Nicolas B. Cobb

749 total citations
31 papers, 606 citations indexed

About

Nicolas B. Cobb is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Industrial and Manufacturing Engineering. According to data from OpenAlex, Nicolas B. Cobb has authored 31 papers receiving a total of 606 indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Electrical and Electronic Engineering, 10 papers in Surfaces, Coatings and Films and 10 papers in Industrial and Manufacturing Engineering. Recurrent topics in Nicolas B. Cobb's work include Advancements in Photolithography Techniques (27 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Industrial Vision Systems and Defect Detection (10 papers). Nicolas B. Cobb is often cited by papers focused on Advancements in Photolithography Techniques (27 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Industrial Vision Systems and Defect Detection (10 papers). Nicolas B. Cobb collaborates with scholars based in United States, Hungary and Netherlands. Nicolas B. Cobb's co-authors include Avideh Zakhor, Yuri Granik, Thuy Do, Emile Sahouria, Weidong Zhang, James Word, Wilhelm Maurer, Chris A. Mack, J. Andres Torres and Uwe Hollerbach and has published in prestigious journals such as Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE and TechConnect Briefs.

In The Last Decade

Nicolas B. Cobb

31 papers receiving 554 citations

Peers

Countries citing papers authored by Nicolas B. Cobb

Since Specialization

Citations

This map shows the geographic impact of Nicolas B. Cobb's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Nicolas B. Cobb with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Nicolas B. Cobb more than expected).

Fields of papers citing papers by Nicolas B. Cobb

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Nicolas B. Cobb. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Nicolas B. Cobb. The network helps show where Nicolas B. Cobb may publish in the future.

Co-authorship network of co-authors of Nicolas B. Cobb

This figure shows the co-authorship network connecting the top 25 collaborators of Nicolas B. Cobb. A scholar is included among the top collaborators of Nicolas B. Cobb based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Nicolas B. Cobb. Nicolas B. Cobb is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Dense OPC and verification for 45nm 2006 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Nicolas B. Cobb, (unknown)	15
2	Dense OPC for 65nm and below 2005 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Nicolas B. Cobb, Yuri Granik	14
3	OPC methods to improve image slope and process window 2003 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Nicolas B. Cobb, Yuri Granik	17
4	New process models for OPC at sub-90-nm nodes 2003 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Yuri Granik, Nicolas B. Cobb	18
5	Flows for model-based layout correction of mask proximity effects 2003 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Nicolas B. Cobb, Wilhelm Maurer	1
6	Improved modeling performance with an adapted vectorial formulation of the Hopkins imaging equation 2003 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Yuri Granik, (unknown), Nicolas B. Cobb	26
7	Efficient full-chip yield analysis methodology for OPC-corrected VLSI designs 2002 ·(unknown), Nicolas B. Cobb, (unknown), (unknown), Thuy Do, (unknown), Yuri Granik, Emile Sahouria, A. Balasiński	3
8	Model-based OPC considering process window aspects: a study 2002 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Steffen Schulze, (unknown), Rainer Zimmermann, (unknown), (unknown), Emile Sahouria, Yuri Granik, Nicolas B. Cobb	1
9	Two-dimensional G-MEEF theory and applications 2002 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Yuri Granik, Nicolas B. Cobb	3
10	Model-based OPC using the MEEF matrix 2002 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Nicolas B. Cobb, Yuri Granik	41
11	Universal process modeling with VTRE for OPC 2002 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Yuri Granik, Nicolas B. Cobb, Thuy Do	27
12	High-performance hierarchical fracturing 2002 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Nicolas B. Cobb, Weidong Zhang	5
13	Hierarchical GDSII-based fracturing and job deck system 2002 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Nicolas B. Cobb, Emile Sahouria	3
14	Phase and transmission errors aware OPC solution for PSM: feasability demonstration 2001 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Emile Sahouria, Nicolas B. Cobb	2
15	Full-chip Process Simulation for Silicon DRC 2000 ·TechConnect Briefs ·Nicolas B. Cobb, Yuri Granik, Emile Sahouria, (unknown)	8
16	Integration of optical proximity correction strategies in strong phase shifters design for poly-gate layers 1999 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), (unknown), Emile Sahouria, Nicolas B. Cobb, (unknown)	5
17	Impact of mask errors on full chip error budgets 1999 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), (unknown), Nicolas B. Cobb, (unknown), (unknown), Chris A. Mack	12
18	<title>Fast sparse aerial-image calculation for OPC</title> 1995 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Nicolas B. Cobb, Avideh Zakhor	29
19	<title>Fast, low-complexity mask design</title> 1995 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Nicolas B. Cobb, Avideh Zakhor	47
20	<title>Large-area phase-shift mask design</title> 1994 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Nicolas B. Cobb, Avideh Zakhor	13

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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