S.E. Steen

1.4k total citations · 1 hit paper
30 papers, 921 citations indexed

About

S.E. Steen is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, S.E. Steen has authored 30 papers receiving a total of 921 indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Electrical and Electronic Engineering, 8 papers in Biomedical Engineering and 6 papers in Surfaces, Coatings and Films. Recurrent topics in S.E. Steen's work include Integrated Circuits and Semiconductor Failure Analysis (14 papers), Semiconductor materials and devices (13 papers) and Advancements in Semiconductor Devices and Circuit Design (9 papers). S.E. Steen is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (14 papers), Semiconductor materials and devices (13 papers) and Advancements in Semiconductor Devices and Circuit Design (9 papers). S.E. Steen collaborates with scholars based in United States, Singapore and Netherlands. S.E. Steen's co-authors include Anna W. Topol, D.J. Frank, Amitesh Kumar, Douglas Charles La Tulipe, K.W. Guarini, Liang Shi, G. Singco, M. Ieong, Anthony Young and K. Bernstein and has published in prestigious journals such as Scientific Reports, Journal of Physics D Applied Physics and IEEE Transactions on Electron Devices.

In The Last Decade

S.E. Steen

27 papers receiving 878 citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Three-dimensional integrated circuits

2006 501 citations Anna W. Topol, Douglas Charles La Tulipe et al. profile →

Peers

Countries citing papers authored by S.E. Steen

Since Specialization

Citations

This map shows the geographic impact of S.E. Steen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S.E. Steen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S.E. Steen more than expected).

Fields of papers citing papers by S.E. Steen

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S.E. Steen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S.E. Steen. The network helps show where S.E. Steen may publish in the future.

Co-authorship network of co-authors of S.E. Steen

This figure shows the co-authorship network connecting the top 25 collaborators of S.E. Steen. A scholar is included among the top collaborators of S.E. Steen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S.E. Steen. S.E. Steen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	How to improve overlay of highly deformed 3D NAND wafers 2020 ·(unknown), Jing Jin, S.E. Steen, (unknown), (unknown), (unknown)	2
2	Lateral displacement induced disorder in L10-FePt nanostructures by ion-implantation 2013 ·Scientific Reports ·(unknown), Shreya Kundu, S. N. Piramanayagam, (unknown), Hang Khume Tan, Seng Kai Wong, S.E. Steen, Hyunsoo Yang, Charanjit S. Bhatia	26
3	Narrow-channel accumulated-body bulk Si MOSFETs with wide-range dynamic threshold voltage tuning 2013 ·(unknown), Faruk Dirisağlık, (unknown), (unknown), (unknown), J. Patel, S.E. Steen, (unknown), Helena Silva, Ali Gokirmak	2
4	First-Order Reversal Curve Investigations on the Effects of Ion Implantation in Magnetic Media 2012 ·IEEE Transactions on Magnetics ·(unknown), S. N. Piramanayagam, (unknown), S.E. Steen, Hyunsoo Yang, Charanjit S. Bhatia	10
5	Ion implantation induced modification of structural and magnetic properties of perpendicular media 2011 ·Journal of Physics D Applied Physics ·(unknown), S. N. Piramanayagam, (unknown), (unknown), S.E. Steen, Hyunsoo Yang, Charanjit S. Bhatia	10
6	Scaling of Silicon Phase-Change Oscillators 2011 ·IEEE Electron Device Letters ·(unknown), Faruk Dirisağlık, (unknown), Gökhan Bakan, S.E. Steen, Helena Silva, Ali Gokirmak	5
7	Photovoltaic (PV) cells characterization using advanced optical tools 2010 ·Franco Stellari, S.E. Steen, (unknown), Xiaoyan Shao	1
8	The over-bump applied resin wafer-level underfill process: Process, material and reliability 2009 ·Claudius Feger, N. LaBianca, Michael Gaynes, S.E. Steen, Zhen Liu, (unknown), Mark Francis	29
9	Upside-down FETS 2008 ·Douglas Charles La Tulipe, (unknown), S.E. Steen, Anna W. Topol, J. Patel, (unknown), J.W. Sleight	1
10	Overlay as the key to drive wafer scale 3D integration 2007 ·Microelectronic Engineering ·S.E. Steen, (unknown), Anna W. Topol, D.J. Frank, (unknown), (unknown)	16
11	Laterally scaled Si-Si/sub 0.7/Ge/sub 0.3/ n-MODFETs with f/sub max/>200 GHz and low operating bias 2005 ·IEEE Electron Device Letters ·Steven J. Koester, K. L. Saenger, J. O. Chu, Q. Ouyang, J. A. Ott, K.A. Jenkins, D. Canaperi, (unknown), C. Jahnes, S.E. Steen	9
12	Laterally-scaled Si/SiGe n-MODFETs with in situ and ion-implanted p-well doping 2004 ·Steven J. Koester, K. L. Saenger, J. O. Chu, Q. Ouyang, J. A. Ott, D. Canaperi, (unknown), C. Jahnes, S.E. Steen	2
13	High resolution metal lift-off characterization 2004 ·Akil K. Sutton, S.E. Steen	1
14	Electrical characterization of germanium p-channel MOSFETs 2003 ·IEEE Electron Device Letters ·Huiling Shang, (unknown), J. A. Ott, P. Kozlowski, S.E. Steen, E.C. Jones, H.‐S. Philip Wong, (unknown)	135
15	The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA) 2003 ·W. Huott, (unknown), D.R. Knebel, S.E. Steen, (unknown), P. N. Sanda, (unknown), Y.H. Chan, (unknown), S. Polonsky	15
16	80 nm gate-length Si/Si _0.7 Ge _0.3 n -MODFET with 194 GHz f _max 2003 ·Electronics Letters ·Steven J. Koester, K. L. Saenger, J. O. Chu, Q. Ouyang, J. A. Ott, M. J. Rooks, D. Canaperi, (unknown), C. Jahnes, S.E. Steen	11
17	Non-invasive timing analysis of IBM G6 microprocessor L1 cache using backside time-resolved hot electron luminescence 2002 ·S. Polonsky, D.R. Knebel, P. N. Sanda, (unknown), W. Huott, (unknown), (unknown), S.E. Steen, (unknown), Y.H. Chan	4
18	<title>Timing high-speed microprocessor circuits using picosecond imaging circuit analysis</title> 2001 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·S.E. Steen, (unknown), (unknown)	2
19	PICA: Backside failure analysis of CMOS circuits using Picosecond Imaging Circuit Analysis 2000 ·Microelectronics Reliability ·(unknown), J. A. Kash, S.E. Steen, S. Polonsky, J. C. Tsang, D.R. Knebel, W. Huott	9
20	Picosecond Imaging Circuit Analysis of the IBM G6 Microprocessor Cache 1999 ·Proceedings - International Symposium for Testing and Failure Analysis ·(unknown), P. N. Sanda, S.E. Steen, (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), Y.H. Chan	6

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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