A.K. Majhi

492 total citations
17 papers, 353 citations indexed

About

A.K. Majhi is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, A.K. Majhi has authored 17 papers receiving a total of 353 indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Hardware and Architecture, 17 papers in Electrical and Electronic Engineering and 1 paper in Control and Systems Engineering. Recurrent topics in A.K. Majhi's work include VLSI and Analog Circuit Testing (17 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers) and VLSI and FPGA Design Techniques (4 papers). A.K. Majhi is often cited by papers focused on VLSI and Analog Circuit Testing (17 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers) and VLSI and FPGA Design Techniques (4 papers). A.K. Majhi collaborates with scholars based in Netherlands, United States and India. A.K. Majhi's co-authors include S. Eichenberger, B. Kruseman, G. Gronthoud, C. Hora, Vishwani D. Agrawal, L.M. Patnaik, J. Jacob, M. Lousberg, R. Rodríguez‐Montañés and Daniel Arumí and has published in prestigious journals such as IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE Design & Test of Computers and Design, Automation, and Test in Europe.

In The Last Decade

A.K. Majhi

16 papers receiving 338 citations

Peers

A.K. Majhi
Alan Righter United States
W. Needham United States
M.E. Levitt United States
Masaki Hashizume Japan
N.V. Arvind India
Anuja Sehgal United States
Teresa McLaurin United States
Shuji Hamada Japan
Yi-Shing Chang United States
N. Jarwala United States
Alan Righter United States
A.K. Majhi
Citations per year, relative to A.K. Majhi A.K. Majhi (= 1×) peers Alan Righter

Countries citing papers authored by A.K. Majhi

Since Specialization
Citations

This map shows the geographic impact of A.K. Majhi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A.K. Majhi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A.K. Majhi more than expected).

Fields of papers citing papers by A.K. Majhi

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A.K. Majhi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A.K. Majhi. The network helps show where A.K. Majhi may publish in the future.

Co-authorship network of co-authors of A.K. Majhi

This figure shows the co-authorship network connecting the top 25 collaborators of A.K. Majhi. A scholar is included among the top collaborators of A.K. Majhi based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A.K. Majhi. A.K. Majhi is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

17 of 17 papers shown
1.
2.
Walker, D.M.H., Xiang Lü, A.K. Majhi, et al.. (2007). Modeling Power Supply Noise in Delay Testing. IEEE Design & Test of Computers. 24(3). 226–234. 18 indexed citations
3.
Arumí, Daniel, R. Rodríguez‐Montañés, Joan Figueras, et al.. (2007). Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. 145–150. 7 indexed citations
4.
Rodríguez‐Montañés, R., Daniel Arumí, Joan Figueras, et al.. (2007). Diagnosis of Full Open Defects in Interconnecting Lines. 158–166. 20 indexed citations
5.
Majhi, A.K., et al.. (2005). Memory Testing Under Different Stress Conditions: An Industrial Evaluation. Design, Automation, and Test in Europe. 438–443. 11 indexed citations
6.
Majhi, A.K., et al.. (2005). Memory testing improvements through different stress conditions. 299–302. 1 indexed citations
7.
Majhi, A.K., et al.. (2005). A New Algorithm for Dynamic Faults Detection in RAMs. 177–182. 4 indexed citations
8.
Kruseman, B., A.K. Majhi, G. Gronthoud, & S. Eichenberger. (2005). On hazard-free patterns for fine-delay fault testing. 213–222. 83 indexed citations
9.
Kruseman, B., et al.. (2005). Systematic defects in deep sub-micron technologies. 290–299. 58 indexed citations
10.
Majhi, A.K., et al.. (2004). New test methodology for resistive open defect detection in memory address decoders. 123–128. 21 indexed citations
11.
Majhi, A.K., et al.. (2003). Improving diagnostic resolution of delay faults using path delay fault model. 345–350. 6 indexed citations
12.
Majhi, A.K. & Vishwani D. Agrawal. (2002). Delay fault models and coverage. 364–369. 21 indexed citations
13.
Majhi, A.K., J. Jacob, L.M. Patnaik, & Vishwani D. Agrawal. (2002). On test coverage of path delay faults. 418–421. 20 indexed citations
14.
Majhi, A.K., et al.. (2002). Automated AC (timing) characterization for digital circuit testing. 374–377. 6 indexed citations
15.
Majhi, A.K. & Vishwani D. Agrawal. (2002). Mixed-signal test. 285–288. 4 indexed citations
16.
Majhi, A.K., J. Jacob, L.M. Patnaik, & Vishwani D. Agrawal. (2002). An efficient automatic test generation system for path delay faults in combinational circuits. 161–165. 8 indexed citations
17.
Majhi, A.K., et al.. (2000). Line coverage of path delay faults. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 8(5). 610–614. 36 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Alan Righter Breakdown of academic impact, for papers by W. Needham Breakdown of academic impact, for papers by M.E. Levitt Breakdown of academic impact, for papers by Masaki Hashizume Breakdown of academic impact, for papers by N.V. Arvind Breakdown of academic impact, for papers by Anuja Sehgal Breakdown of academic impact, for papers by Teresa McLaurin Breakdown of academic impact, for papers by Shuji Hamada Breakdown of academic impact, for papers by Yi-Shing Chang Breakdown of academic impact, for papers by N. Jarwala
Rankless by CCL
2026