Alok Vaid
Impact in
- Surfaces, Coatings and Films top 2%
- Optical Coatings and Gratings
- Electron and X-Ray Spectroscopy Techniques
- Structural Biology top 10%
Papers in
-
- Advancements in Photolithography Techniques 33
- Integrated Circuits and Semiconductor Failure Analysis 23
- Semiconductor materials and devices 6
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- Optical Coatings and Gratings 26
- Electron and X-Ray Spectroscopy Techniques 12
- Co-authors
- Benjamin Bunday (7 shared papers)Matthew Sendelbach (20 shared papers)Cornel Bozdog (15 shared papers)John A. Allgair (6 shared papers)Narender Rana (6 shared papers)Paul K. Isbester (10 shared papers)Erin Mclellan (3 shared papers)Jody Fronheiser (2 shared papers)
- Journals
- Journal of Micro/Nanolithography MEMS and MOEMS (8 papers)Women's studies quarterly (1 paper)SPIE Newsroom (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (38 papers)SPIE eBooks (1 paper)
- Partner nations
- United StatesGermanyIsrael
In The Last Decade
Alok Vaid
55 papers receiving 410 citations
Peers
Comparison fields: 5 of 34
- Surfaces, Coatings and Films 242
- Structural Biology 19
- Electrical and Electronic Engineering 296
- Computational Mechanics 105
- Biomedical Engineering 185
Countries citing papers authored by Alok Vaid
This map shows the geographic impact of Alok Vaid's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Alok Vaid with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Alok Vaid more than expected).
Fields of papers citing papers by Alok Vaid
This network shows the impact of papers produced by Alok Vaid. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Alok Vaid. The network helps show where Alok Vaid may publish in the future.
Co-authors
The 25 scholars most cited alongside Alok Vaid, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 62 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2011 | 53 | |
| 2 | 2018 | 29 | |
| 3 | 2017 | 26 | |
| 4 | 2013 | 25 | |
| 5 | 2018 | 19 | |
| 6 | 2010 | 18 | |
| 7 | 2012 | 17 | |
| 8 | 2011 | 15 | |
| 9 | 2012 | 14 | |
| 10 | 2014 | 14 | |
| 11 | 2013 | 14 | |
| 12 | 2017 | 12 | |
| 13 | 2014 | 10 | |
| 14 | 2015 | 10 | |
| 15 | 2017 | 9 | |
| 16 | 2014 | 9 | |
| 17 | 2016 | 9 | |
| 18 | 2008 | 8 | |
| 19 | 2007 | 8 | |
| 20 | 2015 | 8 |
About Alok Vaid
Alok Vaid is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Computational Mechanics and Mechanical Engineering, having authored 62 papers that have together received 457 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (33 papers), Optical Coatings and Gratings (26 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers), Advanced Surface Polishing Techniques (15 papers), Surface Roughness and Optical Measurements (14 papers), Electron and X-Ray Spectroscopy Techniques (12 papers), Advanced Measurement and Metrology Techniques (10 papers) and Semiconductor materials and devices (6 papers). The work is most often cited by research in Surfaces, Coatings and Films (242 citations), Structural Biology (19 citations), Electrical and Electronic Engineering (296 citations), Computational Mechanics (105 citations) and Biomedical Engineering (185 citations). Alok Vaid has collaborated with scholars based in United States, Germany and Israel. Frequent co-authors include Benjamin Bunday, Matthew Sendelbach, Cornel Bozdog, John A. Allgair, Narender Rana, Paul K. Isbester, Erin Mclellan, Jody Fronheiser, Igor Turovets and Byung-Cheol Kang. Their work appears in journals such as Journal of Micro/Nanolithography MEMS and MOEMS, Women's studies quarterly, SPIE Newsroom, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE and SPIE eBooks.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.