M. Lousberg
- Hardware and Architecture top 1%
- Electrical and Electronic Engineering top 5%
- Control and Systems Engineering top 10%
- Computer Networks and Communications top 10%
- Software
- Co-authors
- Erik Jan MarinissenSandeep GoelClemens WoutersG. GronthoudK. BakerS. EichenbergerC. HoraC.F. Hawkins
- Topics
- VLSI and Analog Circuit Testing (20 papers)Integrated Circuits and Semiconductor Failure Analysis (17 papers)Engineering and Test Systems (6 papers)
- Cited by
- Hardware and ArchitectureElectrical and Electronic EngineeringControl and Systems Engineering
- Journals
- Electronics LettersJournal of Electronic TestingData Archiving and Networked Services (DANS)
- Partner nations
- NetherlandsUnited StatesFinland
In The Last Decade
M. Lousberg
17 papers receiving 735 citations
Peers
Comparison fields: 5 of 26
- Hardware and Architecture 759
- Electrical and Electronic Engineering 743
- Control and Systems Engineering 107
- Computer Networks and Communications 91
- Software 12
Countries citing papers authored by M. Lousberg
This map shows the geographic impact of M. Lousberg's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Lousberg with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Lousberg more than expected).
Fields of papers citing papers by M. Lousberg
This network shows the impact of papers produced by M. Lousberg. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Lousberg. The network helps show where M. Lousberg may publish in the future.
Co-authorship network of co-authors of M. Lousberg
This figure shows the co-authorship network connecting the top 25 collaborators of M. Lousberg. A scholar is included among the top collaborators of M. Lousberg based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Lousberg. M. Lousberg is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 7 | |
| 2 | 20 | |
| 3 | 7 | |
| 4 | 11 | |
| 5 | 1 | |
| 6 | 2 | |
| 7 | 10 | |
| 8 | 91 | |
| 9 | 17 | |
| 10 | 6 | |
| 11 | 50 | |
| 12 | 3 | |
| 13 | 0 | |
| 14 | 86 | |
| 15 | 30 | |
| 16 | 236 | |
| 17 | 35 | |
| 18 | 172 | |
| 19 | On Electrical Fault Diagnosis in Full-Scan Circuits | 15 |
| 20 | 0 |
About M. Lousberg
M. Lousberg is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering, having authored 21 papers that have together received 804 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (20 papers), Integrated Circuits and Semiconductor Failure Analysis (17 papers) and Engineering and Test Systems (6 papers). The work is most often cited by research in Hardware and Architecture (759 citations), Electrical and Electronic Engineering (743 citations) and Control and Systems Engineering (107 citations). M. Lousberg has collaborated with scholars based in Netherlands, United States and Finland. Frequent co-authors include Erik Jan Marinissen, Sandeep Goel, Clemens Wouters, G. Gronthoud, K. Baker, S. Eichenberger, C. Hora, C.F. Hawkins, Y. Zorian and Teresa McLaurin. Their work appears in journals such as Electronics Letters, Journal of Electronic Testing and Data Archiving and Networked Services (DANS).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.