N.F. Haddad

1.1k total citations
33 papers, 844 citations indexed

About

N.F. Haddad is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Computer Networks and Communications. According to data from OpenAlex, N.F. Haddad has authored 33 papers receiving a total of 844 indexed citations (citations by other indexed papers that have themselves been cited), including 33 papers in Electrical and Electronic Engineering, 7 papers in Hardware and Architecture and 2 papers in Computer Networks and Communications. Recurrent topics in N.F. Haddad's work include Radiation Effects in Electronics (23 papers), Semiconductor materials and devices (21 papers) and Integrated Circuits and Semiconductor Failure Analysis (17 papers). N.F. Haddad is often cited by papers focused on Radiation Effects in Electronics (23 papers), Semiconductor materials and devices (21 papers) and Integrated Circuits and Semiconductor Failure Analysis (17 papers). N.F. Haddad collaborates with scholars based in United States and Sweden. N.F. Haddad's co-authors include Kevin M. Warren, Dale McMorrow, L. W. Massengill, Dennis R. Ball, Robert A. Reed, S. Doyle, Ronald D. Brown, Joseph S. Melinger, Brian D. Olson and Ronald D. Schrimpf and has published in prestigious journals such as Journal of Non-Crystalline Solids, Solid-State Electronics and IEEE Transactions on Nuclear Science.

In The Last Decade

N.F. Haddad

30 papers receiving 794 citations

Peers

Countries citing papers authored by N.F. Haddad

Since Specialization

Citations

This map shows the geographic impact of N.F. Haddad's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N.F. Haddad with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N.F. Haddad more than expected).

Fields of papers citing papers by N.F. Haddad

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by N.F. Haddad. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N.F. Haddad. The network helps show where N.F. Haddad may publish in the future.

Co-authorship network of co-authors of N.F. Haddad

This figure shows the co-authorship network connecting the top 25 collaborators of N.F. Haddad. A scholar is included among the top collaborators of N.F. Haddad based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N.F. Haddad. N.F. Haddad is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Incremental Enhancement of SEU Hardened 90 nm CMOS Memory Cell 2011 ·IEEE Transactions on Nuclear Science ·N.F. Haddad, (unknown), R.K. Lawrence, Bin Li, John Rodgers, (unknown), Kevin M. Warren, Robert A. Weller, Marcus H. Mendenhall, Robert A. Reed	30
2	Second generation (200MHz) RAD750 microprocessor radiation evaluation 2011 ·N.F. Haddad, Ronald D. Brown, (unknown), (unknown), R.K. Lawrence, (unknown), John Rodgers	18
3	Soft Error Sensitivities in 90 nm Bulk CMOS SRAMs 2009 ·R.K. Lawrence, (unknown), N.F. Haddad, Robert A. Reed, (unknown)	37
4	The Path and Challenges to 90-nm Radiation-Hardened Technology 2009 ·IEEE Transactions on Nuclear Science ·N.F. Haddad, (unknown), S. Doyle, (unknown), R.K. Lawrence, David Lawson, (unknown), (unknown)	7
5	Design of random doping fluctuation resistant structures of semiconductor devices 2008 ·Journal of Computational Electronics ·(unknown), N.F. Haddad, Petru Andrei	2
6	The path and challenges to 90nm radiation hardened technology 2008 ·N.F. Haddad, (unknown), S. Doyle, Andrew Kelly, R.K. Lawrence, David Lawson, (unknown), (unknown)	1
7	Proton and gamma radiation effects in a new first-generation SiGe HBT technology 2006 ·Solid-State Electronics ·B.M. Haugerud, (unknown), Jonathan P. Comeau, Akil K. Sutton, A. P. Gnana Prakash, John D. Cressler, Paul W. Marshall, Cheryl J. Marshall, Ray Ladbury, (unknown), (unknown), (unknown), (unknown), R.K. Lawrence, N.F. Haddad	25
8	Effect of Total Dose Radiation on Device Self Latch-Up 2005 ·F.T. Brady, N.F. Haddad, (unknown)	5
9	The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM 2005 ·IEEE Transactions on Nuclear Science ·Kevin M. Warren, Robert A. Weller, Marcus H. Mendenhall, Robert A. Reed, Dennis R. Ball, (unknown), Brian D. Olson, Michael L. Alles, L. W. Massengill, Ronald D. Schrimpf, N.F. Haddad, S. Doyle, Dale McMorrow, Joseph S. Melinger, William T. Lotshaw	133
10	SEU Sensitivity of an Advanced 0.13¿m SOI Microprocessor 2005 ·N.F. Haddad, (unknown), (unknown), (unknown), (unknown)	1
11	Simulating Nuclear Events in a TCAD Model of a High-Density SEU Hardened SRAM Technology 2005 ·Dennis R. Ball, Ronald D. Schrimpf, N.F. Haddad, Kevin M. Warren, Robert A. Weller, Robert A. Reed, (unknown), Jonathan A. Pellish, Marcus H. Mendenhall, (unknown), L. W. Massengill	3
12	Temperature Sensitivity of Devices and Circuits Fabricated in Fully Depleted Accumulation Mode Cmos/sol 2005 ·F.T. Brady, N.F. Haddad, (unknown), (unknown), (unknown)	0
13	Simultaneous single event charge sharing and parasitic bipolar conduction in a highly-scaled SRAM design 2005 ·IEEE Transactions on Nuclear Science ·Brian D. Olson, Dennis R. Ball, Kevin M. Warren, L. W. Massengill, N.F. Haddad, S. Doyle, Dale McMorrow	129
14	Radiation hardened memories for space applications 2002 ·N.F. Haddad, Ronald D. Brown, S. Doyle, Steve Wright	7
15	Application of a pulsed laser for evaluation and optimization of SEU-hard designs [CMOS] 2000 ·IEEE Transactions on Nuclear Science ·Dale McMorrow, Joseph S. Melinger, S. Büchner, T. Scott, Ronald D. Brown, N.F. Haddad	122
16	Effects of iron contamination in silicon on thin oxide breakdown and reliability characteristics 1995 ·Journal of Non-Crystalline Solids ·Worth B. Henley, L. Jastrzȩbski, N.F. Haddad	10
17	Fully-depleted submicron SOI for radiation hardened applications 1994 ·IEEE Transactions on Nuclear Science ·F.T. Brady, Thomas R. Scott, Ronald D. Brown, (unknown), N.F. Haddad	22
18	Monitoring Iron Contamination in Silicon by Surface Photovoltage and Correlation to Gate Oxide Integrity 1993 ·MRS Proceedings ·Worth B. Henley, L. Jastrzȩbski, N.F. Haddad	4
19	Considerations for the development of radiation resistant devices and VLSI circuits 1990 ·Journal of Electronic Materials ·N.F. Haddad	3
20	Cost-effective numerical simulation of SEU 1988 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), W. A. Kolasinski, N.F. Haddad, (unknown), (unknown), (unknown)	20

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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