Jos Benschop

808 citations
42 papers · 604 indexed · h-index 14
Topics
Advancements in Photolithography Techniques (30 papers)Electron and X-Ray Spectroscopy Techniques (16 papers)Integrated Circuits and Semiconductor Failure Analysis (16 papers)

In The Last Decade

Jos Benschop

40 papers receiving 552 citations

Peers

Jos Benschop
Comparison fields: 5 of 59
  • Electrical and Electronic Engineering 413
  • Biomedical Engineering 182
  • Surfaces, Coatings and Films 154
  • Atomic and Molecular Physics, and Optics 121
  • Mechanics of Materials 86
Replace Anthony Yen with:
Anthony Yen United States
Winfried Kaiser Germany
Stefan Wurm United States
B Bunday United States
Noreen Harned Netherlands
H. Meiling Netherlands
Thorsten Dziomba Germany
Eelco van Setten Netherlands
Yi‐Sha Ku Taiwan
Sven Achenbach Canada
Jos Benschop relative to Anthony Yen United States Anthony Yen's profile →
Citations per field
00.5×1.5×2.3×
Anthony Yen · 1×
Citations per year

Countries citing papers authored by Jos Benschop

Since Specialization
Citations

This map shows the geographic impact of Jos Benschop's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jos Benschop with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jos Benschop more than expected).

Fields of papers citing papers by Jos Benschop

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jos Benschop. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jos Benschop. The network helps show where Jos Benschop may publish in the future.

Co-authorship network of co-authors of Jos Benschop

This figure shows the co-authorship network connecting the top 25 collaborators of Jos Benschop. A scholar is included among the top collaborators of Jos Benschop based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jos Benschop. Jos Benschop is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 5
2 5
3 16
4 5
5 1
6 11
7 2
8 31
9 39
10 1
11 8
12 9
13 48
14 27
15 70
16 24
17 4
18
EUCLIDES: European EUV lithography milestones
3
19 4
20 1

About Jos Benschop

Jos Benschop is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Media Technology, having authored 42 papers that have together received 604 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (30 papers), Electron and X-Ray Spectroscopy Techniques (16 papers) and Integrated Circuits and Semiconductor Failure Analysis (16 papers). The work is most often cited by research in Surfaces, Coatings and Films (154 citations), Electrical and Electronic Engineering (413 citations) and Radiation (52 citations). Jos Benschop has collaborated with scholars based in Netherlands, Germany and United States. Frequent co-authors include Vadim Banine, Sjoerd Lok, Peter Kuerz, H. Meiling, Winfried Kaiser, Mark van de Kerkhof, Eelco van Setten, Kars Troost, F. Bijkerk and Judon Stoeldraijer. Their work appears in journals such as Scientific Reports, Journal of Physics D Applied Physics and Sensors and Actuators A Physical.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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