R. Kapur

1.4k total citations
40 papers, 923 citations indexed

About

R. Kapur is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, R. Kapur has authored 40 papers receiving a total of 923 indexed citations (citations by other indexed papers that have themselves been cited), including 38 papers in Hardware and Architecture, 38 papers in Electrical and Electronic Engineering and 12 papers in Control and Systems Engineering. Recurrent topics in R. Kapur's work include VLSI and Analog Circuit Testing (38 papers), Integrated Circuits and Semiconductor Failure Analysis (36 papers) and Engineering and Test Systems (12 papers). R. Kapur is often cited by papers focused on VLSI and Analog Circuit Testing (38 papers), Integrated Circuits and Semiconductor Failure Analysis (36 papers) and Engineering and Test Systems (12 papers). R. Kapur collaborates with scholars based in United States, Switzerland and Netherlands. R. Kapur's co-authors include T.W. Williams, M.R. Mercer, Y. Zorian, Erik Jan Marinissen, T.W. Williams, R.H. Dennard, Emil Gizdarski, L. Whetsel, Samitha Samaranayake and Monica R. Maly and has published in prestigious journals such as Computer, IEEE Transactions on Computers and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

In The Last Decade

R. Kapur

38 papers receiving 858 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
R. Kapur United States	18	838	834	161	52	41	40	923
Mark Kassab United States	16	1.6k 1.9×	1.5k 1.8×	242 1.5×	49 0.9×	43 1.0×	49	1.6k
F.J. Ferguson United States	17	993 1.2×	1.0k 1.2×	80 0.5×	53 1.0×	17 0.4×	46	1.1k
J.A. Waicukauski United States	23	1.9k 2.2×	1.8k 2.2×	280 1.7×	72 1.4×	32 0.8×	52	1.9k
N. Tamarapalli United States	14	1.2k 1.5×	1.2k 1.5×	192 1.2×	45 0.9×	28 0.7×	17	1.3k
J. Savir United States	19	1.4k 1.7×	1.4k 1.7×	223 1.4×	63 1.2×	20 0.5×	73	1.5k
L. H. Goldstein United States	7	533 0.6×	515 0.6×	88 0.5×	60 1.2×	20 0.5×	12	618
Grzegorz Mrugalski United States	17	1.1k 1.3×	1.1k 1.3×	191 1.2×	20 0.4×	19 0.5×	66	1.2k
S. Venkataraman United States	12	702 0.8×	690 0.8×	107 0.7×	45 0.9×	22 0.5×	27	745
H.T. Vierhaus Germany	13	512 0.6×	524 0.6×	40 0.2×	48 0.9×	64 1.6×	109	595
Eric Lindbloom United States	10	1.1k 1.3×	1.1k 1.3×	158 1.0×	67 1.3×	17 0.4×	11	1.1k

Countries citing papers authored by R. Kapur

Since Specialization

Citations

This map shows the geographic impact of R. Kapur's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Kapur with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Kapur more than expected).

Fields of papers citing papers by R. Kapur

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Kapur. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Kapur. The network helps show where R. Kapur may publish in the future.

Co-authorship network of co-authors of R. Kapur

This figure shows the co-authorship network connecting the top 25 collaborators of R. Kapur. A scholar is included among the top collaborators of R. Kapur based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Kapur. R. Kapur is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

1.

Chandra, Anshuman, et al.. (2014). A Case Study on Implementing Compressed DFT Architecture. 13. 336–341. 3 indexed citations

2.

Chandra, Anshuman, et al.. (2009). Scalable Adaptive Scan (SAS). 1476–1481. 35 indexed citations

3.

Wohl, P., et al.. (2006). Efficient compression of deterministic patterns into multiple prpg seeds. 916–925. 46 indexed citations

4.

Kapur, R., Jaehong Park, & M.R. Mercer. (2005). All Tests for a Fault are Not Eyually Valuable for Defect Detection. 762–762. 4 indexed citations

5.

Samaranayake, Samitha, et al.. (2004). Changing the scan enable during shift. 73–78. 48 indexed citations

6.

Samaranayake, Samitha, et al.. (2003). A reconfigurable shared scan-in architecture. 9–14. 67 indexed citations

7.

Kapur, R. & T.W. Williams. (2003). Manufacturing test of SoCs. 317–319. 6 indexed citations

8.

Marinissen, Erik Jan, et al.. (2003). Towards a standard for embedded core test: an example. 616–627. 73 indexed citations

9.

Williams, T.W., R.H. Dennard, R. Kapur, M.R. Mercer, & Monica R. Maly. (2002). Iddq test: sensitivity analysis of scaling. 786–792. 104 indexed citations

10.

Kapur, R., et al.. (2002). CTL the language for describing core-based test. 131–139. 30 indexed citations

11.

Marinissen, Erik Jan, R. Kapur, & Y. Zorian. (2002). On using IEEE P1500 SECT for test plug-n-play. 770–777. 55 indexed citations

12.

Williams, T.W., et al.. (2002). Iddq testing for high performance CMOS-the next ten years. 578–583. 24 indexed citations

13.

Kapur, R. & T.W. Williams. (2002). Tester retargetable patterns. 721–727. 2 indexed citations

14.

Kapur, R., et al.. (2002). A new methodology for improved tester utilization. 916–923. 14 indexed citations

15.

Williams, T.W. & R. Kapur. (2002). Design for testability in nanometer technologies; searching for quality. 167–171. 1 indexed citations

16.

Williams, T.W., et al.. (2002). Code coverage, what does it mean in terms of quality?. 420–424. 23 indexed citations

17.

Kapur, R., et al.. (2000). The mutating metric for benchmarking test. IEEE Design & Test of Computers. 17(3). 18–21.

18.

Williams, T.W., et al.. (2000). DFT closure. 8. 3 indexed citations

19.

Kapur, R. & T.W. Williams. (1999). Tough challenges as design and test go nanometer. Computer. 32(11). 42–45. 11 indexed citations

20.

Kapur, R., S. Patil, T.J. Snethen, & T.W. Williams. (1996). A weighted random pattern test generation system. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 15(8). 1020–1025. 30 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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