L. Whetsel
- Hardware and Architecture top 1%
- Electrical and Electronic Engineering top 10%
- Control and Systems Engineering top 10%
- Computer Networks and Communications
- Artificial Intelligence
- Co-authors
- J. SaxenaKenneth M. ButlerY. ZorianR. KapurErik Jan MarinissenK. ArabiKeith L. WilliamsSaman Adham
- Topics
- VLSI and Analog Circuit Testing (21 papers)Integrated Circuits and Semiconductor Failure Analysis (16 papers)Engineering and Test Systems (11 papers)
- Cited by
- Hardware and ArchitectureElectrical and Electronic EngineeringControl and Systems Engineering
- Journals
- International Test Conference
- Partner nations
- United StatesSwitzerlandNetherlands
In The Last Decade
L. Whetsel
23 papers receiving 602 citations
Peers
Comparison fields: 5 of 20
- Hardware and Architecture 630
- Electrical and Electronic Engineering 609
- Control and Systems Engineering 117
- Computer Networks and Communications 39
- Artificial Intelligence 14
Countries citing papers authored by L. Whetsel
This map shows the geographic impact of L. Whetsel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Whetsel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Whetsel more than expected).
Fields of papers citing papers by L. Whetsel
This network shows the impact of papers produced by L. Whetsel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Whetsel. The network helps show where L. Whetsel may publish in the future.
Co-authorship network of co-authors of L. Whetsel
This figure shows the co-authorship network connecting the top 25 collaborators of L. Whetsel. A scholar is included among the top collaborators of L. Whetsel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with L. Whetsel. L. Whetsel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 5 | |
| 2 | 0 | |
| 3 | 5 | |
| 4 | 9 | |
| 5 | 3 | |
| 6 | 1 | |
| 7 | 3 | |
| 8 | 47 | |
| 9 | 19 | |
| 10 | 2 | |
| 11 | 5 | |
| 12 | 73 | |
| 13 | 138 | |
| 14 | 217 | |
| 15 | 4 | |
| 16 | 5 | |
| 17 | 72 | |
| 18 | 10 | |
| 19 | 3 | |
| 20 | Adapting Scan Architechtures for Low Power Operation | 5 |
About L. Whetsel
L. Whetsel is a scholar working on Hardware and Architecture, Control and Systems Engineering and Electrical and Electronic Engineering, having authored 24 papers that have together received 646 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (21 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers) and Engineering and Test Systems (11 papers). The work is most often cited by research in Hardware and Architecture (630 citations), Electrical and Electronic Engineering (609 citations) and Control and Systems Engineering (117 citations). L. Whetsel has collaborated with scholars based in United States, Switzerland and Netherlands. Frequent co-authors include J. Saxena, Kenneth M. Butler, Y. Zorian, R. Kapur, Erik Jan Marinissen, K. Arabi, Keith L. Williams, Saman Adham, Teresa McLaurin and P. Varma. Their work appears in journals such as International Test Conference.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.