Sanghyeon Baeg
- Electrical and Electronic Engineering top 5%
- Hardware and Architecture top 1%
- Computer Networks and Communications top 5%
- Artificial Intelligence
- Molecular Biology
- Co-authors
- Shi-Jie WenRichard WongKyung‐Bae ParkC.K. LimZahid UllahKyungBae ParkPedro ReviriegoSoon Young Lee
- Topics
- VLSI and Analog Circuit Testing (34 papers)Integrated Circuits and Semiconductor Failure Analysis (32 papers)Semiconductor materials and devices (32 papers)
- Cited by
- Hardware and ArchitectureElectrical and Electronic EngineeringComputer Networks and Communications
- Partner nations
- South KoreaUnited StatesChina
In The Last Decade
Sanghyeon Baeg
60 papers receiving 780 citations
Peers
Comparison fields: 5 of 34
- Electrical and Electronic Engineering 690
- Hardware and Architecture 518
- Computer Networks and Communications 224
- Artificial Intelligence 73
- Molecular Biology 28
Countries citing papers authored by Sanghyeon Baeg
This map shows the geographic impact of Sanghyeon Baeg's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Sanghyeon Baeg with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Sanghyeon Baeg more than expected).
Fields of papers citing papers by Sanghyeon Baeg
This network shows the impact of papers produced by Sanghyeon Baeg. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Sanghyeon Baeg. The network helps show where Sanghyeon Baeg may publish in the future.
Co-authorship network of co-authors of Sanghyeon Baeg
This figure shows the co-authorship network connecting the top 25 collaborators of Sanghyeon Baeg. A scholar is included among the top collaborators of Sanghyeon Baeg based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Sanghyeon Baeg. Sanghyeon Baeg is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 0 | |
| 3 | 0 | |
| 4 | 0 | |
| 5 | 3 | |
| 6 | 3 | |
| 7 | 0 | |
| 8 | 19 | |
| 9 | 22 | |
| 10 | 46 | |
| 11 | 5 | |
| 12 | 18 | |
| 13 | 51 | |
| 14 | 2 | |
| 15 | 4 | |
| 16 | Design of Area Efficient High Resolution CMOS Vernier Delay Line Cell | 0 |
| 17 | 2 | |
| 18 | 37 | |
| 19 | 5 | |
| 20 | 9 |
About Sanghyeon Baeg
Sanghyeon Baeg is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Computer Networks and Communications, having authored 71 papers that have together received 845 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (34 papers), Integrated Circuits and Semiconductor Failure Analysis (32 papers) and Semiconductor materials and devices (32 papers). The work is most often cited by research in Hardware and Architecture (518 citations), Electrical and Electronic Engineering (690 citations) and Computer Networks and Communications (224 citations). Sanghyeon Baeg has collaborated with scholars based in South Korea, United States and China. Frequent co-authors include Shi-Jie Wen, Richard Wong, Kyung‐Bae Park, C.K. Lim, Zahid Ullah, KyungBae Park, Pedro Reviriego, Soon Young Lee, Haibin Wang and Li Chen. Their work appears in journals such as IEEE Access, IEEE Transactions on Electron Devices and IEEE Transactions on Computers.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.