James Word
Impact in
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques
-
- Industrial Vision Systems and Defect Detection
Papers in
-
- Advancements in Photolithography Techniques 49
- Integrated Circuits and Semiconductor Failure Analysis 21
- Photonic and Optical Devices 5
- Semiconductor Lasers and Optical Devices 5
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- Advanced Surface Polishing Techniques 11
- Nanofabrication and Lithography Techniques 6
- Co-authors
- Yuri Granik (5 shared papers)J. Andres Torres (8 shared papers)Yuansheng Ma (8 shared papers)Germain Fenger (9 shared papers)John L. Sturtevant (5 shared papers)Alexander Tritchkov (9 shared papers)Joost Bekaert (3 shared papers)Julien Ryckaert (1 shared paper)
- Journals
- Journal of Micro/Nanolithography MEMS and MOEMS (3 papers)IEEE Transactions on Components Packaging and Manufacturing Technology Part B (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (41 papers)NASA Technical Reports Server (NASA) (1 paper)
- Partner nations
- United StatesBelgiumHungary
In The Last Decade
James Word
55 papers receiving 305 citations
Peers
Comparison fields: 5 of 28
- Surfaces, Coatings and Films 55
- Industrial and Manufacturing Engineering 66
- Electrical and Electronic Engineering 289
- Media Technology 27
- Hardware and Architecture 19
Countries citing papers authored by James Word
This map shows the geographic impact of James Word's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by James Word with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites James Word more than expected).
Fields of papers citing papers by James Word
This network shows the impact of papers produced by James Word. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by James Word. The network helps show where James Word may publish in the future.
Co-authors
The 25 scholars most cited alongside James Word, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 61 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2014 | 43 | |
| 2 | 2005 | 18 | |
| 3 | 1997 | 15 | |
| 4 | 2018 | 14 | |
| 5 | 2005 | 13 | |
| 6 | 2019 | 11 | |
| 7 | 2011 | 11 | |
| 8 | 2004 | 11 | |
| 9 | 2013 | 9 | |
| 10 | 2002 | 9 | |
| 11 | 2015 | 9 | |
| 12 | 2011 | 9 | |
| 13 | 2009 | 9 | |
| 14 | 2014 | 8 | |
| 15 | 2015 | 8 | |
| 16 | 2006 | 6 | |
| 17 | 2004 | 6 | |
| 18 | 2013 | 6 | |
| 19 | 2018 | 5 | |
| 20 | 2015 | 5 |
About James Word
James Word is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Surfaces, Coatings and Films, Industrial and Manufacturing Engineering and Hardware and Architecture, having authored 61 papers that have together received 314 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (49 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers), Electron and X-Ray Spectroscopy Techniques (18 papers), Industrial Vision Systems and Defect Detection (13 papers), Advanced Surface Polishing Techniques (11 papers), Nanofabrication and Lithography Techniques (6 papers), Photonic and Optical Devices (5 papers) and Semiconductor Lasers and Optical Devices (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (55 citations), Industrial and Manufacturing Engineering (66 citations), Electrical and Electronic Engineering (289 citations), Media Technology (27 citations) and Hardware and Architecture (19 citations). James Word has collaborated with scholars based in United States, Belgium and Hungary. Frequent co-authors include Yuri Granik, J. Andres Torres, Yuansheng Ma, Germain Fenger, John L. Sturtevant, Alexander Tritchkov, Joost Bekaert, Julien Ryckaert, M.A. Habib and Fan Jiang. Their work appears in journals such as Journal of Micro/Nanolithography MEMS and MOEMS, IEEE Transactions on Components Packaging and Manufacturing Technology Part B, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE and NASA Technical Reports Server (NASA).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.