriadis	12
13	Low frequency noise variability in ultra scaled FD-SOI n-MOSFETs: Dependence on gate bias, frequency and temperature 2015 ·Solid-State Electronics ·Christoforos Theodorou, E.G. Ioannidis, S. Haendler, E. Josse, C.A. Dimitriadis, G. Ghibaudo	13
14	Evolution of low frequency noise and noise variability through CMOS bulk technology nodes from 0.5μm down to 20nm 2014 ·Solid-State Electronics ·E.G. Ioannidis, S. Haendler, Christoforos Theodorou, (unknown), C.A. Dimitriadis, G. Ghibaudo	14
15	Impact of low‐frequency noise variability on statistical parameter extraction in ultra‐scaled CMOS devices 2014 ·Electronics Letters ·E.G. Ioannidis, Christoforos Theodorou, S. Haendler, C.A. Dimitriadis, G. Ghibaudo	4
16	Characterization and modeling of low frequency noise in CMOS inverters 2013 ·Solid-State Electronics ·E.G. Ioannidis, S. Haendler, C.A. Dimitriadis, G. Ghibaudo	6
17	Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs 2012 ·Solid-State Electronics ·E.G. Ioannidis, C.A. Dimitriadis, S. Haendler, R.A. Bianchi, J. Jomaah, G. Ghibaudo	47
18	Low frequency noise variability in high-k/metal gate stack 28nm bulk and FD-SOI CMOS transistors 2011 ·E.G. Ioannidis, S. Haendler, A. Bajolet, (unknown), N. Planes, F. Arnaud, R.A. Bianchi, M. Haond, Dominique Golanski, José M. de la Rosa, C. Fenouillet-Béranger, P. Perreau, C.A. Dimitriadis, G. Ghibaudo	26
19	Characterization of traps in the gate dielectric of amorphous and nanocrystalline silicon thin-film transistors by 1/f noise 2010 ·Journal of Applied Physics ·E.G. Ioannidis, A. Tsormpatzoglou, D.H. Tassis, C.A. Dimitriadis, François Templier, G. Kamarinos	35
20	Effect of Localized Interface Charge on the Threshold Voltage of Short-Channel Undoped Symmetrical Double-Gate MOSFETs 2010 ·IEEE Transactions on Electron Devices ·E.G. Ioannidis, A. Tsormpatzoglou, D.H. Tassis, C.A. Dimitriadis, G. Ghibaudo, J. Jomaah	33

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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