V. Chan

2.1k citations

38 papers · 639 indexed · h-index 14

Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices 16
- Advancements in Semiconductor Devices and Circuit Design 13
- Thin-Film Transistor Technologies 10
- Integrated Circuits and Semiconductor Failure Analysis 8
- Advanced Memory and Neural Computing 4
Atomic and Molecular Physics, and Optics
Hardware and Architecture
Biomedical Engineering
- Nanowire Synthesis and Applications 5
Signal Processing
Materials Chemistry
- Phase-change materials and chalcogenides 4
- Silicon Nanostructures and Photoluminescence 4

Co-authors: P.C.H. Chan Mansun Chan M. Ieong Min Yang A. Chou J. A. Ott Evgeni Gusev Massimo V. Fischetti
Cited by: Electrical and Electronic Engineering Atomic and Molecular Physics, and Optics Hardware and Architecture
Journals: IEEE Electron Device Letters (4 papers)IEEE Transactions on Electron Devices (4 papers)Applied Physics Letters (2 papers)
Partner nations: United States Hong Kong Switzerland

In The Last Decade

V. Chan

34 papers receiving 604 citations

Peers

Countries citing papers authored by V. Chan

Since Specialization

Citations

This map shows the geographic impact of V. Chan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Chan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Chan more than expected).

Fields of papers citing papers by V. Chan

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V. Chan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Chan. The network helps show where V. Chan may publish in the future.

Co-authorship network

The 25 scholars most cited alongside V. Chan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with V. Chan Line = papers co-authored together V. Chan links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Yield Methodology and Heater Process Variation in Phase Change Memory (PCM) Technology for Analog Computing IEEE Transactions on Semiconductor Manufacturing ·V. Chan,Qodsiye Hosseinifakhr,J. Pursell,Wei‐Tsu Tseng,Chu-xiang Zhuang,Salman Al Musalam,Kang Min Ok,H.W. Krause,Лебедева Ирина,O. V. Vlasіuk,Kevin Brew,Timothy M. Philip,Geoffrey W. Burr,Nicole Saulnier,Tiffanie A. Brooks,Ishtiaq Ahsan	2023	1
2	Low Angle Annular Dark Field Scanning Transmission Electron Microscopy Analysis of Phase Change Material Proceedings - International Symposium for Testing and Failure Analysis ·J. Li,Kevin Brew,K. Cheng,V. Chan,منال بنت منصور القرشي,Vineet Vishwanath,J. Pursell,J. Demarest,M Szalmásy,Dmitriy V. Kotel'nikov,Douglas Derkman,康秀梅,風間健太郎	2021	1
3	Impact of PCM Flicker Noise and Weight Drift on Analog Hardware Inference for state-of-the-art Deep Learning Networks Jin‐Ping Han,Malte J. Rasch,加藤綾子,P. M. Solomon,Kevin Brew,Kangguo Cheng,Ходжамамед Джумаевич Джумаев,V. Chan,Y x B ichi Rikuna,Wanki Kim,Dave Rydman,Cheng‐Wei Cheng,Nanbo Gong,Praneet Adusumilli,Pilar Ruz,Hongmei Li,Nicole Saulnier,Zohar Bloom-Ackerman,Salim Muhammad Salim,Vijay Narayanan	2020	1
4	Yield Learning Methodologies and Failure Isolation in Ring Oscillator Circuit for CMOS Technology Research IEEE Transactions on Semiconductor Manufacturing ·V. Chan,K. Cheng,Andrew Greene,T. M. Levin,风妖,Chunni Duan,Dechao Guo,R. Pazirandeh,D. Lea,Deborah Guarino,Garnis Adibah Ulfa,Zixue Guo,Marc J Bonet Binimelis,H.W. Krause,Nadine Fruin	2019	2
5	Ring oscillator yield learning methodologies for CMOS technology research V. Chan,D. Lea,R. Pazirandeh,R Romero Calcerrada,T. M. Levin,Dede Rismayanti,Dechao Guo	2018	2
6	Transistor scaling with novel materials Materials Today ·M. Ieong,Vijay Narayanan,文部科学省グローバルCOEプログラム「日本文化デジタル・ヒューマニティーズ拠点」,Anna W. Topol,V. Chan,Zhibin Ren	2006	39
7	Hybrid-orientation technology (HOT): opportunities and challenges IEEE Transactions on Electron Devices ·Min Yang,V. Chan,K. Chan,L. Shi,David Fried,J. H. Stathis,A. Chou,Evgeni Gusev,J. A. Ott,Sikkeland Li,Massimo V. Fischetti,M. Ieong	2006	123
8	Annealing effects on the loss and birefringence of silicon oxynitride rectangular optical waveguides Applied Physics Letters ·Ailing Zhang,Kam Tai Chan,M.S. Demokan,V. Chan,P.C.H. Chan,Hau Ping Chan	2005	7
9	High speed 45nm gate length CMOSFETs integrated into a 90nm bulk technology incorporating strain engineering V. Chan,R. Rengarajan,N. Rovedo,Zhang Taixin,Terence B. Hook,Christina Tamsukhin,Jia Chen,E. Nowak,Xiangdong Chen,D. Lea,Y. M. Park,V. Ku,Harold David Corrales-Herrera,An Steegen,Christopher Baiocco,Padraic Shafer,O. Zaimidoroga,Shih-Fen Huang,C. Wann	2004	58
10	Three dimensional CMOS devices and integrated circuits M. Ieong,K.W. Guarini,V. Chan,K. Bernstein,(unknown),J. Kedzierski,Wilfried Haensch	2004	19
11	Electron-beam double resist process to enhance bright field pattern resolution Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·V. Chan,P.C.H. Chan	2002	1
12	Three dimensional CMOS integrated circuits on large grain polysilicon films Rare & Special e-Zone (The Hong Kong University of Science and Technology) ·V. Chan,P.C.H. Chan,Mansun Chan	2002	24
13	An empirical model to determine the grain size of metal-induced lateral crystallized film IEEE Transactions on Electron Devices ·V. Chan,P.C.H. Chan	2002	7
14	Active noise control of transformer noise H Duane Arlowe,Kenichi Tsujita,Lenka Dulaiová,Clara Reyes Nebot,V. Chan	2002	8
15	The effects of grain boundaries in the electrical characteristics of large grain polycrystalline thin-film transistors IEEE Transactions on Electron Devices ·V. Chan,P.C.H. Chan,Hamid Borghei-Razavi	2002	31
16	Multiple layers of CMOS integrated circuits using recrystallized silicon film IEEE Electron Device Letters ·V. Chan,P.C.H. Chan,Mansun Chan	2001	18
17	Fabrication of gate-all-around transistors using metal induced lateral crystallization IEEE Electron Device Letters ·V. Chan,P.C.H. Chan	2001	10
18	3D integrated circuit using large grain polysilicon film V. Chan,P.C.H. Chan,Mansun Chan	2001	1
19	Effects of fog on the bit-error rate of a free-space laser communication system Applied Optics ·Conrad Eckhard,Hansjorg Ahrens,Maria Teresa Maidana Giret,V. Chan	1999	80
20	A comparative study of IMPATT diode noise properties Proceedings of the IEEE ·Peter A. Levine,V. Chan	1972	3

About V. Chan

V. Chan is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Instrumentation, Materials Chemistry and Signal Processing, having authored 38 papers that have together received 639 indexed citations. Recurring topics across this work include Semiconductor materials and devices (16 papers), Advancements in Semiconductor Devices and Circuit Design (13 papers), Thin-Film Transistor Technologies (10 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers), Nanowire Synthesis and Applications (5 papers), Advanced Memory and Neural Computing (4 papers), Phase-change materials and chalcogenides (4 papers) and Silicon Nanostructures and Photoluminescence (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (578 citations), Atomic and Molecular Physics, and Optics (77 citations), Hardware and Architecture (16 citations), Biomedical Engineering (101 citations) and Signal Processing (21 citations). V. Chan has collaborated with scholars based in United States, Hong Kong and Switzerland. Frequent co-authors include P.C.H. Chan, Mansun Chan, M. Ieong, Min Yang, A. Chou, J. A. Ott, Evgeni Gusev, Massimo V. Fischetti, David Fried and K. Chan. Their work appears in journals such as IEEE Electron Device Letters, IEEE Transactions on Electron Devices, Applied Physics Letters, IEEE Transactions on Semiconductor Manufacturing and Materials Today.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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