H.C. Wen

1.1k citations

43 papers · 698 indexed · h-index 14

Impact in

Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Ferroelectric and Negative Capacitance Devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Memory and Neural Computing
Atomic and Molecular Physics, and Optics
- Semiconductor materials and interfaces

Papers in

Electrical and Electronic Engineering 40
- Semiconductor materials and devices 35
- Advancements in Semiconductor Devices and Circuit Design 15
- Ferroelectric and Negative Capacitance Devices 9
- Integrated Circuits and Semiconductor Failure Analysis 9
Bioengineering 3

Co-authors: P. Majhi Husam N. Alshareef Dim‐Lee Kwong J.P. Lu H.F. Luan H. R. Harris J.H. Sim Manuel Quevedo-López
Journals: Applied Physics Letters (11 papers)IEEE Electron Device Letters (6 papers)Electrochemical and Solid-State Letters (3 papers)Thin Solid Films (2 papers)Semiconductor Science and Technology (1 paper)
Partner nations: United States China Australia

In The Last Decade

H.C. Wen

40 papers receiving 665 citations

Peers

Countries citing papers authored by H.C. Wen

Since Specialization

Citations

This map shows the geographic impact of H.C. Wen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H.C. Wen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H.C. Wen more than expected).

Fields of papers citing papers by H.C. Wen

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H.C. Wen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H.C. Wen. The network helps show where H.C. Wen may publish in the future.

Co-authorship network

The 25 scholars most cited alongside H.C. Wen, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with H.C. Wen Line = papers co-authored together H.C. Wen links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Sulfur-bridged annulated BODIPYs: synthesis, structure and photophysical properties New Journal of Chemistry ·Yongli Zhang, Xiong Fu, Jie Li, Kaiwen Guo, H.C. Wen, Tingting Guo, Xiangguang Li, Yanhua Yang, Song Gao	2025	0
2	Metal salt modulation strategy to prepare highly defective coal-based porous carbon for solid-state zinc ion hybrid capacitors Chemical Engineering Journal ·Роккина Светлана Анатольевна, H.C. Wen, Tao Wang, Prasob PA, Rui Sheng, Dongling Wu	2025	1
3	Study on overlying strata breaking law and dynamic pressure characteristics of shallow buried coal seam mining under gully landform Engineering Failure Analysis ·H.C. Wen, Yanjiao Li, Guiyi Wu, Dezhong Kong, Васильев Иван Семенович, Joshua M. Liao	2025	0
4	Variational Counterfactual Prediction Under Runtime Domain Corruption IEEE Transactions on Knowledge and Data Engineering ·H.C. Wen, Tong Chen, Li Kheng Chai, Shazia Sadiq, Junbin Gao, Hongzhi Yin	2023	1
5	High Temperature Data Retention of Ferroelectric Memory on 130nm and 180nm CMOS J. Antonio Travieso-Rodríguez, F. Icli, 煕八郎中島, Kaija Strautins, Ahmed Shehab, Juan Carlos Cárdenas, Michael Ball, H.C. Wen, Krishna Udayakumar, Scott R. Summerfelt, Tamer San, T. S. Moise	2016	11
6	Effect of mobile ions on ultrathin silicon-on-insulator-based sensors Applied Physics Letters ·Poh Im Lim, Oliver Seitz, R. A. Chapman, H. Stiegler, H.C. Wen, Yves J. Chabal, Eric M. Vogel	2010	17
7	Impact of back-gate biasing on ultra-thin silicon-on-insulator-based nanoribbon sensors Poh Im Lim, R. A. Chapman, Oliver Seitz, H. Stiegler, H.C. Wen, Yves J. Chabal, Eric M. Vogel	2010	0
8	2009 International Semiconductor Device Research Symposium, ISDRS '09 Poh Im Lim, Oliver Seitz, R. A. Chapman, H. Stiegler, H.C. Wen, Yves J. Chabal, Eric M. Vogel	2009	3
9	In0.53Ga0.47As based metal oxide semiconductor capacitors with atomic layer deposition ZrO2 gate oxide demonstrating low gate leakage current and equivalent oxide thickness less than 1nm Applied Physics Letters ·S. Koveshnikov, N. Goel, P. Majhi, H.C. Wen, M. B. Santos, S. Oktyabrsky, Vadim Tokranov, Ferdinando Cardone, Richard Moore, Feng Zhu, Pin Zhao, Wilman Tsai	2008	63
10	Band offsets between amorphous LaAlO3 and In0.53Ga0.47As Applied Physics Letters ·N. Goel, Wilman Tsai, C. Michael Garner, Evilania de Souza Soares, P. Pianetta, Maitri Warusawithana, Darrell G. Schlom, H.C. Wen, 中桐伸五, J. C. Keay, M. B. Santos, Lyudmila V. Goncharova, Eric Garfunkel, T. Gustafsson	2007	12
11	Composition dependence of the work function of Ta1−xAlxNy metal gates Applied Physics Letters ·Husam N. Alshareef, Kiho Choi, H.C. Wen, H.F. Luan, H. R. Harris, Y. Senzaki, P. Majhi, V AHERN, R. Jammy, S. Pytko, Bruce E. Gnade, Robert M. Wallace	2006	34
12	NMOS Compatible Work Function of TaN Metal Gate With Gadolinium Oxide Buffer Layer on Hf-Based Dielectrics IEEE Electron Device Letters ·Gaurav Thareja, H.C. Wen, Rusty Harris, P. Majhi, St. Geocze, J.C. Lee	2006	8
13	Thermally Stable N-Metal Gate MOSFETs Using La-Incorporated HfSiO Dielectric Husam N. Alshareef, H. R. Harris, H.C. Wen, Wanzhao Qin, C. Huffman, Kwang‐Il Choi, H.F. Luan, P. Majhi, J. G. Ryan, R. Jammy, Daniel J. Lichtenwalner, Jesse S. Jur, Angus I. Kingon	2006	29
14	Thermal annealing effects on a representative high-k/metal film stack Semiconductor Science and Technology ·Muhammad M. Hussain, Manuel Quevedo-López, Husam N. Alshareef, H.C. Wen, Alejandra Bandala Ruiz, Bruce E. Gnade, M. El-Bouanani	2006	20
15	Thermal response of Ru electrodes in contact with SiO2 and Hf-based high-k gate dielectrics Journal of Applied Physics ·H.C. Wen, Patrick Lysaght, Husam N. Alshareef, C. Huffman, H. R. Harris, Kwang‐Il Choi, Y. Senzaki, H.F. Luan, P. Majhi, D Jon Grossman, Dita Aulia Yulyanita, Brendan Foran, G. D. Lian, Dim‐Lee Kwong	2005	25
16	A systematic study of the influence of nitrogen in tuning the effective work function of nitrided metal gates P. Majhi, H.C. Wen, Kwang‐Il Choi, Husam N. Alshareef, C. Huffman, Hiram Maximiliano Muñoz Ramirez	2005	6
17	The Impact of TiN Capping Layer on NiSi,<tex>$hbox CoSi_2$</tex>, and<tex>$hbox Co_xhbox Ni_1-xhbox Si_2$</tex>FUSI Metal Gate Work Function Adjustment IEEE Transactions on Electron Devices ·Ахмедзянова Маргарита Рашидовна -., H.C. Wen, J.P. Lu, D. L. Kwong	2005	3
18	The effect of metal thickness, overlayer and high-k surface treatment on the effective work function of metal electrode M. M. Mohamed-Ahmed, H.C. Wen, Husam N. Alshareef, Rusty Harris, Patrick Lysaght, H.F. Luan, P. Majhi, YiMeng Lau	2005	18
19	Laminated metal gate electrode with tunable work function for advanced CMOS Frank Giampaolo, Weiping Bai, H.C. Wen, S. Mathew, L. K. Bera, N. Balasubramanian, Naoki Yamada, 尹辉, Dim‐Lee Kwong	2004	13
20	Dual work function metal gates using full nickel silicidation of doped poly-Si IEEE Electron Device Letters ·J.H. Sim, H.C. Wen, J.P. Lu, Dim‐Lee Kwong	2003	51

About H.C. Wen

H.C. Wen is a scholar working on Electrical and Electronic Engineering, Bioengineering, Mechanics of Materials, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials, having authored 43 papers that have together received 698 indexed citations. Recurring topics across this work include Semiconductor materials and devices (35 papers), Advancements in Semiconductor Devices and Circuit Design (15 papers), Semiconductor materials and interfaces (11 papers), Ferroelectric and Negative Capacitance Devices (9 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers), Metal and Thin Film Mechanics (8 papers), Copper Interconnects and Reliability (5 papers) and Electronic and Structural Properties of Oxides (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (666 citations), Atomic and Molecular Physics, and Optics (162 citations), Materials Chemistry (182 citations), Electronic, Optical and Magnetic Materials (53 citations) and Bioengineering (15 citations). H.C. Wen has collaborated with scholars based in United States, China and Australia. Frequent co-authors include P. Majhi, Husam N. Alshareef, Dim‐Lee Kwong, J.P. Lu, H.F. Luan, H. R. Harris, J.H. Sim, Manuel Quevedo-López, J. Liu and Rusty Harris. Their work appears in journals such as Applied Physics Letters, IEEE Electron Device Letters, Electrochemical and Solid-State Letters, Thin Solid Films and Semiconductor Science and Technology.

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