Y. Zorian

7.2k total citations · 2 hit papers
222 papers, 4.9k citations indexed

About

Y. Zorian is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Control and Systems Engineering. According to data from OpenAlex, Y. Zorian has authored 222 papers receiving a total of 4.9k indexed citations (citations by other indexed papers that have themselves been cited), including 199 papers in Electrical and Electronic Engineering, 190 papers in Hardware and Architecture and 17 papers in Control and Systems Engineering. Recurrent topics in Y. Zorian's work include VLSI and Analog Circuit Testing (188 papers), Integrated Circuits and Semiconductor Failure Analysis (147 papers) and Radiation Effects in Electronics (74 papers). Y. Zorian is often cited by papers focused on VLSI and Analog Circuit Testing (188 papers), Integrated Circuits and Semiconductor Failure Analysis (147 papers) and Radiation Effects in Electronics (74 papers). Y. Zorian collaborates with scholars based in United States, Switzerland and France. Y. Zorian's co-authors include Erik Jan Marinissen, S. Dey, M. Renovell, Dimitris Gizopoulos, S. Shoukourian, Joan Figueras, A. Paschalis, V.A. Vardanian, M. Nicolaidis and J.M. Portal and has published in prestigious journals such as IEEE Communications Magazine, Computer and IEEE Transactions on Computers.

In The Last Decade

Y. Zorian

205 papers receiving 4.4k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

A distributed BIST control scheme for complex VLSI devices

2002 383 citations Y. Zorian profile →
Testing embedded-core based system chips

2002 298 citations Y. Zorian et al. profile →

Peers

Countries citing papers authored by Y. Zorian

Since Specialization

Citations

This map shows the geographic impact of Y. Zorian's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. Zorian with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. Zorian more than expected).

Fields of papers citing papers by Y. Zorian

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Y. Zorian. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. Zorian. The network helps show where Y. Zorian may publish in the future.

Co-authorship network of co-authors of Y. Zorian

This figure shows the co-authorship network connecting the top 25 collaborators of Y. Zorian. A scholar is included among the top collaborators of Y. Zorian based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Y. Zorian. Y. Zorian is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management 2024 ·Zhe Zhang, (unknown), Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani Nassif, (unknown), G. Harutyunyan, Y. Zorian	1
2	Functionally Possible Path Delay Faults With High Functional Switching Activity 2024 ·IEEE Transactions on Very Large Scale Integration (VLSI) Systems ·Irith Pomeranz, Y. Zorian	3
3	Silicon Lifecycle Management: Trends, Challenges and Solutions : Tutorial 2 2023 ·Y. Zorian	1
4	Low-Cost Software-Based Self-Testing of RISC Processor Cores 2003 ·Design, Automation, and Test in Europe ·N. Kranitis, (unknown), Dimitris Gizopoulos, A. Paschalis, Y. Zorian	19
5	Effective Software Self-Test Methodology for Processor Cores 2002 ·Design, Automation, and Test in Europe ·N. Kranitis, A. Paschalis, Dimitris Gizopoulos, Y. Zorian	31
6	Huge Storage Capacity 2001 ·IEEE Design & Test of Computers ·Y. Zorian	0
7	Error-Free Products 2001 ·IEEE Design & Test of Computers ·Y. Zorian	2
8	Test of future system-on-chips 2000 ·International Conference on Computer Aided Design ·Y. Zorian, Sujit Dey, M. Rodgers	38
9	Some Experiments in Test Pattern Generation for FPGA-Implemented Combinational Circuits 2000 ·M. Renovell, J.M. Portal, (unknown), Joan Figueras, Y. Zorian	3
10	Flexibility and Programmability 2000 ·IEEE Design & Test of Computers ·Y. Zorian	1
11	D&T Expands 1999 ·IEEE Design & Test of Computers ·Y. Zorian	1
12	System-Chip Test Strategies (Tutorial). 1998 ·Design Automation Conference ·Y. Zorian	1
13	Built-in-self-test with an alternating output 1998 ·Design, Automation, and Test in Europe ·(unknown), Michael Gössel, Helmut Jürgensen, Y. Zorian	2
14	Design and Test of Core-Based Systems on Chips 1997 ·IEEE Design & Test of Computers ·Y. Zorian, Rajesh K. Gupta	12
15	Power Dissipation During Testing: Should We Worry About it? 1997 ·Vishwani D. Agrawal, Robert Aitken, (unknown), Joan Figueras, (unknown), Hans-Joachim Wunderlich, Y. Zorian	13
16	Designing self-testable multi-chip modules 1996 ·Y. Zorian, (unknown)	7
17	Relay propagation scheme for testing of MCMs on large area substrates 1996 ·(unknown), Abhijit Chatterjee, Y. Zorian	0
18	Functional test for shifting-type FIFOs 1995 ·A.J. van de Goor, (unknown), Y. Zorian	9
19	Area versus detection latency trade-offs in self-checking memory design 1995 ·(unknown), Y. Zorian, M. Nicolaidis	2
20	Higher certainty of error coverage by output data modification 1984 ·International Test Conference ·Y. Zorian, V.K. Agarwal	9

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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