Edita Tejnil
- Electrical and Electronic Engineering
- Computer Vision and Pattern Recognition top 10%
- Surfaces, Coatings and Films top 5%
- Radiation top 5%
- Atomic and Molecular Physics, and Optics
- Co-authors
- Jeffrey BokorKenneth A. GoldbergH. MedeckiAlan R. StiversEric M. GulliksonDavid AttwoodTed LiangJohn L. Sturtevant
- Topics
- Advancements in Photolithography Techniques (42 papers)Electron and X-Ray Spectroscopy Techniques (15 papers)Integrated Circuits and Semiconductor Failure Analysis (12 papers)
- Partner nations
- United StatesNetherlandsBelgium
In The Last Decade
Edita Tejnil
43 papers receiving 396 citations
Peers
Comparison fields: 5 of 43
- Electrical and Electronic Engineering 300
- Computer Vision and Pattern Recognition 140
- Surfaces, Coatings and Films 125
- Radiation 105
- Atomic and Molecular Physics, and Optics 100
Countries citing papers authored by Edita Tejnil
This map shows the geographic impact of Edita Tejnil's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Edita Tejnil with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Edita Tejnil more than expected).
Fields of papers citing papers by Edita Tejnil
This network shows the impact of papers produced by Edita Tejnil. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Edita Tejnil. The network helps show where Edita Tejnil may publish in the future.
Co-authorship network of co-authors of Edita Tejnil
This figure shows the co-authorship network connecting the top 25 collaborators of Edita Tejnil. A scholar is included among the top collaborators of Edita Tejnil based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Edita Tejnil. Edita Tejnil is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 4 | |
| 3 | 0 | |
| 4 | 13 | |
| 5 | 1 | |
| 6 | 3 | |
| 7 | 1 | |
| 8 | 17 | |
| 9 | 14 | |
| 10 | 9 | |
| 11 | 1 | |
| 12 | 4 | |
| 13 | 4 | |
| 14 | At-Wavelength Metrologies for Extreme Ultraviolet Lithography | 0 |
| 15 | At-wavelength Interferometory for EUV Lithography | 0 |
| 16 | 19 | |
| 17 | 26 | |
| 18 | 7 | |
| 19 | 2 | |
| 20 | 14 |
About Edita Tejnil
Edita Tejnil is a scholar working on Surfaces, Coatings and Films, Radiation and Industrial and Manufacturing Engineering, having authored 47 papers that have together received 421 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (42 papers), Electron and X-Ray Spectroscopy Techniques (15 papers) and Integrated Circuits and Semiconductor Failure Analysis (12 papers). The work is most often cited by research in Surfaces, Coatings and Films (125 citations), Radiation (105 citations) and Structural Biology (10 citations). Edita Tejnil has collaborated with scholars based in United States, Netherlands and Belgium. Frequent co-authors include Jeffrey Bokor, Kenneth A. Goldberg, H. Medecki, Alan R. Stivers, Eric M. Gullikson, David Attwood, Ted Liang, John L. Sturtevant, J. H. Underwood and Pei-yang Yan. Their work appears in journals such as Optics Letters, Review of Scientific Instruments and IEEE Journal of Quantum Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.