Geng Han
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 9
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- Advancements in Photolithography Techniques 18
- Integrated Circuits and Semiconductor Failure Analysis 4
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- VLSI and Analog Circuit Testing 3
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- Industrial Vision Systems and Defect Detection 4
- Manufacturing Process and Optimization 2
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- Advanced Surface Polishing Techniques 3
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- Surface and Thin Film Phenomena 3
- Co-authors
- F. CerrinaYuling MaKaterina MoloniScott MansfieldJaeseok KimLars W. LiebmannSungho KangSung Oh Hwang
- Cited by
- Surfaces, Coatings and FilmsNuclear Energy and EngineeringElectrical and Electronic Engineering
- Journals
- IEEE Signal Processing Letters (1 paper)Journal of Applied Crystallography (1 paper)RSC Advances (1 paper)
- Partner nations
- United StatesAustraliaHungary
In The Last Decade
Geng Han
23 papers receiving 265 citations
Peers
Comparison fields: 5 of 48
- Surfaces, Coatings and Films 91
- Nuclear Energy and Engineering 2
- Electrical and Electronic Engineering 228
- Hardware and Architecture 24
- Signal Processing 24
Countries citing papers authored by Geng Han
This map shows the geographic impact of Geng Han's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Geng Han with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Geng Han more than expected).
Fields of papers citing papers by Geng Han
This network shows the impact of papers produced by Geng Han. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Geng Han. The network helps show where Geng Han may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Geng Han, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2022 | 12 | |
| 2 | 2018 | 1 | |
| 3 | 2018 | 2 | |
| 4 | 2018 | 1 | |
| 5 | 2017 | 1 | |
| 6 | 2014 | 15 | |
| 7 | 2010 | 0 | |
| 8 | 2007 | 4 | |
| 9 | 2007 | 4 | |
| 10 | 2007 | 11 | |
| 11 | 2006 | 5 | |
| 12 | 2006 | 3 | |
| 13 | 2006 | 27 | |
| 14 | 2006 | 5 | |
| 15 | 2004 | 31 | |
| 16 | 2003 | 7 | |
| 17 | 2002 | 21 | |
| 18 | 2001 | 12 | |
| 19 | 2000 | 13 | |
| 20 | 1999 | 14 |
About Geng Han
Geng Han is a scholar working on Surfaces, Coatings and Films, Industrial and Manufacturing Engineering, Hardware and Architecture, Electrical and Electronic Engineering and Radiation, having authored 24 papers that have together received 288 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (18 papers), Electron and X-Ray Spectroscopy Techniques (9 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Industrial Vision Systems and Defect Detection (4 papers), Advanced Surface Polishing Techniques (3 papers), VLSI and Analog Circuit Testing (3 papers), Surface and Thin Film Phenomena (3 papers) and Manufacturing Process and Optimization (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (91 citations), Nuclear Energy and Engineering (2 citations), Electrical and Electronic Engineering (228 citations), Hardware and Architecture (24 citations) and Signal Processing (24 citations). Geng Han has collaborated with scholars based in United States, Australia and Hungary. Frequent co-authors include F. Cerrina, Yuling Ma, Katerina Moloni, Scott Mansfield, Jaeseok Kim, Lars W. Liebmann, Sungho Kang, Sung Oh Hwang, R. Tsai and Juan R. Maldonado. Their work appears in journals such as IEEE Signal Processing Letters, Journal of Applied Crystallography, RSC Advances, Metrika and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.