Rohit Kapur

859 total citations
46 papers, 537 citations indexed

About

Rohit Kapur is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, Rohit Kapur has authored 46 papers receiving a total of 537 indexed citations (citations by other indexed papers that have themselves been cited), including 42 papers in Hardware and Architecture, 40 papers in Electrical and Electronic Engineering and 8 papers in Control and Systems Engineering. Recurrent topics in Rohit Kapur's work include Integrated Circuits and Semiconductor Failure Analysis (40 papers), VLSI and Analog Circuit Testing (39 papers) and Advancements in Photolithography Techniques (11 papers). Rohit Kapur is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (40 papers), VLSI and Analog Circuit Testing (39 papers) and Advancements in Photolithography Techniques (11 papers). Rohit Kapur collaborates with scholars based in United States, Switzerland and India. Rohit Kapur's co-authors include Anshuman Chandra, Santanu Chattopadhyay, M.R. Mercer, Indranil Sengupta, Subhasish Mitra, Y. Zorian, Erik Jan Marinissen, Teresa McLaurin, T.W. Williams and M. Lousberg and has published in prestigious journals such as Computer, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

In The Last Decade

Rohit Kapur

43 papers receiving 500 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Rohit Kapur United States	13	494	462	86	46	43	46	537
H.T. Vierhaus Germany	13	512 1.0×	524 1.1×	40 0.5×	26 0.6×	30 0.7×	109	595
Michael A. Kochte Germany	17	788 1.6×	748 1.6×	41 0.5×	29 0.6×	48 1.1×	76	871
Juergen Schloeffel Germany	13	564 1.1×	584 1.3×	33 0.4×	32 0.7×	16 0.4×	30	634
Friedrich Hapke Germany	18	942 1.9×	919 2.0×	84 1.0×	54 1.2×	22 0.5×	36	992
Andreas Glowatz Germany	14	665 1.3×	642 1.4×	53 0.6×	51 1.1×	20 0.5×	28	707
Jennifer Dworak United States	15	630 1.3×	588 1.3×	46 0.5×	6 0.1×	75 1.7×	69	668
S. Venkataraman United States	12	702 1.4×	690 1.5×	107 1.2×	16 0.3×	24 0.6×	27	745
Salvador Manich Spain	12	309 0.6×	343 0.7×	20 0.2×	9 0.2×	63 1.5×	40	407
N. Tamarapalli United States	14	1.2k 2.5×	1.2k 2.6×	192 2.2×	21 0.5×	15 0.3×	17	1.3k
V. N. Yarmolik Belarus	14	500 1.0×	416 0.9×	51 0.6×	6 0.1×	30 0.7×	69	536

Countries citing papers authored by Rohit Kapur

Since Specialization

Citations

This map shows the geographic impact of Rohit Kapur's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Rohit Kapur with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Rohit Kapur more than expected).

Fields of papers citing papers by Rohit Kapur

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Rohit Kapur. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Rohit Kapur. The network helps show where Rohit Kapur may publish in the future.

Co-authorship network of co-authors of Rohit Kapur

This figure shows the co-authorship network connecting the top 25 collaborators of Rohit Kapur. A scholar is included among the top collaborators of Rohit Kapur based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Rohit Kapur. Rohit Kapur is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Chattopadhyay, Santanu, et al.. (2019). A Scan Obfuscation Guided Design-for-Security Approach for Sequential Circuits. IEEE Transactions on Circuits & Systems II Express Briefs. 67(3). 546–550. 27 indexed citations

Kapur, Rohit, et al.. (2018). Handling Unknown with Blend of Scan and Scan Compression. Journal of Electronic Testing. 34(2). 135–146. 2 indexed citations

Prasad, Neeli R., et al.. (2017). A New Logic Encryption Strategy Ensuring Key Interdependency. 429–434. 28 indexed citations

Kapur, Rohit, et al.. (2015). Fault diagnosis in designs with extreme low pin test data compressors. Design, Automation, and Test in Europe. 1285–1288. 6 indexed citations

Chattopadhyay, Santanu, et al.. (2015). GA based diagnostic test pattern generation for transition faults. 1–6. 5 indexed citations

Chattopadhyay, Santanu, et al.. (2013). An ATE assisted DFD technique for volume diagnosis of scan chains. 1–6. 9 indexed citations

Chattopadhyay, Santanu, et al.. (2013). Aggresive scan chain masking for improved diagnosis of multiple scan chain failures. 1–1. 1 indexed citations

Chattopadhyay, Santanu, et al.. (2013). Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 22(3). 696–700. 7 indexed citations

Chandra, Anshuman, et al.. (2011). Breaking the Test Application Time Barriers in Compression: Adaptive Scan-Cyclical (AS-C). 432–437. 13 indexed citations

10.

Kulkarni, Santosh, et al.. (2011). Predicting Scan Compression IP Configurations for Better QoR. 261–266.

11.

Chandra, Anshuman, et al.. (2009). Scalable adaptive scan (SAS). Design, Automation, and Test in Europe. 1476–1481. 23 indexed citations

12.

Kapur, Rohit, et al.. (2009). CTL and Its Usage in the EDA Industry. IEEE Design & Test of Computers. 26(1). 36–43. 1 indexed citations

13.

Chandra, Anshuman & Rohit Kapur. (2008). Bounded Adjacent Fill for Low Capture Power Scan Testing. 131–138. 36 indexed citations

14.

Chandra, Anshuman, et al.. (2008). Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction. 2008 Design, Automation and Test in Europe. 462–467. 9 indexed citations

15.

Kapur, Rohit, et al.. (2007). Testing in the year 2020. Design, Automation, and Test in Europe. 960–965. 2 indexed citations

16.

Kapur, Rohit, et al.. (2007). Testing in the Year 2020. 1–6. 2 indexed citations

17.

Oh, Nahmsuk, et al.. (2003). Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture. Design, Automation, and Test in Europe. 2. 10110–10115. 11 indexed citations

18.

Marinissen, Erik Jan, et al.. (2002). On IEEE P1500's Standard for Embedded Core Test. Journal of Electronic Testing. 18(4-5). 365–383. 86 indexed citations

19.

Liou, Jing-Jia, Li-C. Wang, Kwang‐Ting Cheng, et al.. (2002). Enhancing test efficiency for delay fault testing using multiple-clocked schemes. Proceedings - ACM IEEE Design Automation Conference. 371–371. 20 indexed citations

20.

Kapur, Rohit, et al.. (1996). System Test and Reliability: Techniques for Avoiding Failure. Computer. 29(11). 28–30. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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