G. Gronthoud

656 total citations
26 papers, 470 citations indexed

About

G. Gronthoud is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, G. Gronthoud has authored 26 papers receiving a total of 470 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Hardware and Architecture, 24 papers in Electrical and Electronic Engineering and 3 papers in Control and Systems Engineering. Recurrent topics in G. Gronthoud's work include VLSI and Analog Circuit Testing (25 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers) and Electrostatic Discharge in Electronics (4 papers). G. Gronthoud is often cited by papers focused on VLSI and Analog Circuit Testing (25 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers) and Electrostatic Discharge in Electronics (4 papers). G. Gronthoud collaborates with scholars based in Netherlands, United Kingdom and United States. G. Gronthoud's co-authors include S. Eichenberger, B. Kruseman, M. Lousberg, A.K. Majhi, K. Baker, W. G. MOORE, C. Hora, José Pineda de Gyvez, C.F. Hawkins and D.M.H. Walker and has published in prestigious journals such as Journal of Electronic Testing, IET Computers & Digital Techniques and IEEE Design & Test of Computers.

In The Last Decade

G. Gronthoud

24 papers receiving 445 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
G. Gronthoud Netherlands	12	447	429	35	17	11	26	470
B. Kruseman Netherlands	14	576 1.3×	516 1.2×	31 0.9×	10 0.6×	6 0.5×	35	600
S. Eichenberger Netherlands	12	543 1.2×	509 1.2×	22 0.6×	7 0.4×	8 0.7×	25	567
D. Appello Italy	12	340 0.8×	344 0.8×	52 1.5×	24 1.4×	15 1.4×	56	403
Sreejit Chakravarty United States	13	507 1.1×	485 1.1×	55 1.6×	9 0.5×	19 1.7×	57	538
Rubin Parekhji India	12	312 0.7×	293 0.7×	33 0.9×	9 0.5×	29 2.6×	65	332
Vivek Chickermane United States	15	597 1.3×	573 1.3×	50 1.4×	12 0.7×	14 1.3×	43	623
Urban Ingelsson Sweden	10	276 0.6×	285 0.7×	43 1.2×	10 0.6×	27 2.5×	25	307
Chris Schuermyer United States	11	407 0.9×	400 0.9×	39 1.1×	8 0.5×	4 0.4×	19	435
Anuja Sehgal United States	12	282 0.6×	285 0.7×	28 0.8×	11 0.6×	30 2.7×	22	306
W. Needham United States	7	355 0.8×	326 0.8×	30 0.9×	3 0.2×	9 0.8×	9	371

Countries citing papers authored by G. Gronthoud

Since Specialization

Citations

This map shows the geographic impact of G. Gronthoud's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Gronthoud with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Gronthoud more than expected).

Fields of papers citing papers by G. Gronthoud

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G. Gronthoud. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Gronthoud. The network helps show where G. Gronthoud may publish in the future.

Co-authorship network of co-authors of G. Gronthoud

This figure shows the co-authorship network connecting the top 25 collaborators of G. Gronthoud. A scholar is included among the top collaborators of G. Gronthoud based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. Gronthoud. G. Gronthoud is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

1.

Zivkovic, V., et al.. (2008). Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design. 27–32. 6 indexed citations

2.

Kerkhoff, Hans G., et al.. (2008). Exploring dynamics of embedded ADC through adapted digital input stimuli. University of Twente Research Information. 1–7. 4 indexed citations

3.

Walker, D.M.H., Xiang Lü, A.K. Majhi, et al.. (2007). Modeling Power Supply Noise in Delay Testing. IEEE Design & Test of Computers. 24(3). 226–234. 18 indexed citations

4.

MOORE, W. G., et al.. (2006). A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis. 266–271. 22 indexed citations

5.

MOORE, W. G., et al.. (2006). A novel stuck-at based method for transistor stuck-open fault diagnosis. 378–386. 28 indexed citations

6.

Gyvez, José Pineda de, et al.. (2006). Functional vs. multi-VDD testing of RF circuits. TU/e Research Portal. 412–420. 15 indexed citations

7.

Majhi, A.K., et al.. (2005). Memory Testing Under Different Stress Conditions: An Industrial Evaluation. Design, Automation, and Test in Europe. 438–443. 11 indexed citations

8.

Majhi, A.K., et al.. (2005). Memory testing improvements through different stress conditions. 299–302. 1 indexed citations

9.

Gyvez, José Pineda de, et al.. (2005). Multi-VDD Testing for Analog Circuits. Journal of Electronic Testing. 21(3). 311–322. 3 indexed citations

10.

Zjajo, Amir, José Pineda de Gyvez, & G. Gronthoud. (2005). A quasi-static approach for detection and simulation of parametric faults in analog and mixed-signal circuits. 3 indexed citations

11.

Majhi, A.K., et al.. (2005). A New Algorithm for Dynamic Faults Detection in RAMs. 177–182. 4 indexed citations

12.

Kruseman, B., A.K. Majhi, G. Gronthoud, & S. Eichenberger. (2005). On hazard-free patterns for fine-delay fault testing. 213–222. 83 indexed citations

13.

Gyvez, José Pineda de, et al.. (2005). Power supply ramping for quasi-static testing of PLLs. TU/e Research Portal. 980–987. 3 indexed citations

14.

Gronthoud, G., et al.. (2005). Reducing analogue fault-simulation time by using ifigh-level modelling in dotss for an industrial design. 61–67. 6 indexed citations

15.

Gyvez, José Pineda de, et al.. (2004). Vdd ramp testing for rf circuits. TU/e Research Portal. 1. 651–658. 29 indexed citations

16.

Arumí, Daniel, R. Rodríguez‐Montañés, José Pineda de Gyvez, & G. Gronthoud. (2004). Process-variability aware delay fault testing of ΔV/sub T/ and weak-open defects. TU/e Research Portal. 2. 85–90. 3 indexed citations

17.

Baker, K., et al.. (2003). Defect-based delay testing of resistive vias-contacts a critical evaluation. 467–476. 91 indexed citations

18.

Majhi, A.K., et al.. (2003). Improving diagnostic resolution of delay faults using path delay fault model. 345–350. 6 indexed citations

19.

MOORE, W. G., G. Gronthoud, K. Baker, & M. Lousberg. (2002). Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?. 95–104. 35 indexed citations

20.

Gronthoud, G., et al.. (2001). A High-Level Modelling Algorithm for Analogue Fault Simulation. University of Twente Research Information. 348–355.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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