Adrian Evans
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
- Embedded Systems Design Techniques
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- Radiation Effects in Electronics
- Semiconductor materials and devices
- Low-power high-performance VLSI design
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Advanced Memory and Neural Computing
Papers in
-
- VLSI and Analog Circuit Testing 17
- Software 4
- Software Reliability and Analysis Research 4
- Co-authors
- Dan AlexandrescuMaximilien GlorieuxVéronique Ferlet-CavroisMehdi B. TahooriMojtaba EbrahimiJuan Antonio MaestroShi-Jie WenPedro Reviriego
- Journals
- IEEE Transactions on Nuclear Science (6 papers)Microelectronics Reliability (2 papers)IEEE Transactions on Very Large Scale Integration (VLSI) Systems (1 paper)IEEE Transactions on Circuits & Systems II Express Briefs (1 paper)IEEE Transactions on Device and Materials Reliability (1 paper)
- Partner nations
- FranceUnited StatesNetherlands
In The Last Decade
Adrian Evans
32 papers receiving 345 citations
Peers
Comparison fields: 5 of 29
- Hardware and Architecture 208
- Electrical and Electronic Engineering 314
- Software 16
- Safety, Risk, Reliability and Quality 25
- Computer Networks and Communications 43
Countries citing papers authored by Adrian Evans
This map shows the geographic impact of Adrian Evans's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Adrian Evans with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Adrian Evans more than expected).
Fields of papers citing papers by Adrian Evans
This network shows the impact of papers produced by Adrian Evans. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Adrian Evans. The network helps show where Adrian Evans may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Adrian Evans, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 1 | |
| 2 | 2024 | 2 | |
| 3 | 2024 | 1 | |
| 4 | 2024 | 0 | |
| 5 | 2024 | 0 | |
| 6 | 2024 | 2 | |
| 7 | 2024 | 4 | |
| 8 | 2021 | 1 | |
| 9 | 2016 | 21 | |
| 10 | 2016 | 49 | |
| 11 | 2015 | 6 | |
| 12 | 2015 | 49 | |
| 13 | 2015 | 1 | |
| 14 | 2014 | 9 | |
| 15 | 2014 | 2 | |
| 16 | 2014 | 25 | |
| 17 | 2013 | 1 | |
| 18 | 2008 | 1 | |
| 19 | 1998 | 33 | |
| 20 | Adding Control Signals to Enhance Circuit Testability | 1994 | 1 |
About Adrian Evans
Adrian Evans is a scholar working on Hardware and Architecture, Software, Safety, Risk, Reliability and Quality, Electrical and Electronic Engineering and Computer Networks and Communications, having authored 35 papers that have together received 354 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (24 papers), VLSI and Analog Circuit Testing (17 papers), Low-power high-performance VLSI design (5 papers), Semiconductor materials and devices (5 papers), Software Reliability and Analysis Research (4 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Reliability and Maintenance Optimization (4 papers) and Quantum Computing Algorithms and Architecture (3 papers). The work is most often cited by research in Hardware and Architecture (208 citations), Electrical and Electronic Engineering (314 citations), Software (16 citations), Safety, Risk, Reliability and Quality (25 citations) and Computer Networks and Communications (43 citations). Adrian Evans has collaborated with scholars based in France, United States and Netherlands. Frequent co-authors include Dan Alexandrescu, Maximilien Glorieux, Véronique Ferlet-Cavrois, Mehdi B. Tahoori, Mojtaba Ebrahimi, Juan Antonio Maestro, Shi-Jie Wen, Pedro Reviriego, Vikas Chandra and Li Chen. Their work appears in journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE Transactions on Circuits & Systems II Express Briefs and IEEE Transactions on Device and Materials Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.