S. Crain
- Hardware and Architecture top 10%
- VLSI and Analog Circuit Testing 6
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- Radiation Effects in Electronics 19
- Integrated Circuits and Semiconductor Failure Analysis 7
- Semiconductor materials and devices 7
- Advanced Memory and Neural Computing 3
- CCD and CMOS Imaging Sensors 2
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- Radiation Detection and Scintillator Technologies 6
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- Particle Detector Development and Performance 2
- Co-authors
- K.B. CrawfordR. KogaJ. GeorgeWilliam R. CrainS. D. LaLumondiereR. KatzS.J. HanselRobert A. Reed
- Journals
- IEEE Transactions on Nuclear Science (5 papers)Optics & Laser Technology (1 paper)Proceedings - IEEE Aerospace Conference (1 paper)
- Partner nations
- United StatesSouth Korea
In The Last Decade
S. Crain
21 papers receiving 225 citations
Peers
Comparison fields: 5 of 21
- Hardware and Architecture 78
- Electrical and Electronic Engineering 235
- Radiation 21
- Nuclear and High Energy Physics 31
- Software 4
Countries citing papers authored by S. Crain
This map shows the geographic impact of S. Crain's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Crain with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Crain more than expected).
Fields of papers citing papers by S. Crain
This network shows the impact of papers produced by S. Crain. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Crain. The network helps show where S. Crain may publish in the future.
Co-authorship network
The 25 scholars most cited alongside S. Crain, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 2 | |
| 2 | 2007 | 17 | |
| 3 | 2006 | 16 | |
| 4 | 2006 | 0 | |
| 5 | 2005 | 3 | |
| 6 | 2005 | 22 | |
| 7 | 2005 | 6 | |
| 8 | 2005 | 4 | |
| 9 | 2004 | 8 | |
| 10 | 2004 | 12 | |
| 11 | 2003 | 2 | |
| 12 | 2002 | 0 | |
| 13 | 2002 | 14 | |
| 14 | 2002 | 1 | |
| 15 | 2002 | 26 | |
| 16 | 2002 | 0 | |
| 17 | 2001 | 16 | |
| 18 | 1999 | 2 | |
| 19 | 1998 | 26 | |
| 20 | 1998 | 32 |
About S. Crain
S. Crain is a scholar working on Hardware and Architecture, Radiation, Electrical and Electronic Engineering, Instrumentation and Surfaces, Coatings and Films, having authored 24 papers that have together received 249 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (19 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Semiconductor materials and devices (7 papers), VLSI and Analog Circuit Testing (6 papers), Radiation Detection and Scintillator Technologies (6 papers), Advanced Memory and Neural Computing (3 papers), CCD and CMOS Imaging Sensors (2 papers) and Particle Detector Development and Performance (2 papers). The work is most often cited by research in Hardware and Architecture (78 citations), Electrical and Electronic Engineering (235 citations), Radiation (21 citations), Nuclear and High Energy Physics (31 citations) and Software (4 citations). S. Crain has collaborated with scholars based in United States and South Korea. Frequent co-authors include K.B. Crawford, R. Koga, R. Koga, J. George, William R. Crain, S. D. LaLumondiere, R. Katz, S.J. Hansel, Robert A. Reed and Kenneth A. LaBel. Their work appears in journals such as IEEE Transactions on Nuclear Science, Optics & Laser Technology, Proceedings - IEEE Aerospace Conference and NASA STI Repository (National Aeronautics and Space Administration).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.