F. P. M. Beenker
- Hardware and Architecture top 1%
- Electrical and Electronic Engineering top 10%
- Control and Systems Engineering top 10%
- Computer Networks and Communications
- Software top 10%
- Topics
- VLSI and Analog Circuit Testing (16 papers)Integrated Circuits and Semiconductor Failure Analysis (14 papers)Radiation Effects in Electronics (4 papers)
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and SystemsTU/e Research PortalIEEE Design & Test of Computers
- Partner nations
- NetherlandsFinlandUnited States
In The Last Decade
F. P. M. Beenker
19 papers receiving 474 citations
Peers
Comparison fields: 5 of 17
- Hardware and Architecture 491
- Electrical and Electronic Engineering 480
- Control and Systems Engineering 67
- Computer Networks and Communications 42
- Software 30
Countries citing papers authored by F. P. M. Beenker
This map shows the geographic impact of F. P. M. Beenker's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. P. M. Beenker with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. P. M. Beenker more than expected).
Fields of papers citing papers by F. P. M. Beenker
This network shows the impact of papers produced by F. P. M. Beenker. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. P. M. Beenker. The network helps show where F. P. M. Beenker may publish in the future.
Co-authorship network of co-authors of F. P. M. Beenker
This figure shows the co-authorship network connecting the top 25 collaborators of F. P. M. Beenker. A scholar is included among the top collaborators of F. P. M. Beenker based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. P. M. Beenker. F. P. M. Beenker is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 6 | |
| 2 | 64 | |
| 3 | 4 | |
| 4 | 10 | |
| 5 | 3 | |
| 6 | 7 | |
| 7 | 4 | |
| 8 | 2 | |
| 9 | 28 | |
| 10 | 20 | |
| 11 | 189 | |
| 12 | 18 | |
| 13 | 33 | |
| 14 | Fault Modeling and Test Algorithm Development. | 1 |
| 15 | 35 | |
| 16 | 70 | |
| 17 | 5 | |
| 18 | 7 | |
| 19 | Systematic and Structured Methods for Digital Board Testing. | 14 |
About F. P. M. Beenker
F. P. M. Beenker is a scholar working on Hardware and Architecture, Software and Electrical and Electronic Engineering, having authored 19 papers that have together received 520 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (16 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers) and Radiation Effects in Electronics (4 papers). The work is most often cited by research in Hardware and Architecture (491 citations), Electrical and Electronic Engineering (480 citations) and Software (30 citations). F. P. M. Beenker has collaborated with scholars based in Netherlands, Finland and United States. Frequent co-authors include R. Dekker, L. Thijssen, R.G. Bennetts, A. P. Thijssen, Emile Aarts, J.L. van Meerbergen and T. Claasen. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, TU/e Research Portal and IEEE Design & Test of Computers.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.