Rohit Kapur

859 total citations
46 papers, 537 citations indexed

About

Rohit Kapur is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, Rohit Kapur has authored 46 papers receiving a total of 537 indexed citations (citations by other indexed papers that have themselves been cited), including 42 papers in Hardware and Architecture, 40 papers in Electrical and Electronic Engineering and 8 papers in Control and Systems Engineering. Recurrent topics in Rohit Kapur's work include Integrated Circuits and Semiconductor Failure Analysis (40 papers), VLSI and Analog Circuit Testing (39 papers) and Advancements in Photolithography Techniques (11 papers). Rohit Kapur is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (40 papers), VLSI and Analog Circuit Testing (39 papers) and Advancements in Photolithography Techniques (11 papers). Rohit Kapur collaborates with scholars based in United States, Switzerland and India. Rohit Kapur's co-authors include Anshuman Chandra, Santanu Chattopadhyay, M.R. Mercer, Indranil Sengupta, Subhasish Mitra, Y. Zorian, Erik Jan Marinissen, Teresa McLaurin, T.W. Williams and M. Lousberg and has published in prestigious journals such as Computer, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

In The Last Decade

Rohit Kapur

43 papers receiving 500 citations

Peers

Countries citing papers authored by Rohit Kapur

Since Specialization

Citations

This map shows the geographic impact of Rohit Kapur's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Rohit Kapur with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Rohit Kapur more than expected).

Fields of papers citing papers by Rohit Kapur

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Rohit Kapur. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Rohit Kapur. The network helps show where Rohit Kapur may publish in the future.

Co-authorship network of co-authors of Rohit Kapur

This figure shows the co-authorship network connecting the top 25 collaborators of Rohit Kapur. A scholar is included among the top collaborators of Rohit Kapur based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Rohit Kapur. Rohit Kapur is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	A Scan Obfuscation Guided Design-for-Security Approach for Sequential Circuits 2019 ·IEEE Transactions on Circuits & Systems II Express Briefs ·(unknown), Santanu Chattopadhyay, Rohit Kapur	27
2	Handling Unknown with Blend of Scan and Scan Compression 2018 ·Journal of Electronic Testing ·(unknown), Rohit Kapur	2
3	A New Logic Encryption Strategy Ensuring Key Interdependency 2017 ·(unknown), Neeli R. Prasad, Santanu Chattopadhyay, Rohit Kapur, Indranil Sengupta	28
4	Fault diagnosis in designs with extreme low pin test data compressors 2015 ·Design, Automation, and Test in Europe ·(unknown), (unknown), Rohit Kapur	6
5	GA based diagnostic test pattern generation for transition faults 2015 ·(unknown), Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur	5
6	An ATE assisted DFD technique for volume diagnosis of scan chains 2013 ·(unknown), Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur	9
7	Aggresive scan chain masking for improved diagnosis of multiple scan chain failures 2013 ·(unknown), Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur	1
8	Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization 2013 ·IEEE Transactions on Very Large Scale Integration (VLSI) Systems ·(unknown), (unknown), Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur	7
9	Breaking the Test Application Time Barriers in Compression: Adaptive Scan-Cyclical (AS-C) 2011 ·Anshuman Chandra, (unknown), Rohit Kapur	13
10	Predicting Scan Compression IP Configurations for Better QoR 2011 ·(unknown), (unknown), Santosh Kulkarni, (unknown), (unknown), (unknown), (unknown), Rohit Kapur	0
11	Scalable adaptive scan (SAS) 2009 ·Design, Automation, and Test in Europe ·Anshuman Chandra, Rohit Kapur, (unknown)	23
12	CTL and Its Usage in the EDA Industry 2009 ·IEEE Design & Test of Computers ·Rohit Kapur, Paul Reuter, (unknown), Brion Keller	1
13	Bounded Adjacent Fill for Low Capture Power Scan Testing 2008 ·Anshuman Chandra, Rohit Kapur	36
14	Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction 2008 ·2008 Design, Automation and Test in Europe ·Anshuman Chandra, (unknown), Rohit Kapur	9
15	Testing in the year 2020 2007 ·Design, Automation, and Test in Europe ·(unknown), Rohit Kapur, Antonio Rubio	2
16	Testing in the Year 2020 2007 ·(unknown), Rohit Kapur, Antonio Rubio	2
17	Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture 2003 ·Design, Automation, and Test in Europe ·Nahmsuk Oh, Rohit Kapur, T.W. Williams, (unknown)	11
18	On IEEE P1500's Standard for Embedded Core Test 2002 ·Journal of Electronic Testing ·Erik Jan Marinissen, Rohit Kapur, M. Lousberg, Teresa McLaurin, (unknown), Y. Zorian	86
19	Enhancing test efficiency for delay fault testing using multiple-clocked schemes 2002 ·Proceedings - ACM IEEE Design Automation Conference ·Jing-Jia Liou, Li-C. Wang, Kwang‐Ting Cheng, Jennifer Dworak, M.R. Mercer, Rohit Kapur, (unknown)	20
20	System Test and Reliability: Techniques for Avoiding Failure 1996 ·Computer ·Rohit Kapur, (unknown), E. F. Miller	2

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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