Peter Kürz
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics top 10%
- Biomedical Engineering
- Surfaces, Coatings and Films top 10%
- Artificial Intelligence
- Co-authors
- R. PaschottaJ. MlynekK. FiedlerS. SchillerM. J. CollettHans‐A. BachorTakaaki MukaiNoreen Harned
- Topics
- Advancements in Photolithography Techniques (8 papers)Advanced Fiber Laser Technologies (6 papers)Photorefractive and Nonlinear Optics (5 papers)
- Cited by
- Surfaces, Coatings and FilmsAtomic and Molecular Physics, and OpticsElectrical and Electronic Engineering
- Partner nations
- GermanyNetherlandsJapan
In The Last Decade
Peter Kürz
20 papers receiving 390 citations
Peers
Comparison fields: 5 of 50
- Electrical and Electronic Engineering 276
- Atomic and Molecular Physics, and Optics 258
- Biomedical Engineering 60
- Surfaces, Coatings and Films 60
- Artificial Intelligence 42
Countries citing papers authored by Peter Kürz
This map shows the geographic impact of Peter Kürz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter Kürz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter Kürz more than expected).
Fields of papers citing papers by Peter Kürz
This network shows the impact of papers produced by Peter Kürz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter Kürz. The network helps show where Peter Kürz may publish in the future.
Co-authorship network of co-authors of Peter Kürz
This figure shows the co-authorship network connecting the top 25 collaborators of Peter Kürz. A scholar is included among the top collaborators of Peter Kürz based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Peter Kürz. Peter Kürz is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 22 | |
| 3 | 2 | |
| 4 | 3 | |
| 5 | 23 | |
| 6 | 2 | |
| 7 | 58 | |
| 8 | 9 | |
| 9 | 0 | |
| 10 | 18 | |
| 11 | 12 | |
| 12 | 11 | |
| 13 | 0 | |
| 14 | 83 | |
| 15 | 44 | |
| 16 | 34 | |
| 17 | 28 | |
| 18 | 18 | |
| 19 | 5 | |
| 20 | 7 |
About Peter Kürz
Peter Kürz is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering, having authored 22 papers that have together received 439 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (8 papers), Advanced Fiber Laser Technologies (6 papers) and Photorefractive and Nonlinear Optics (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (60 citations), Atomic and Molecular Physics, and Optics (258 citations) and Electrical and Electronic Engineering (276 citations). Peter Kürz has collaborated with scholars based in Germany, Netherlands and Japan. Frequent co-authors include R. Paschotta, J. Mlynek, K. Fiedler, S. Schiller, M. J. Collett, Hans‐A. Bachor, Takaaki Mukai, J. Mlynek, Noreen Harned and H. Meiling. Their work appears in journals such as Physical Review Letters, Applied Physics Letters and Optics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.