C.F. Hawkins
About
In The Last Decade
C.F. Hawkins
81 papers receiving 2.3k citations
Peers
Comparison fields: 5 of 82
- Electrical and Electronic Engineering 2.4k
- Hardware and Architecture 1.8k
- Biomedical Engineering 162
- Control and Systems Engineering 109
- Industrial and Manufacturing Engineering 76
Countries citing papers authored by C.F. Hawkins
This map shows the geographic impact of C.F. Hawkins's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.F. Hawkins with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.F. Hawkins more than expected).
Fields of papers citing papers by C.F. Hawkins
This network shows the impact of papers produced by C.F. Hawkins. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.F. Hawkins. The network helps show where C.F. Hawkins may publish in the future.
Co-authorship network of co-authors of C.F. Hawkins
This figure shows the co-authorship network connecting the top 25 collaborators of C.F. Hawkins. A scholar is included among the top collaborators of C.F. Hawkins based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C.F. Hawkins. C.F. Hawkins is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 20 | |
| 3 | CMOS electronics: how it works how it fails | 62 |
| 4 | 8 | |
| 5 | 31 | |
| 6 | 1 | |
| 7 | Defect Classes - An Overdue Paradigm for CMOS IC | 56 |
| 8 | A General Purpose IDDQ Measurement Circuit | 29 |
| 9 | Correct CMOS IC defect models for quality testing | 2 |
| 10 | The behavior and testing implications of CMOS IC logic gate open circuits | 1 |
| 11 | Increased CMOS IC stuck-at fault coverage with reduced I DDQ test sets. | 61 |
| 12 | 26 | |
| 13 | 5 | |
| 14 | Reliability and electrical properties of gate oxide shorts in CMOS ICs | 108 |
| 15 | 105 | |
| 16 | Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. | 110 |
| 17 | Electronic circuit analysis : basic principles | 6 |
| 18 | 1 | |
| 19 | 4 | |
| 20 | 1 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.