Emile Sahouria
- Electrical and Electronic Engineering
- Computer Vision and Pattern Recognition top 10%
- Computer Networks and Communications top 10%
- Signal Processing top 10%
- Artificial Intelligence
- Co-authors
- Avideh ZakhorSteven McCanneRandy H. KatzThomas R. HendersonSteffen SchulzeNicolas B. CobbYuri GranikTim Lin
- Topics
- Advancements in Photolithography Techniques (26 papers)Industrial Vision Systems and Defect Detection (12 papers)Integrated Circuits and Semiconductor Failure Analysis (9 papers)
- Cited by
- Signal ProcessingComputer Vision and Pattern RecognitionComputer Graphics and Computer-Aided Design
- Journals
- IEEE Transactions on Circuits and Systems for Video TechnologyInternational Conference on Computer Aided DesignProceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
- Partner nations
- United StatesHungaryUnited Kingdom
In The Last Decade
Emile Sahouria
30 papers receiving 249 citations
Peers
Comparison fields: 5 of 32
- Electrical and Electronic Engineering 140
- Computer Vision and Pattern Recognition 109
- Computer Networks and Communications 64
- Signal Processing 64
- Artificial Intelligence 35
Countries citing papers authored by Emile Sahouria
This map shows the geographic impact of Emile Sahouria's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Emile Sahouria with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Emile Sahouria more than expected).
Fields of papers citing papers by Emile Sahouria
This network shows the impact of papers produced by Emile Sahouria. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Emile Sahouria. The network helps show where Emile Sahouria may publish in the future.
Co-authorship network of co-authors of Emile Sahouria
This figure shows the co-authorship network connecting the top 25 collaborators of Emile Sahouria. A scholar is included among the top collaborators of Emile Sahouria based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Emile Sahouria. Emile Sahouria is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 4 | |
| 2 | 10 | |
| 3 | 8 | |
| 4 | 3 | |
| 5 | 6 | |
| 6 | 1 | |
| 7 | 3 | |
| 8 | 6 | |
| 9 | 11 | |
| 10 | 3 | |
| 11 | 3 | |
| 12 | 5 | |
| 13 | 3 | |
| 14 | 1 | |
| 15 | 60 | |
| 16 | 33 | |
| 17 | 2 | |
| 18 | Full-chip Process Simulation for Silicon DRC | 8 |
| 19 | 6 | |
| 20 | 5 |
About Emile Sahouria
Emile Sahouria is a scholar working on Industrial and Manufacturing Engineering, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 32 papers that have together received 290 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (26 papers), Industrial Vision Systems and Defect Detection (12 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers). The work is most often cited by research in Signal Processing (64 citations), Computer Vision and Pattern Recognition (109 citations) and Computer Graphics and Computer-Aided Design (14 citations). Emile Sahouria has collaborated with scholars based in United States, Hungary and United Kingdom. Frequent co-authors include Avideh Zakhor, Steven McCanne, Randy H. Katz, Thomas R. Henderson, Steffen Schulze, Nicolas B. Cobb, Yuri Granik, Tim Lin, James Word and Edita Tejnil. Their work appears in journals such as IEEE Transactions on Circuits and Systems for Video Technology, International Conference on Computer Aided Design and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.