B. Kruseman

802 total citations
35 papers, 600 citations indexed

About

B. Kruseman is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Surfaces, Coatings and Films. According to data from OpenAlex, B. Kruseman has authored 35 papers receiving a total of 600 indexed citations (citations by other indexed papers that have themselves been cited), including 35 papers in Electrical and Electronic Engineering, 28 papers in Hardware and Architecture and 1 paper in Surfaces, Coatings and Films. Recurrent topics in B. Kruseman's work include Integrated Circuits and Semiconductor Failure Analysis (31 papers), VLSI and Analog Circuit Testing (28 papers) and Semiconductor materials and devices (11 papers). B. Kruseman is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (31 papers), VLSI and Analog Circuit Testing (28 papers) and Semiconductor materials and devices (11 papers). B. Kruseman collaborates with scholars based in Netherlands, Spain and United States. B. Kruseman's co-authors include S. Eichenberger, C. Hora, A.K. Majhi, G. Gronthoud, Tino Heijmen, R. Rodríguez‐Montañés, Joan Figueras, Daniel Arumí, D.M.H. Walker and H. Hashempour and has published in prestigious journals such as Electronics Letters, IEEE Transactions on Instrumentation and Measurement and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

In The Last Decade

B. Kruseman

33 papers receiving 561 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
B. Kruseman Netherlands 14 576 516 31 14 12 35 600
S. Eichenberger Netherlands 12 543 0.9× 509 1.0× 22 0.7× 19 1.4× 9 0.8× 25 567
C. Hora Netherlands 13 482 0.8× 447 0.9× 36 1.2× 29 2.1× 11 0.9× 27 507
Sreejit Chakravarty United States 13 507 0.9× 485 0.9× 55 1.8× 17 1.2× 27 2.3× 57 538
T.J. Chakraborty United States 12 507 0.9× 504 1.0× 28 0.9× 9 0.6× 40 3.3× 28 533
G. Gronthoud Netherlands 12 447 0.8× 429 0.8× 35 1.1× 11 0.8× 11 0.9× 26 470
Vivek Chickermane United States 15 597 1.0× 573 1.1× 50 1.6× 4 0.3× 19 1.6× 43 623
D.B.I. Feltham United States 9 317 0.6× 308 0.6× 30 1.0× 13 0.9× 17 1.4× 13 344
I. Hartanto United States 8 357 0.6× 373 0.7× 68 2.2× 12 0.9× 38 3.2× 15 386
Srikanth Venkataraman United States 11 387 0.7× 395 0.8× 42 1.4× 23 1.6× 43 3.6× 33 408
Urban Ingelsson Sweden 10 276 0.5× 285 0.6× 43 1.4× 5 0.4× 8 0.7× 25 307

Countries citing papers authored by B. Kruseman

Since Specialization
Citations

This map shows the geographic impact of B. Kruseman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Kruseman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Kruseman more than expected).

Fields of papers citing papers by B. Kruseman

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. Kruseman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Kruseman. The network helps show where B. Kruseman may publish in the future.

Co-authorship network of co-authors of B. Kruseman

This figure shows the co-authorship network connecting the top 25 collaborators of B. Kruseman. A scholar is included among the top collaborators of B. Kruseman based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B. Kruseman. B. Kruseman is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
3.
Dworak, Jennifer, et al.. (2010). NIM: a noise index model to estimate delay discrepancies between silicon and simulation. Design, Automation, and Test in Europe. 1373–1376. 2 indexed citations
4.
Rodríguez‐Montañés, R., et al.. (2010). Diagnosis of full open defects in interconnect lines with fan-out. RECERCAT (Consorci de Serveis Universitaris de Catalunya). 233–238. 7 indexed citations
5.
Arumí, Daniel, R. Rodríguez‐Montañés, Joan Figueras, et al.. (2010). Gate Leakage Impact on Full Open Defects in Interconnect Lines. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 19(12). 2209–2220. 5 indexed citations
6.
7.
Arumí, Daniel, R. Rodríguez‐Montañés, Joan Figueras, et al.. (2008). Full Open Defects in Nanometric CMOS. 299. 119–124. 10 indexed citations
8.
Rodríguez‐Montañés, R., Daniel Arumí, Joan Figueras, et al.. (2007). Impact of gate tunnelling leakage on CMOS circuits with full open defects. Electronics Letters. 43(21). 1140–1142. 11 indexed citations
9.
Walker, D.M.H., Xiang Lü, A.K. Majhi, et al.. (2007). Modeling Power Supply Noise in Delay Testing. IEEE Design & Test of Computers. 24(3). 226–234. 18 indexed citations
10.
Arumí, Daniel, R. Rodríguez‐Montañés, Joan Figueras, et al.. (2007). Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. 145–150. 7 indexed citations
11.
Rodríguez‐Montañés, R., Daniel Arumí, Joan Figueras, et al.. (2007). Diagnosis of Full Open Defects in Interconnecting Lines. 158–166. 20 indexed citations
12.
Vermeulen, Bart, et al.. (2005). Trends in testing integrated circuits. 688–697. 25 indexed citations
13.
Heijmen, Tino & B. Kruseman. (2005). Alpha-particle-induced SER of embedded SRAMs affected by variations in process parameters and by the use of process options. Solid-State Electronics. 49(11). 1783–1790. 21 indexed citations
14.
Kruseman, B., A.K. Majhi, G. Gronthoud, & S. Eichenberger. (2005). On hazard-free patterns for fine-delay fault testing. 213–222. 83 indexed citations
15.
Kruseman, B., et al.. (2005). Systematic defects in deep sub-micron technologies. 290–299. 58 indexed citations
16.
Heijmen, Tino, et al.. (2004). Technology scaling of critical charges in storage circuits based on cross-coupled inverter-pairs. 675–676. 14 indexed citations
17.
Kruseman, B., et al.. (2004). Photon Emission Microscopy in 90 nm CMOS Technologies. Proceedings - International Symposium for Testing and Failure Analysis. 30873. 210–215. 1 indexed citations
18.
Kruseman, B., et al.. (2003). Comparison of I/sub DDQ/ testing and very-low voltage testing. 964–973. 13 indexed citations
19.
Kruseman, B., et al.. (2002). The future of delta I/sub DDQ/ testing. 101–110. 25 indexed citations
20.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by S. Eichenberger Breakdown of academic impact, for papers by C. Hora Breakdown of academic impact, for papers by Sreejit Chakravarty Breakdown of academic impact, for papers by T.J. Chakraborty Breakdown of academic impact, for papers by G. Gronthoud Breakdown of academic impact, for papers by Vivek Chickermane Breakdown of academic impact, for papers by D.B.I. Feltham Breakdown of academic impact, for papers by I. Hartanto Breakdown of academic impact, for papers by Srikanth Venkataraman Breakdown of academic impact, for papers by Urban Ingelsson
Rankless by CCL
2026