C.F. Hawkins

3.7k total citations
84 papers, 2.5k citations indexed

About

C.F. Hawkins is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, C.F. Hawkins has authored 84 papers receiving a total of 2.5k indexed citations (citations by other indexed papers that have themselves been cited), including 64 papers in Electrical and Electronic Engineering, 41 papers in Hardware and Architecture and 4 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in C.F. Hawkins's work include Integrated Circuits and Semiconductor Failure Analysis (57 papers), VLSI and Analog Circuit Testing (41 papers) and Semiconductor materials and devices (30 papers). C.F. Hawkins is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (57 papers), VLSI and Analog Circuit Testing (41 papers) and Semiconductor materials and devices (30 papers). C.F. Hawkins collaborates with scholars based in United States, Spain and Canada. C.F. Hawkins's co-authors include J.M. Soden, A. Keshavarzi, J. Segura, Kaushik Roy, Alan Righter, Weiwei Mao, R. K. Gulati, F.J. Ferguson, Richard H. Williams and R.K. Treece and has published in prestigious journals such as Gut, IEEE Transactions on Industrial Electronics and Electronics Letters.

In The Last Decade

C.F. Hawkins

81 papers receiving 2.3k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
C.F. Hawkins United States 29 2.4k 1.8k 162 109 76 84 2.5k
Linda Milor United States 19 1.7k 0.7× 1.0k 0.5× 115 0.7× 92 0.8× 73 1.0× 156 1.8k
J.M. Soden United States 23 1.7k 0.7× 1.3k 0.7× 110 0.7× 89 0.8× 35 0.5× 68 1.7k
Anne Gattiker United States 20 1.5k 0.6× 1.0k 0.6× 116 0.7× 53 0.5× 51 0.7× 51 1.6k
Hans G. Kerkhoff Netherlands 15 864 0.4× 548 0.3× 262 1.6× 96 0.9× 22 0.3× 215 993
Mohab Anis Canada 23 1.8k 0.8× 541 0.3× 392 2.4× 13 0.1× 24 0.3× 138 1.9k
Youngsoo Shin South Korea 21 1.4k 0.6× 1.1k 0.6× 136 0.8× 33 0.3× 99 1.3× 205 2.2k
A. Virazel France 20 1.6k 0.7× 1.2k 0.6× 18 0.1× 67 0.6× 16 0.2× 229 1.7k
B. Courtois France 19 1.1k 0.5× 708 0.4× 201 1.2× 116 1.1× 15 0.2× 78 1.3k
Cecilia Metra Italy 25 2.0k 0.9× 1.3k 0.7× 55 0.3× 37 0.3× 9 0.1× 166 2.2k
David Fried United States 15 1.1k 0.5× 115 0.1× 145 0.9× 33 0.3× 35 0.5× 42 1.3k

Countries citing papers authored by C.F. Hawkins

Since Specialization
Citations

This map shows the geographic impact of C.F. Hawkins's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.F. Hawkins with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.F. Hawkins more than expected).

Fields of papers citing papers by C.F. Hawkins

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C.F. Hawkins. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.F. Hawkins. The network helps show where C.F. Hawkins may publish in the future.

Co-authorship network of co-authors of C.F. Hawkins

This figure shows the co-authorship network connecting the top 25 collaborators of C.F. Hawkins. A scholar is included among the top collaborators of C.F. Hawkins based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C.F. Hawkins. C.F. Hawkins is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Hawkins, C.F., et al.. (2025). Near-infrared-II pulsed laser diode array for spectral photoacoustic imaging of deep tissue oxygenation. Biomedical Optics Express. 16(12). 4970–4970.
2.
Miller, Daniel A., et al.. (2021). The Global Smartphone: Beyond a youth technology. UCL Discovery (University College London). 20 indexed citations
3.
Segura, J. & C.F. Hawkins. (2004). CMOS electronics: how it works how it fails. CERN Document Server (European Organization for Nuclear Research). 62 indexed citations
4.
Soden, J.M. & C.F. Hawkins. (2002). I/sub DDQ/ testing and defect classes-a tutorial. 633–642. 8 indexed citations
5.
Soden, J.M., et al.. (2002). Increased CMOS IC stuck-at fault coverage with reduced I/sub DDQ/ test sets. 427–435. 31 indexed citations
6.
Hawkins, C.F., A. Keshavarzi, & J.M. Soden. (1997). Reliabilty, Test, and IDDQ Measurements. Pediatric Dermatology. 32(3). 96–5. 1 indexed citations
7.
Hawkins, C.F., J.M. Soden, Alan Righter, & F.J. Ferguson. (1994). Defect Classes - An Overdue Paradigm for CMOS IC. International Test Conference. 413–425. 56 indexed citations
8.
Righter, Alan, et al.. (1993). A General Purpose IDDQ Measurement Circuit. International Test Conference. 642–651. 29 indexed citations
9.
Soden, J.M. & C.F. Hawkins. (1993). Correct CMOS IC defect models for quality testing. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2 indexed citations
10.
Soden, J.M., et al.. (1991). The behavior and testing implications of CMOS IC logic gate open circuits. NASA STI/Recon Technical Report N. 92. 12189. 1 indexed citations
11.
Soden, J.M., et al.. (1990). Increased CMOS IC stuck-at fault coverage with reduced I DDQ test sets.. International Test Conference. 427–435. 61 indexed citations
12.
Hawkins, C.F., et al.. (1989). The VLSI circuit test problem-a tutorial. IEEE Transactions on Industrial Electronics. 36(2). 111–116. 26 indexed citations
13.
Hanzlick, Randy, et al.. (1988). A “Back Door” Approach to Analysis of Ethanol-Associated Risks and Behavior. American Journal of Forensic Medicine & Pathology. 9(4). 322–330. 5 indexed citations
14.
Soden, J.M. & C.F. Hawkins. (1986). Reliability and electrical properties of gate oxide shorts in CMOS ICs. International Test Conference. 443–451. 108 indexed citations
15.
Soden, J.M. & C.F. Hawkins. (1986). Test Considerations for Gate Oxide Shorts in CMOS ICs. IEEE Design & Test of Computers. 3(4). 56–64. 105 indexed citations
16.
Hawkins, C.F. & J.M. Soden. (1985). Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs.. International Test Conference. 544–557. 110 indexed citations
17.
Neamen, Donald A., et al.. (1984). Electronic circuit analysis : basic principles. Wiley eBooks. 6 indexed citations
18.
Hawkins, C.F.. (1976). The Effect of Treatment on the Natural History of Peptic Ulcer. Journal of the Royal College of Physicians of London. 10(2). 177–182. 1 indexed citations
19.
Cockel, R & C.F. Hawkins. (1970). Gastroscopy and gastric photography with the Olympus GTF-A. Gut. 11(2). 176–181. 4 indexed citations
20.
Hawkins, C.F.. (1952). Impressions of Postgraduate Education in America. BMJ. 2(4782). 464–466. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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