V. Chan

2.1k total citations
38 papers, 639 citations indexed

About

V. Chan is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Biomedical Engineering. According to data from OpenAlex, V. Chan has authored 38 papers receiving a total of 639 indexed citations (citations by other indexed papers that have themselves been cited), including 34 papers in Electrical and Electronic Engineering, 9 papers in Materials Chemistry and 7 papers in Biomedical Engineering. Recurrent topics in V. Chan's work include Semiconductor materials and devices (16 papers), Advancements in Semiconductor Devices and Circuit Design (13 papers) and Thin-Film Transistor Technologies (10 papers). V. Chan is often cited by papers focused on Semiconductor materials and devices (16 papers), Advancements in Semiconductor Devices and Circuit Design (13 papers) and Thin-Film Transistor Technologies (10 papers). V. Chan collaborates with scholars based in United States, Hong Kong and Switzerland. V. Chan's co-authors include P.C.H. Chan, Mansun Chan, M. Ieong, Min Yang, A. Chou, J. A. Ott, Evgeni Gusev, Massimo V. Fischetti, David Fried and K. Chan and has published in prestigious journals such as SHILAP Revista de lepidopterología, Applied Physics Letters and Proceedings of the IEEE.

In The Last Decade

V. Chan

34 papers receiving 604 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
V. Chan United States	14	578	101	77	76	35	38	639
Kang United States	10	448 0.8×	154 1.5×	77 1.0×	51 0.7×	40 1.1×	47	596
Hongtao Xu China	20	1.2k 2.0×	116 1.1×	81 1.1×	84 1.1×	59 1.7×	116	1.3k
E. Gebara United States	13	706 1.2×	110 1.1×	68 0.9×	34 0.4×	20 0.6×	81	794
T. Yoshida Japan	13	332 0.6×	104 1.0×	147 1.9×	67 0.9×	55 1.6×	26	559
Zixian Wei China	15	755 1.3×	87 0.9×	98 1.3×	84 1.1×	51 1.5×	90	869
Zihang Song China	12	436 0.8×	70 0.7×	122 1.6×	341 4.5×	30 0.9×	50	601
A. Abramo Italy	15	627 1.1×	76 0.8×	185 2.4×	64 0.8×	17 0.5×	50	747
Mary Lanzerotti United States	9	248 0.4×	55 0.5×	96 1.2×	70 0.9×	21 0.6×	61	406
Xing Zhang China	12	664 1.1×	63 0.6×	21 0.3×	100 1.3×	19 0.5×	116	733
Mengyu Zhang China	9	163 0.3×	35 0.3×	116 1.5×	64 0.8×	29 0.8×	33	280

Countries citing papers authored by V. Chan

Since Specialization

Citations

This map shows the geographic impact of V. Chan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Chan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Chan more than expected).

Fields of papers citing papers by V. Chan

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V. Chan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Chan. The network helps show where V. Chan may publish in the future.

Co-authorship network of co-authors of V. Chan

This figure shows the co-authorship network connecting the top 25 collaborators of V. Chan. A scholar is included among the top collaborators of V. Chan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with V. Chan. V. Chan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Chan, V., Wei‐Tsu Tseng, Kang Min Ok, et al.. (2023). Yield Methodology and Heater Process Variation in Phase Change Memory (PCM) Technology for Analog Computing. IEEE Transactions on Semiconductor Manufacturing. 36(3). 327–331. 1 indexed citations

Li, J., et al.. (2021). Low Angle Annular Dark Field Scanning Transmission Electron Microscopy Analysis of Phase Change Material. Proceedings - International Symposium for Testing and Failure Analysis. 84215. 206–210. 1 indexed citations

Han, Jin‐Ping, Malte J. Rasch, P. M. Solomon, et al.. (2020). Impact of PCM Flicker Noise and Weight Drift on Analog Hardware Inference for state-of-the-art Deep Learning Networks. 1 indexed citations

Chan, V., K. Cheng, Andrew Greene, et al.. (2019). Yield Learning Methodologies and Failure Isolation in Ring Oscillator Circuit for CMOS Technology Research. IEEE Transactions on Semiconductor Manufacturing. 32(4). 393–399. 2 indexed citations

Chan, V., et al.. (2018). Ring oscillator yield learning methodologies for CMOS technology research. 54–57. 2 indexed citations

Ieong, M., et al.. (2006). Transistor scaling with novel materials. Materials Today. 9(6). 26–31. 39 indexed citations

Yang, Min, V. Chan, K. Chan, et al.. (2006). Hybrid-orientation technology (HOT): opportunities and challenges. IEEE Transactions on Electron Devices. 53(5). 965–978. 123 indexed citations

Zhang, Ailing, Kam Tai Chan, M.S. Demokan, et al.. (2005). Annealing effects on the loss and birefringence of silicon oxynitride rectangular optical waveguides. Applied Physics Letters. 87(10). 7 indexed citations

Chan, V., R. Rengarajan, N. Rovedo, et al.. (2004). High speed 45nm gate length CMOSFETs integrated into a 90nm bulk technology incorporating strain engineering. 3.8.1–3.8.4. 58 indexed citations

10.

Ieong, M., K.W. Guarini, V. Chan, et al.. (2004). Three dimensional CMOS devices and integrated circuits. 207–213. 19 indexed citations

11.

Chan, V. & P.C.H. Chan. (2002). Electron-beam double resist process to enhance bright field pattern resolution. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 20(3). 849–854. 1 indexed citations

12.

Chan, V., P.C.H. Chan, & Mansun Chan. (2002). Three dimensional CMOS integrated circuits on large grain polysilicon films. Rare & Special e-Zone (The Hong Kong University of Science and Technology). 161–164. 24 indexed citations

13.

Chan, V. & P.C.H. Chan. (2002). An empirical model to determine the grain size of metal-induced lateral crystallized film. IEEE Transactions on Electron Devices. 49(8). 1399–1404. 7 indexed citations

14.

Chan, V., et al.. (2002). Active noise control of transformer noise. 2. 747–753. 8 indexed citations

15.

Chan, V., et al.. (2002). The effects of grain boundaries in the electrical characteristics of large grain polycrystalline thin-film transistors. IEEE Transactions on Electron Devices. 49(8). 1384–1391. 31 indexed citations

16.

Chan, V., P.C.H. Chan, & Mansun Chan. (2001). Multiple layers of CMOS integrated circuits using recrystallized silicon film. IEEE Electron Device Letters. 22(2). 77–79. 18 indexed citations

17.

Chan, V. & P.C.H. Chan. (2001). Fabrication of gate-all-around transistors using metal induced lateral crystallization. IEEE Electron Device Letters. 22(2). 80–82. 10 indexed citations

18.

Chan, V., P.C.H. Chan, & Mansun Chan. (2001). 3D integrated circuit using large grain polysilicon film. 58–61 vol.1. 1 indexed citations

19.

Chan, V., et al.. (1999). Effects of fog on the bit-error rate of a free-space laser communication system. Applied Optics. 38(3). 424–424. 80 indexed citations

20.

Levine, Peter A. & V. Chan. (1972). A comparative study of IMPATT diode noise properties. Proceedings of the IEEE. 60(6). 745–746. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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