Seongmoon Wang

1.2k total citations
38 papers, 929 citations indexed

About

Seongmoon Wang is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Industrial and Manufacturing Engineering. According to data from OpenAlex, Seongmoon Wang has authored 38 papers receiving a total of 929 indexed citations (citations by other indexed papers that have themselves been cited), including 38 papers in Electrical and Electronic Engineering, 37 papers in Hardware and Architecture and 2 papers in Industrial and Manufacturing Engineering. Recurrent topics in Seongmoon Wang's work include Integrated Circuits and Semiconductor Failure Analysis (37 papers), VLSI and Analog Circuit Testing (37 papers) and Radiation Effects in Electronics (9 papers). Seongmoon Wang is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (37 papers), VLSI and Analog Circuit Testing (37 papers) and Radiation Effects in Electronics (9 papers). Seongmoon Wang collaborates with scholars based in United States, Japan and China. Seongmoon Wang's co-authors include Sandeep K. Gupta, Srimat Chakradhar, Sandeep K. S. Gupta, Wenlong Wei, Xiao Liu, Kwang‐Ting Cheng, Mango C.-T. Chao, Xiao Liu, Zhanglei Wang and Krishnendu Chakrabarty and has published in prestigious journals such as IEEE Transactions on Computers, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

In The Last Decade

Seongmoon Wang

37 papers receiving 852 citations

Peers

Seongmoon Wang
Jeff Rearick United States
P. Wohl United States
M. Lousberg Netherlands
J. Saxena United States
Sreejit Chakravarty United States
C. Hora Netherlands
Kun-Han Tsai United States
A. Krstić United States
I. Hartanto United States
Jeff Rearick United States
Seongmoon Wang
Citations per year, relative to Seongmoon Wang Seongmoon Wang (= 1×) peers Jeff Rearick

Countries citing papers authored by Seongmoon Wang

Since Specialization
Citations

This map shows the geographic impact of Seongmoon Wang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Seongmoon Wang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Seongmoon Wang more than expected).

Fields of papers citing papers by Seongmoon Wang

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Seongmoon Wang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Seongmoon Wang. The network helps show where Seongmoon Wang may publish in the future.

Co-authorship network of co-authors of Seongmoon Wang

This figure shows the co-authorship network connecting the top 25 collaborators of Seongmoon Wang. A scholar is included among the top collaborators of Seongmoon Wang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Seongmoon Wang. Seongmoon Wang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Wang, Seongmoon, et al.. (2010). A low hardware overhead self-diagnosis technique using reed-solomon codes for self-repairing chips. IEEE Transactions on Computers. 59(10). 1309–1319. 8 indexed citations
2.
Wang, Seongmoon & Wenlong Wei. (2009). Machine learning-based volume diagnosis. Design, Automation, and Test in Europe. 902–905. 21 indexed citations
3.
Wang, Seongmoon, et al.. (2009). A self-diagnosis technique using Reed-Solomon codes for self-repairing chips. 265–274. 2 indexed citations
4.
Wang, Seongmoon & Wenlong Wei. (2009). Machine learning-based volume diagnosis. 902–905. 20 indexed citations
5.
Wang, Seongmoon, et al.. (2008). X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors. IEEE Transactions on Computers. 57(7). 978–989. 21 indexed citations
6.
Wang, Seongmoon & Wenlong Wei. (2008). Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns. 14. 125–130. 10 indexed citations
7.
Wang, Seongmoon & Wenlong Wei. (2008). Cost Efficient Methods to Improve Performance of Broadcast Scan. 18. 163–169. 6 indexed citations
8.
Wang, Seongmoon. (2007). A BIST TPG for Low Power Dissipation and High Fault Coverage. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 15(7). 777–789. 36 indexed citations
9.
Wang, Zhanglei, Krishnendu Chakrabarty, & Seongmoon Wang. (2007). SoC Testing Using LFSR Reseeding, and Scan-Slice- Based TAM Optimization and Test Scheduling. 1–6. 6 indexed citations
10.
Wang, Seongmoon & Srimat Chakradhar. (2006). A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 25(8). 1555–1564. 5 indexed citations
11.
Chao, Mango C.-T., Kwang‐Ting Cheng, Seongmoon Wang, Srimat Chakradhar, & Wenlong Wei. (2006). Unknown-tolerance analysis and test-quality control for test response compaction using space compactors. Rare & Special e-Zone (The Hong Kong University of Science and Technology). 1083–1083. 4 indexed citations
12.
Wang, Seongmoon, et al.. (2006). PIDISC: pattern independent design independent seed compression technique. 7 pp.–7 pp.. 8 indexed citations
13.
Cheng, Kwang‐Ting, et al.. (2006). Unknown-tolerance analysis and test-quality control for test response compaction using space compactors. Proceedings - ACM IEEE Design Automation Conference. 2 indexed citations
14.
Chao, Mango C.-T., Seongmoon Wang, Srimat Chakradhar, & Kwang‐Ting Cheng. (2005). Response shaper: a novel technique to enhance unknown tolerance for output response compaction. International Conference on Computer Aided Design. 80–87. 33 indexed citations
15.
Wang, Seongmoon & Sandeep K. Gupta. (2005). Atpg For Heat Dissipation Minimization During Scan Testing. 614–619. 22 indexed citations
16.
Wang, Seongmoon, Xiao Liu, & Srimat Chakradhar. (2004). Hybrid delay scan: a low hardware overhead scan-based delay test technique for high fault coverage and compact test sets. Design, Automation, and Test in Europe. 2. 21296–21296. 63 indexed citations
17.
Wang, Seongmoon, et al.. (2004). Re-configurable embedded core test protocol. Asia and South Pacific Design Automation Conference. 234–237. 1 indexed citations
18.
Wang, Seongmoon & Srimat Chakradhar. (2004). A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs. 1. 574–583. 8 indexed citations
19.
Wang, Seongmoon. (2003). Generation of low power dissipation and high fault coverage patterns for scan-based BIST. 834–843. 52 indexed citations
20.
Wang, Seongmoon & Sandeep K. S. Gupta. (2002). DS-LFSR: a new BIST TPG for low heat dissipation. 848–857. 118 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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