S. Eichenberger

722 total citations
25 papers, 567 citations indexed

About

S. Eichenberger is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Industrial and Manufacturing Engineering. According to data from OpenAlex, S. Eichenberger has authored 25 papers receiving a total of 567 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Electrical and Electronic Engineering, 20 papers in Hardware and Architecture and 2 papers in Industrial and Manufacturing Engineering. Recurrent topics in S. Eichenberger's work include Integrated Circuits and Semiconductor Failure Analysis (25 papers), VLSI and Analog Circuit Testing (20 papers) and Semiconductor materials and devices (10 papers). S. Eichenberger is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (25 papers), VLSI and Analog Circuit Testing (20 papers) and Semiconductor materials and devices (10 papers). S. Eichenberger collaborates with scholars based in Netherlands, Spain and United States. S. Eichenberger's co-authors include B. Kruseman, C. Hora, A.K. Majhi, G. Gronthoud, M. Lousberg, Friedrich Hapke, Juergen Schloeffel, H. Hashempour, Subhasish Mitra and E. Volkerink and has published in prestigious journals such as Electronics Letters, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

In The Last Decade

S. Eichenberger

24 papers receiving 533 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
S. Eichenberger Netherlands 12 543 509 22 19 9 25 567
B. Kruseman Netherlands 14 576 1.1× 516 1.0× 31 1.4× 14 0.7× 12 1.3× 35 600
C. Hora Netherlands 13 482 0.9× 447 0.9× 36 1.6× 29 1.5× 11 1.2× 27 507
Sreejit Chakravarty United States 13 507 0.9× 485 1.0× 55 2.5× 17 0.9× 27 3.0× 57 538
Huaxing Tang United States 13 497 0.9× 488 1.0× 52 2.4× 75 3.9× 17 1.9× 28 519
G. Gronthoud Netherlands 12 447 0.8× 429 0.8× 35 1.6× 11 0.6× 11 1.2× 26 470
T.W. Williams United States 7 294 0.5× 260 0.5× 25 1.1× 11 0.6× 6 0.7× 15 336
D.B.I. Feltham United States 9 317 0.6× 308 0.6× 30 1.4× 13 0.7× 17 1.9× 13 344
W. Needham United States 7 355 0.7× 326 0.6× 30 1.4× 9 0.5× 10 1.1× 9 371
Chris Schuermyer United States 11 407 0.7× 400 0.8× 39 1.8× 72 3.8× 24 2.7× 19 435
D. Appello Italy 12 340 0.6× 344 0.7× 52 2.4× 35 1.8× 23 2.6× 56 403

Countries citing papers authored by S. Eichenberger

Since Specialization
Citations

This map shows the geographic impact of S. Eichenberger's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Eichenberger with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Eichenberger more than expected).

Fields of papers citing papers by S. Eichenberger

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Eichenberger. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Eichenberger. The network helps show where S. Eichenberger may publish in the future.

Co-authorship network of co-authors of S. Eichenberger

This figure shows the co-authorship network connecting the top 25 collaborators of S. Eichenberger. A scholar is included among the top collaborators of S. Eichenberger based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Eichenberger. S. Eichenberger is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Arumí, Daniel, R. Rodríguez‐Montañés, Joan Figueras, et al.. (2013). Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 32(2). 301–312. 1 indexed citations
2.
Hapke, Friedrich, Juergen Schloeffel, H. Hashempour, & S. Eichenberger. (2011). Gate-Exhaustive and Cell-Aware pattern sets for industrial designs. 1–4. 16 indexed citations
3.
Hapke, Friedrich, et al.. (2010). Defect-oriented cell-internal testing. 37 indexed citations
4.
Arumí, Daniel, R. Rodríguez‐Montañés, Joan Figueras, et al.. (2010). Gate Leakage Impact on Full Open Defects in Interconnect Lines. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 19(12). 2209–2220. 5 indexed citations
5.
Hapke, Friedrich, Andreas Glowatz, Juergen Schloeffel, et al.. (2009). Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. 64 indexed citations
6.
7.
Arumí, Daniel, R. Rodríguez‐Montañés, Joan Figueras, et al.. (2008). Full Open Defects in Nanometric CMOS. 299. 119–124. 10 indexed citations
8.
Rodríguez‐Montañés, R., Daniel Arumí, Joan Figueras, et al.. (2008). Time-dependent Behaviour of Full Open Defects in Interconnect Lines. 13. 1–10. 5 indexed citations
9.
Rodríguez‐Montañés, R., Daniel Arumí, Joan Figueras, et al.. (2007). Impact of gate tunnelling leakage on CMOS circuits with full open defects. Electronics Letters. 43(21). 1140–1142. 11 indexed citations
10.
Walker, D.M.H., Xiang Lü, A.K. Majhi, et al.. (2007). Modeling Power Supply Noise in Delay Testing. IEEE Design & Test of Computers. 24(3). 226–234. 18 indexed citations
11.
Arumí, Daniel, R. Rodríguez‐Montañés, Joan Figueras, et al.. (2007). Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. 145–150. 7 indexed citations
12.
Arumí, Daniel, R. Rodríguez‐Montañés, Joan Figueras, et al.. (2007). I DDQ -based diagnosis at very low voltage (VLV) for bridging defects. Electronics Letters. 43(5). 273–274. 7 indexed citations
13.
Majhi, A.K., et al.. (2005). Memory Testing Under Different Stress Conditions: An Industrial Evaluation. Design, Automation, and Test in Europe. 438–443. 11 indexed citations
14.
Majhi, A.K., et al.. (2005). Memory testing improvements through different stress conditions. 299–302. 1 indexed citations
15.
Kruseman, B., A.K. Majhi, G. Gronthoud, & S. Eichenberger. (2005). On hazard-free patterns for fine-delay fault testing. 213–222. 83 indexed citations
16.
Kruseman, B., et al.. (2005). Systematic defects in deep sub-micron technologies. 290–299. 58 indexed citations
17.
Hora, C. & S. Eichenberger. (2004). Towards High Accuracy Fault Diagnosis of Digital Circuits. Proceedings - International Symposium for Testing and Failure Analysis. 30873. 47–51. 3 indexed citations
18.
Mitra, Subhasish, E. Volkerink, E.J. McCluskey, & S. Eichenberger. (2004). Delay defect screening using process monitor structures. 43–48. 55 indexed citations
19.
Hora, C., et al.. (2003). On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up. Journal of Electronic Testing. 19(4). 369–376. 10 indexed citations
20.
Majhi, A.K., et al.. (2003). Improving diagnostic resolution of delay faults using path delay fault model. 345–350. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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