Mark Neisser

1.6k citations
89 papers · 1.2k indexed · h-index 16
Topics
Advancements in Photolithography Techniques (74 papers)Integrated Circuits and Semiconductor Failure Analysis (30 papers)Electron and X-Ray Spectroscopy Techniques (28 papers)
Journals
Journal of the American Chemical SocietySHILAP Revista de lepidopterologíaScience Advances

In The Last Decade

Mark Neisser

84 papers receiving 1.1k citations

Peers

Mark Neisser
Comparison fields: 5 of 73
  • Electrical and Electronic Engineering 923
  • Biomedical Engineering 422
  • Surfaces, Coatings and Films 421
  • Materials Chemistry 148
  • Atomic and Molecular Physics, and Optics 110
Replace Gian F. Lorusso with:
Gian F. Lorusso Belgium
C. Beitia France
R. L. Kostelak United States
Mitsuru Satô Japan
S. Babin United States
Kenji Kurihara Japan
Hideo Namatsu Japan
Elmar Platzgummer Austria
Hans Mertens Belgium
E. Kratschmer United States
Mark Neisser relative to Gian F. Lorusso Belgium Gian F. Lorusso's profile →
Citations per field
00.5×3.8×
Gian F. Lorusso · 1×
Citations per year

Countries citing papers authored by Mark Neisser

Since Specialization
Citations

This map shows the geographic impact of Mark Neisser's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mark Neisser with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mark Neisser more than expected).

Fields of papers citing papers by Mark Neisser

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Mark Neisser. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mark Neisser. The network helps show where Mark Neisser may publish in the future.

Co-authorship network of co-authors of Mark Neisser

This figure shows the co-authorship network connecting the top 25 collaborators of Mark Neisser. A scholar is included among the top collaborators of Mark Neisser based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Mark Neisser. Mark Neisser is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 323
2 6
3 6
4 8
5 46
6 15
7 5
8 19
9 4
10 3
11 16
12 6
13 3
14 3
15 7
16 2
17 1
18 29
19 3
20 25

About Mark Neisser

Mark Neisser is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Structural Biology, having authored 89 papers that have together received 1.2k indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (74 papers), Integrated Circuits and Semiconductor Failure Analysis (30 papers) and Electron and X-Ray Spectroscopy Techniques (28 papers). The work is most often cited by research in Surfaces, Coatings and Films (421 citations), Electrical and Electronic Engineering (923 citations) and Structural Biology (18 citations). Mark Neisser has collaborated with scholars based in United States, Switzerland and China. Frequent co-authors include Stefan Wurm, Ndubuisi G. Orji, András Vládar, Brian M. Barnes, C. Beitia, Robert L. Brainard, R. Joseph Kline, Umberto Celano, Mustafa Badaroglu and B Bunday. Their work appears in journals such as Journal of the American Chemical Society, SHILAP Revista de lepidopterología and Science Advances.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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