Ming‐Hsien Lin
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials top 10%
- Atomic and Molecular Physics, and Optics
- Materials Chemistry
- Mechanics of Materials
- Co-authors
- A. S. OatesS. KouChung-Chi HsiehSindo KouChang-Sheng LinKe‐Horng ChenYing-Hsi LinRichard Wong
- Topics
- Copper Interconnects and Reliability (18 papers)Semiconductor materials and devices (16 papers)Electronic Packaging and Soldering Technologies (15 papers)
- Cited by
- Electronic, Optical and Magnetic MaterialsElectrical and Electronic EngineeringHardware and Architecture
- Journals
- IEEE Transactions on Electron DevicesJournal of Crystal GrowthComputers & Industrial Engineering
- Partner nations
- TaiwanUnited States
In The Last Decade
Ming‐Hsien Lin
35 papers receiving 349 citations
Peers
Comparison fields: 5 of 34
- Electrical and Electronic Engineering 307
- Electronic, Optical and Magnetic Materials 200
- Atomic and Molecular Physics, and Optics 54
- Materials Chemistry 48
- Mechanics of Materials 28
Countries citing papers authored by Ming‐Hsien Lin
This map shows the geographic impact of Ming‐Hsien Lin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ming‐Hsien Lin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ming‐Hsien Lin more than expected).
Fields of papers citing papers by Ming‐Hsien Lin
This network shows the impact of papers produced by Ming‐Hsien Lin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ming‐Hsien Lin. The network helps show where Ming‐Hsien Lin may publish in the future.
Co-authorship network of co-authors of Ming‐Hsien Lin
This figure shows the co-authorship network connecting the top 25 collaborators of Ming‐Hsien Lin. A scholar is included among the top collaborators of Ming‐Hsien Lin based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ming‐Hsien Lin. Ming‐Hsien Lin is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 5 | |
| 2 | 7 | |
| 3 | 6 | |
| 4 | 1 | |
| 5 | 29 | |
| 6 | 1 | |
| 7 | 9 | |
| 8 | 9 | |
| 9 | 3 | |
| 10 | 13 | |
| 11 | 24 | |
| 12 | 17 | |
| 13 | 12 | |
| 14 | 6 | |
| 15 | 2 | |
| 16 | 37 | |
| 17 | 9 | |
| 18 | 18 | |
| 19 | 4 | |
| 20 | 3 |
About Ming‐Hsien Lin
Ming‐Hsien Lin is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering and Statistics, Probability and Uncertainty, having authored 35 papers that have together received 369 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (18 papers), Semiconductor materials and devices (16 papers) and Electronic Packaging and Soldering Technologies (15 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (200 citations), Electrical and Electronic Engineering (307 citations) and Hardware and Architecture (12 citations). Ming‐Hsien Lin has collaborated with scholars based in Taiwan and United States. Frequent co-authors include A. S. Oates, S. Kou, Chung-Chi Hsieh, Sindo Kou, Chang-Sheng Lin, Ke‐Horng Chen, Ying-Hsi Lin, Richard Wong, Seung‐Ryul Moon and Yu-Tao Yang. Their work appears in journals such as IEEE Transactions on Electron Devices, Journal of Crystal Growth and Computers & Industrial Engineering.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.