Tim Fühner
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
- Optical Coatings and Gratings
-
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon and Solar Cell Technologies
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 11
- Optical Coatings and Gratings 9
-
- Advancements in Photolithography Techniques 35
- Integrated Circuits and Semiconductor Failure Analysis 8
- Co-authors
- Andreas ErdmannPeter EvanschitzkyThomas JungFeng ShaoP. PichlerC.J. OrtizF. CristianoB. Colombeau
In The Last Decade
Tim Fühner
46 papers receiving 432 citations
Peers
Comparison fields: 5 of 45
- Surfaces, Coatings and Films 114
- Electrical and Electronic Engineering 367
- Media Technology 55
- Radiation 39
- Industrial and Manufacturing Engineering 37
Countries citing papers authored by Tim Fühner
This map shows the geographic impact of Tim Fühner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Tim Fühner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Tim Fühner more than expected).
Fields of papers citing papers by Tim Fühner
This network shows the impact of papers produced by Tim Fühner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Tim Fühner. The network helps show where Tim Fühner may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Tim Fühner, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2019 | 1 | |
| 2 | 2016 | 0 | |
| 3 | 2016 | 2 | |
| 4 | 2016 | 15 | |
| 5 | 2014 | 3 | |
| 6 | 2014 | 2 | |
| 7 | 2012 | 2 | |
| 8 | 2011 | 10 | |
| 9 | 2011 | 4 | |
| 10 | 2010 | 8 | |
| 11 | 2009 | 17 | |
| 12 | 2009 | 2 | |
| 13 | 2008 | 3 | |
| 14 | 2008 | 8 | |
| 15 | 2008 | 2 | |
| 16 | 2007 | 24 | |
| 17 | 2007 | 49 | |
| 18 | 2006 | 24 | |
| 19 | 2005 | 32 | |
| 20 | EvolVision – an Evolvica visualization tool | 2001 | 2 |
About Tim Fühner
Tim Fühner is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Hardware and Architecture, Industrial and Manufacturing Engineering and Discrete Mathematics and Combinatorics, having authored 48 papers that have together received 455 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (35 papers), Electron and X-Ray Spectroscopy Techniques (11 papers), Optical Coatings and Gratings (9 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers), Advanced optical system design (6 papers), Advanced Measurement and Metrology Techniques (4 papers), Surface Roughness and Optical Measurements (4 papers) and Advanced Battery Technologies Research (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (114 citations), Electrical and Electronic Engineering (367 citations), Media Technology (55 citations), Radiation (39 citations) and Industrial and Manufacturing Engineering (37 citations). Tim Fühner has collaborated with scholars based in Germany, Belgium and Hong Kong. Frequent co-authors include Andreas Erdmann, Peter Evanschitzky, Thomas Jung, Feng Shao, P. Pichler, C.J. Ortiz, F. Cristiano, B. Colombeau, N. E. B. Cowern and A. Claverie. Their work appears in journals such as Microelectronic Engineering, Journal of Crystal Growth, Journal of Micro/Nanolithography MEMS and MOEMS, Applied Optics and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.