O. Bonnaud

779 total citations
88 papers, 542 citations indexed

About

O. Bonnaud is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, O. Bonnaud has authored 88 papers receiving a total of 542 indexed citations (citations by other indexed papers that have themselves been cited), including 83 papers in Electrical and Electronic Engineering, 38 papers in Materials Chemistry and 18 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in O. Bonnaud's work include Thin-Film Transistor Technologies (56 papers), Semiconductor materials and devices (34 papers) and Silicon Nanostructures and Photoluminescence (32 papers). O. Bonnaud is often cited by papers focused on Thin-Film Transistor Technologies (56 papers), Semiconductor materials and devices (34 papers) and Silicon Nanostructures and Photoluminescence (32 papers). O. Bonnaud collaborates with scholars based in France, Algeria and Germany. O. Bonnaud's co-authors include F. Raoult, Laurent Pichon, Tayeb Mohammed‐Brahim, D. Briand, Anne‐Claire Salaün, Nilton Itiro Morimoto, J. Pinel, Régis Rogel, M'Hamed Drissi and Hervé Lhermite and has published in prestigious journals such as Applied Physics Letters, IEEE Transactions on Electron Devices and Thin Solid Films.

In The Last Decade

O. Bonnaud

81 papers receiving 513 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
O. Bonnaud France 14 496 230 100 69 38 88 542
Sukmin Chung South Korea 9 257 0.5× 190 0.8× 79 0.8× 99 1.4× 18 0.5× 28 388
Yean-Kuen Fang Taiwan 13 474 1.0× 223 1.0× 85 0.8× 63 0.9× 13 0.3× 79 569
P.J. George India 11 280 0.6× 202 0.9× 59 0.6× 70 1.0× 11 0.3× 30 343
K.N. Tripathi India 11 223 0.4× 113 0.5× 91 0.9× 72 1.0× 95 2.5× 65 396
Yoshihiro Todokoro Japan 11 451 0.9× 209 0.9× 76 0.8× 130 1.9× 10 0.3× 39 493
Chenghua Sui China 12 176 0.4× 136 0.6× 148 1.5× 67 1.0× 18 0.5× 38 350
Martin Steglich Germany 11 235 0.5× 197 0.9× 174 1.7× 51 0.7× 26 0.7× 16 354
G.L. Schnable United States 13 380 0.8× 124 0.5× 56 0.6× 103 1.5× 17 0.4× 55 483
P. Y. Hung United States 10 519 1.0× 228 1.0× 58 0.6× 76 1.1× 15 0.4× 29 576
John W. Murphy United States 13 297 0.6× 158 0.7× 35 0.3× 35 0.5× 20 0.5× 21 477

Countries citing papers authored by O. Bonnaud

Since Specialization
Citations

This map shows the geographic impact of O. Bonnaud's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O. Bonnaud with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O. Bonnaud more than expected).

Fields of papers citing papers by O. Bonnaud

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by O. Bonnaud. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O. Bonnaud. The network helps show where O. Bonnaud may publish in the future.

Co-authorship network of co-authors of O. Bonnaud

This figure shows the co-authorship network connecting the top 25 collaborators of O. Bonnaud. A scholar is included among the top collaborators of O. Bonnaud based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with O. Bonnaud. O. Bonnaud is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Bonnaud, O.. (2019). The Challenges of Microelectronics for the Future Digital Society: The Roles of Thin Film Technologies and of the Higher Education. Journal of Materials Science and Chemical Engineering. 7(12). 47–56. 1 indexed citations
2.
Mahfoz-Kotb, H., Anne‐Claire Salaün, Tayeb Mohammed‐Brahim, Nathalie Coulon, & O. Bonnaud. (2004). Air-gap polysilicon thin film transistors on glass substrates. Sensors and Actuators A Physical. 113(3). 344–349. 5 indexed citations
3.
Rogel, Régis, et al.. (2003). Influence of precursors gases on LPCVD TFT's characteristics. Thin Solid Films. 427(1-2). 108–112. 5 indexed citations
4.
Mahfoz-Kotb, H., et al.. (2003). Air-gap polycrystalline silicon thin-film transistors for fully integrated sensors. IEEE Electron Device Letters. 24(3). 165–167. 18 indexed citations
5.
Bonnaud, O., et al.. (2001). Polycrystalline Semiconductors VI. Trans Tech Publications Ltd. eBooks. 6 indexed citations
6.
Mercha, A., et al.. (2001). Grain boundary trap passivation in polysilicon thin film transistor investigated by low frequency noise. Thin Solid Films. 383(1-2). 303–306. 12 indexed citations
7.
Rogel, Régis, et al.. (2000). High quality unhydrogenated low-pressure chemical vapor deposited polycrystalline silicon. Journal of Non-Crystalline Solids. 266-269. 141–145. 6 indexed citations
8.
Tala‐Ighil, B., et al.. (1999). Leakage Current of Unhydrogenated Solid Phase Crystallized Silicon Thin Film Transistors. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 67-68. 541–546. 1 indexed citations
9.
Bonnaud, O.. (1999). Polycrystalline Silicon Thin Film Transistors: State of the Art and Improvement of Electrical Characteristics. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 67-68. 529–540. 2 indexed citations
10.
Bonnaud, O.. (1998). Polycristalline Silicon Thin Film Transistors for Flat Panel Display Applications. European Solid-State Device Research Conference. 42–51.
11.
Briand, D., et al.. (1997). Effect of the starting amorphous structure on the solid-phase crystallization of silicon. Philosophical Magazine B. 76(2). 193–212. 13 indexed citations
12.
Bonnaud, O., et al.. (1997). Characterization of phosphorus oxinitride (PON) gate insulators for InP metal-insulator-semiconductor devices. Thin Solid Films. 310(1-2). 1–7. 6 indexed citations
13.
Pichon, Laurent, et al.. (1997). Low temperature (≦600°C) unhydrogenated in-situ doped polysilicon thin film transistors: Towards a technology for flat panel displays. Thin Solid Films. 296(1-2). 133–136. 14 indexed citations
14.
Pichon, Laurent, et al.. (1995). High Performances of Low Temperature (≤ 600°C) Unhydrogenated Polysilicon Thin Film Transistors. MRS Proceedings. 403. 2 indexed citations
15.
Strunk, H. P., et al.. (1994). Polycrystalline Semiconductors III. Trans Tech Publications Ltd. eBooks. 11 indexed citations
16.
Benamara, Z., et al.. (1994). Influence of the Polysilicon Film Structure on the Capacitance Voltage Characteristics of Thin Film Transistors. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 37-38. 589–594. 2 indexed citations
17.
Bonnaud, O., et al.. (1994). In-situ phosphorous-doped VLPCVD polysilicon layers for polysilicon thin-film transistors. IEE Proceedings - Circuits Devices and Systems. 141(1). 19–19. 1 indexed citations
18.
Bonnaud, O., et al.. (1989). Couches minces d'oxynitrure de phosphore. Application aux structures MIS sur InP. Revue de Physique Appliquée. 24(5). 545–551. 17 indexed citations
19.
Bonnaud, O. & Pierre Viktorovitch. (1985). Modelling of a new high current gain bipolar transistor with n-doped hydrogenated silicon emitter. IEE Proceedings I Solid State and Electron Devices. 132(1). 17–17. 3 indexed citations
20.
Bonnaud, O., et al.. (1978). Analysis of weak avalanche multiplication in collector junctions. Avalanche injection measurements on standard transistors like devices. Revue de Physique Appliquée. 13(12). 673–677. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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